中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

10 records (took 0.029 seconds)

    Imaging member
    1.
    发明公开
    Imaging member 审中-公开
    成像成员

    公开(公告)号：EP2236289A2

    公开(公告)日：2010-10-06

    申请号：EP10157365.7

    申请日：2010-03-23

    Applicant: Xerox Corporation ,  Palo Alto Research Center Incorporated

    Inventor： Zhou, Jing ,  Chow, Eugene M. ,  Jia, Nancy Y.

    IPC: B41C1/00

    CPC classification number: B41C1/1041 ,  B41M1/06 ,  B41M5/368

    Abstract: An imaging member is disclosed having a surface layer comprising a heat-sensitive material whose surface compatibility to printing agents, such as toners and inks, can be substantially reversed in response to small changes in temperature. The imaging member is suitable for use in lithographic and printing applications, permitting reversible switching between compatibility states of printing agents, such as between hydrophilic and hydrophobic states or oleophilic and oleophobic states, and enabling rapid production of images on a recording medium.

    Abstract translation: 公开了一种成像构件，其具有包含热敏材料的表面层，其对印刷剂如调色剂和墨水的表面相容性可响应于温度的小变化而基本上反转。 成像部件适用于平版印刷和印刷应用，允许印刷剂的相容性状态之间的可逆转换，例如在亲水状态和疏水状态或亲油状态和疏油状态之间，并且能够在记录介质上快速生成图像。

    Scanning probe system with spring probe
    3.
    发明公开
    Scanning probe system with spring probe 审中-公开
    扫描探针装置与弹簧探针

    公开(公告)号：EP1351256A3

    公开(公告)日：2006-05-17

    申请号：EP03007302.7

    申请日：2003-03-31

    Applicant: Xerox Corporation

    Inventor： Hantschel, Thomas ,  Chow, Eugene M. ,  Fork, David

    IPC: G01N13/10 ,  G01N13/16 ,  G12B21/02 ,  G12B21/08 ,  B81B3/00 ,  B81B1/00

    CPC classification number: G01Q70/10 ,  G01Q70/06 ,  G01Q70/16 ,  G01R1/06727 ,  Y10S977/873

    Abstract: Scanning probe systems, which include scanning probe microscopes (SPMs), atomic force microscope (AFMs), or profilometers, are disclosed that use cantilevered spring (e.g., stressy metal) probes formed on transparent substrates. When released, a free end bends away from the substrate to form the cantilevered spring probe, which has an in-plane or out-of-plane tip at its free end. The spring probe is mounted in a scanning probe system and is used to scan or otherwise probe a substrate surface-. A laser beam is directed through the transparent substrate onto the probe to measure tip movement during scanning or probing. Other detection schemes can also be used (e.g., interferometry, capacitive, piezoresistive). The probes are used for topography, electrical, optical and thermal measurements. The probes also allow an SPM to operate as a depth gauge.

    Imaging member
    4.
    发明公开
    Imaging member 审中-公开
    摄像元件

    公开(公告)号：EP2236289A3

    公开(公告)日：2013-06-05

    申请号：EP10157365.7

    申请日：2010-03-23

    Applicant: Xerox Corporation ,  Palo Alto Research Center Incorporated

    Inventor： Zhou, Jing ,  Chow, Eugene M. ,  Jia, Nancy Y.

    IPC: B41C1/10 ,  B41M5/36 ,  B41M1/06

    CPC classification number: B41C1/1041 ,  B41M1/06 ,  B41M5/368

    Abstract: An imaging member is disclosed having a surface layer comprising a heat-sensitive material whose surface compatibility to printing agents, such as toners and inks, can be substantially reversed in response to small changes in temperature. The imaging member is suitable for use in lithographic and printing applications, permitting reversible switching between compatibility states of printing agents, such as between hydrophilic and hydrophobic states or oleophilic and oleophobic states, and enabling rapid production of images on a recording medium.

    Scanning Probe System
    5.
    发明公开
    Scanning Probe System 审中-公开
    扫描探针系统

    公开(公告)号：EP2287624A3

    公开(公告)日：2011-03-23

    申请号：EP10190901.8

    申请日：2003-03-31

    Applicant: Xerox Corporation

    Inventor： Hantschel, Thomas ,  Chow, Eugene M. ,  Fork, David

    IPC: G01Q70/06 ,  G01Q70/10 ,  G01Q70/16

    CPC classification number: G01Q70/10 ,  G01Q70/06 ,  G01Q70/16 ,  G01R1/06727 ,  Y10S977/873

    Abstract: A scanning probe system (100) for probing a sample (115), the scanning probe system comprising a stage (110) having a surface for mounting the sample; a probe assembly (120) including a substrate (122) and a spring probe (125) having a fixed end (210) attached to the substrate, a central section (220) separated from the substrate, and a free end (230) including a probe tip (235) positioned adjacent to the stage surface; and a measurement device (160) for measuring deformation of the spring probe caused by interaction between the probe tip and the sample, wherein the spring probe comprises a stress-engineered spring material film (520) having an internal stress gradient.

    Abstract translation: 1。一种用于探测样本（115）的扫描探针系统（100），所述扫描探针系统包括具有用于安装所述样本的表面的台（110） 包括衬底（122）和弹簧探针（125）的探针组件（120），所述弹簧探针具有附接到所述衬底的固定端（210），与所述衬底分离的中央部分（220）以及自由端（230），所述自由端包括 位于所述台面附近的探针尖端（235） 和测量装置（160），用于测量由探针尖端和样本之间的相互作用引起的弹簧探针的变形，其中弹簧探针包括具有内部应力梯度的应力设计的弹簧材料膜（520）。

    Scanning Probe System
    6.
    发明公开
    Scanning Probe System 审中-公开
    Federsonde Rastersondenvorrichtung

    公开(公告)号：EP2287624A2

    公开(公告)日：2011-02-23

    申请号：EP10190901.8

    申请日：2003-03-31

    Applicant: Xerox Corporation

    Inventor： Hantschel, Thomas ,  Chow, Eugene M. ,  Fork, David

    IPC: G01Q70/06 ,  G01Q70/10 ,  G01Q70/16

    CPC classification number: G01Q70/10 ,  G01Q70/06 ,  G01Q70/16 ,  G01R1/06727 ,  Y10S977/873

    Abstract: A scanning probe system (100) for probing a sample (115), the scanning probe system comprising a stage (110) having a surface for mounting the sample; a probe assembly (120) including a substrate (122) and a spring probe (125) having a fixed end (210) attached to the substrate, a central section (220) separated from the substrate, and a free end (230) including a probe tip (235) positioned adjacent to the stage surface; and a measurement device (160) for measuring deformation of the spring probe caused by interaction between the probe tip and the sample, wherein the spring probe comprises a stress-engineered spring material film (520) having an internal stress gradient.

    Abstract translation: 1.一种用于探测样品（115）的扫描探针系统（100），所述扫描探针系统包括具有用于安装样品的表面的台（110） 包括衬底（122）和具有附接到所述衬底的固定端（210）的弹簧探针（125）的探针组件（120），与所述衬底分离的中心部分（220）以及包括 位于所述台表面附近的探针尖端（235）; 以及测量装置（160），用于测量由探针尖端和样品之间的相互作用引起的弹簧探针的变形，其中弹簧探针包括具有内部应力梯度的应力工程弹簧材料膜（520）。

    Scanning probe system with spring probe
    8.
    发明公开
    Scanning probe system with spring probe 审中-公开
    扫描探针装置与弹簧探针

    公开(公告)号：EP1351256A2

    公开(公告)日：2003-10-08

    申请号：EP03007302.7

    申请日：2003-03-31

    Applicant: Xerox Corporation

    Inventor： Hantschel, Thomas ,  Chow, Eugene M. ,  Fork, David

    IPC: G12B21/02 ,  G12B21/08 ,  B81B3/00 ,  B81B1/00

    CPC classification number: G01Q70/10 ,  G01Q70/06 ,  G01Q70/16 ,  G01R1/06727 ,  Y10S977/873

    Abstract: Scanning probe systems, which include scanning probe microscopes (SPMs), atomic force microscope (AFMs), or profilometers, are disclosed that use cantilevered spring (e.g., stressy metal) probes formed on transparent substrates. When released, a free end bends away from the substrate to form the cantilevered spring probe, which has an in-plane or out-of-plane tip at its free end. The spring probe is mounted in a scanning probe system and is used to scan or otherwise probe a substrate surface-. A laser beam is directed through the transparent substrate onto the probe to measure tip movement during scanning or probing. Other detection schemes can also be used (e.g., interferometry, capacitive, piezoresistive). The probes are used for topography, electrical, optical and thermal measurements. The probes also allow an SPM to operate as a depth gauge.

Patent Agency Ranking