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    METHOD AND DEVICE FOR NONDESTRUCTIVE INSPECTION
    1.
    发明专利
    METHOD AND DEVICE FOR NONDESTRUCTIVE INSPECTION 失效

    公开(公告)号：JPH11248685A

    公开(公告)日：1999-09-17

    申请号：JP36490098

    申请日：1998-12-22

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： RAULERSON DAVID A ,  AMOS JAY ,  SMITH KEVIN D

    IPC: G01N27/90

    Abstract: PROBLEM TO BE SOLVED: To provide a probe with a wide inspection field by providing a driver having a length in a direction parallel with a scanning route and a width, and a receiver having an effective coil axis orthogonal to that of the driver a length in the same direction as the driver, a width larger thant the lath and a thickness. SOLUTION: An eddy current probe 28 is provided with a housing 60, a probe element 62, and an electrical connector 64. The element 62 is provided with a driver 70, a receiver 72 and a shield 74. The driver 70 is provided with a core and a driver coil. The effective axis of the driver coil is parallel with the main direction of a magnet field and in the vicinity of a main outside surface 76 of the receiver 72, and the magnetic field is even in the vicinity of the receiver 72. The receiver 72 is provided with a receiver coil and the effective axis of the receiver coil is arranged perpendicular to the effective axis of the driver coil to shield the magnetic field with respect to the receiver 72 and the driver 70. The receiver 72 has substantially at least a width which is about 1.25 times larger than the length of the receiver 72 so that it can cover a wide field.

    PHASED ARRAY BILLET DATA EVALUATION SOFTWARE
    2.
    发明申请
    PHASED ARRAY BILLET DATA EVALUATION SOFTWARE 审中-公开
    相位阵列数据评估软件

    公开(公告)号：WO2014143258A8

    公开(公告)日：2014-11-20

    申请号：PCT/US2013075256

    申请日：2013-12-16

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： PENG WENJI ,  UMBACH JEFFREY A ,  SMITH KEVIN D

    IPC: G06F19/00

    CPC classification number: G01N29/262 ,  G01N29/0645 ,  G01N2291/0234 ,  G01N2291/044 ,  G01N2291/106 ,  G01N2291/2634 ,  G01N2291/2694

    Abstract: A computer-implemented method for evaluating echo signals obtained from a phased array experiment on a billet is disclosed. The computer-implemented method may comprise collecting the echo signals from a pulser/receiver unit, correlating the echo signals with a position on a longitudinal axis and a circumferential angle of the billet, computing an amplitude for each of the echo signals, displaying the amplitudes as indications in a c-scan data plot at a computer display unit, and determining the signal-to-noise ratios of indications located in a region-of-interest box relative to noise in surrounding boxes in the c-scan data plot. The computer-implemented method may further comprise classifying each indication as rejectable, reportable, or insignificant based on its amplitude and signal-to-noise ratio. The computer-implemented method may find applications in quality control evaluations in the aircraft industry.

    Abstract translation: 公开了一种用于评估从坯料上的相控阵实验获得的回波信号的计算机实现的方法。 计算机实现的方法可以包括从脉冲发生器/接收器单元收集回波信号，将回波信号与纵轴上的位置和坯料的圆周角相关联，计算每个回波信号的幅度，显示振幅 作为计算机显示单元的c扫描数据图中的指示，并且确定位于感兴趣区域中的指示相对于c扫描数据图中的周围框中的噪声的信噪比。 计算机实现的方法还可以包括基于其幅度和信噪比将每个指示分类为可拒绝的，可报告的或无关紧要的。 计算机实现的方法可以在飞机工业的质量控制评估中找到应用。

    Method and apparatus for non destructive inspection
    4.
    发明专利
    Method and apparatus for non destructive inspection 未知

    公开(公告)号：SG74678A1

    公开(公告)日：2000-08-22

    申请号：SG1998004996

    申请日：1998-11-26

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： RAULERSON DAVID A ,  AMOS JAY ,  SMITH KEVIN D

    IPC: G01N27/90

    Abstract: An eddy current probe (62) for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length (134), and a width (130), the length being the dimension in the direction parallel to the scanning path (116), and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), the driver having a length (132) and a width (128), the length being the dimension in a direction substantially parallel to a scanning path (116), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the driver edges (140,144) is less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.

    METHOD AND APPARATUS FOR NON DESTRUCTIVE INSPECTION
    5.
    发明专利
    METHOD AND APPARATUS FOR NON DESTRUCTIVE INSPECTION 未知

    公开(公告)号：CA2256904C

    公开(公告)日：2005-10-18

    申请号：CA2256904

    申请日：1998-12-21

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： SMITH KEVIN D ,  RAULERSON DAVID A ,  AMOS JAY

    IPC: G01N27/90

    Abstract: An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coi l effective coil axis, the receiver having a length, and a width, the length being the dimension in the direction parallel to the scanning path, and the width havi ng a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a drive r having a coil with an effective coil axis, the driver having a length and a width, the length being the dimension in a direction substantially parallel to a scanning path, and further includes a receiver having a coil with a coil axis oriente d substantially perpendicular to the driver coil effective coil axis, where th e magnitude of a distance between the receiver and at least one of the edges i s less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.

    METHOD AND APPARATUS FOR NON DESTRUCTIVE INSPECTION
    6.
    发明专利
    METHOD AND APPARATUS FOR NON DESTRUCTIVE INSPECTION 未知

    公开(公告)号：CA2256904A1

    公开(公告)日：1999-06-22

    申请号：CA2256904

    申请日：1998-12-21

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： AMOS JAY ,  SMITH KEVIN D ,  RAULERSON DAVID A

    IPC: G01N27/90

    Abstract: An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, and further includes a receiver havin g a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length, and a width, the length being the dimension in the direction parallel to the scanning path, and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, the driver having a length and a widt h, the length being the dimension in a direction substantially parallel to a scanni ng path, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the edges is le ss than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.

    Thermal imaging method and apparatus
    9.
    发明专利
    Thermal imaging method and apparatus 未知

    公开(公告)号：SG127835A1

    公开(公告)日：2006-12-29

    申请号：SG200603317

    申请日：2006-05-18

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： OUYANG ZHONG ,  SMITH KEVIN D

    Abstract: An inspection apparatus includes a light source positioned to direct light to a first surface of a workpiece. An infrared detector is positioned to receive radiation from the first surface. A data acquisition and processing computer is coupled to the light source and the infrared detector. The computer triggers the light source to emit the light a number of instances. The computer acquires thermal data from the infrared detector for a number of times after each of the instances. The computer is configured to process the data using a theoretical solution to analyze the thermal data based upon an average of the thermal data for a number of each of corresponding ones of the times from different ones of the instances.

    THERMAL IMAGING METHOD AND APPARATUS
    10.
    发明专利
    THERMAL IMAGING METHOD AND APPARATUS 未知

    公开(公告)号：CA2546524A1

    公开(公告)日：2006-11-24

    申请号：CA2546524

    申请日：2006-05-10

    Applicant: UNITED TECHNOLOGIES CORP

    Inventor： OUYANG ZHONG ,  SMITH KEVIN D

    IPC: G01N21/88 ,  F01D25/00 ,  F02C7/00

    Abstract: An inspection apparatus includes a light source positioned to direct light to a first surface of a workpiece. An infrared detector is positioned to receive radiation from the first surface. A data acquisition and processing computer is coupled to the light source and the infrared detector. The computer triggers the light source to emit the light a number of instances. The computer acquires thermal data from the infrared detector for a number of times after each of the instances. The computer is configured to process the data using a theoretical solution to analyze the thermal data based upon an average of the thermal data for a number of each of corresponding ones of the times from different ones of the instances.

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