公开(公告)号：CA2544464A1

公开(公告)日：2007-10-21

申请号：CA2544464

申请日：2006-04-21

Applicant: UNITED TECHNOLOGIES CORP ,  THOMPSON R BRUCE

Inventor： THOMPSON R BRUCE ,  SMITH KEVIN D ,  UMBACH JEFFREY A

IPC: G01N29/07 ,  F01D25/00 ,  G01N29/024

Abstract: Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are described herein. In embodiments, a surface skimming longitudinal wave is generated at a first location on a material, at least a portion of that wave is detected at a second location on the material, the time-of-flight of that wave between the first and second locations is determined, and then the velocity of that wave is determined. One or more crystallographic orientations of the material may then be determined based upon that velocity.

公开(公告)号：SG136819A1

公开(公告)日：2007-11-29

申请号：SG2006025415

申请日：2006-04-17

Applicant: UNITED TECHNOLOGIES CORP ,  BRUCE THOMPSON R

Inventor： UMBACH JEFFREY A ,  SMITH KEVIN D ,  THOMPSON R BRUCE

Abstract: Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are described herein. In embodiments, a surface skimming longitudinal wave is generated at a first location on a material, at least a portion of that wave is detected at a second location on the material, the time-of-flight of that wave between the first and second locations is determined, and then the velocity of that wave is determined. One or more crystallographic orientations of the material may then be determined based upon that velocity.

公开(公告)号：MXPA06005213A

公开(公告)日：2007-11-08

申请号：MXPA06005213

申请日：2006-05-09

Applicant: UNITED TECHNOLOGIES CORP

Inventor： SMITH KEVIN D ,  UMBACH JEFFREY A ,  THOMPSON R BRUCE

IPC: G01H17/00

Abstract: Se describen en la presente, sistemas y metodos para determinar la velocidad de ondas ultrasonicas longitudinales rasantes superficiales sobre varios materiales. En modalidades, una onda ultrasonica longitudinal rasante superficial es generada en un primer sitio sobre un material, al menos una porcion de esa onda es detectada en un segundo sitio sobre el material, se determina el tiempo de vuelo de esa onda entre el primer sitio y el segundo, y despues se determinar la velocidad de esa onda. Se pueden determinar entonces una o mas orientaciones cristalograficas del material con base en esa velocidad.