公开(公告)号：CN109791864A

公开(公告)日：2019-05-21

申请号：CN201780057411.6

申请日：2017-03-06

Applicant: 株式会社岛津制作所

Inventor： 政木俊道

IPC: H01J35/16 ,  H01J35/14

CPC classification number: H01J35/147 ,  H01J35/14 ,  H01J35/16 ,  H01J35/18

Abstract: 提供一种能够使从支架轴放射的不必要的X射线减少从而获得清晰的X射线图像的X射线管。具有：电子源(12)，产生电子束(B)；阳极(13)，将该电子束(B)加速，并且具有供电子束(B)穿过的孔(13a)；筒状的支架轴(14)，形成供穿过该阳极(13)的孔(13a)后的电子束(B)穿过的通路；磁透镜(17),配置在该支架轴(14)的周围并将电子束(B)聚集；靶支架(15),与支架轴(14)连结；靶(16),配置在该靶支架(15)内,电子束(B)与该靶(16)碰撞；以及照射窗(15b),配置于靶支架(15),用于将从靶(16)产生的X射线取出到外部，支架轴(14)的内壁由碳材形成，从而减少电子束(B)与支架轴(14)撞击时所产生的X射线。

公开(公告)号：EP4425528A1

公开(公告)日：2024-09-04

申请号：EP23159049.8

申请日：2023-02-28

Applicant: Siemens Healthineers AG

Inventor： FREUDENBERGER, Jörg ,  FRITZLER, Anja ,  GEITHNER, Peter ,  JUD, Christoph ,  WIMMER, Michael

IPC: H01J35/06 ,  H01J1/304 ,  H01J35/14 ,  H05G1/30 ,  H05G1/58

CPC classification number: H01J35/147 ,  H01J35/065 ,  H05G1/58 ,  H05G1/30

Abstract: Die Erfindung betrifft einen Feldeffekt-Elektronenemitter und eine Röntgenröhre.
Der erfindungsgemäße Feldeffekt-Elektronenemitter weist
- eine segmentierte Emissionsfläche, wobei die Emissionsfläche eine Vielzahl an Feldeffekt-Emitternadeln und mehrere Segmente mit je einer aktivierbaren Teilemissionsfläche aufweist, wobei sich die Vielzahl an Feldeffekt-Emitternadeln auf die Teilemissionsflächen verteilt, und
- eine Steuereinheit auf, welche dazu eingerichtet ist, verschiedene Gruppen mit mindestens einem der mehreren Segmente derart für eine simultane Elektronenemission aus den jeweiligen Teilemissionsflächen zu aktivieren, dass sich die nacheinander aktivierbaren, zusammenhängenden und gruppierten Teilemissionsflächen paarweise zu mindestens 25% überlappen.

公开(公告)号：US20240290567A1

公开(公告)日：2024-08-29

申请号：US18585720

申请日：2024-02-23

Applicant: Siemens Healthineers AG

Inventor： Joerg FREUDENBERGER ,  Michael WIMMER ,  Anja FRITZLER ,  Christoph JUD ,  Peter GEITHNER

IPC: H01J35/06 ,  H01J35/14

CPC classification number: H01J35/065 ,  H01J35/147

Abstract: A field effect electron emitter comprises a segmented emission surface and a control unit. The segmented emission surface has a plurality of field effect emitter needles and a number of segments, each segment having an activatable part emission surface, wherein the plurality of field effect emitter needles are distributed on the activatable part emission surfaces. The control unit is configured to activate various groups with at least one of the number of segments for a simultaneous electron emission from respective activatable part emission surfaces such that coherent and grouped part emission surfaces able to be activated in succession overlap in pairs by at least 25%.

公开(公告)号：US20240234075A1

公开(公告)日：2024-07-11

申请号：US18554872

申请日：2022-04-12

Applicant: NCX Corporation

Inventor： Jian ZHANG

IPC: H01J35/06 ,  H01J9/18 ,  H01J35/04 ,  H01J35/14

CPC classification number: H01J35/065 ,  H01J9/18 ,  H01J35/045 ,  H01J35/147

Abstract: A field emission cathode device includes a cathode element having a field emission surface and an adjacent gate electrode clement defining a first gap therebetween. A gate voltage applied to the gate electrode clement causes the field emission surface to emit electrons that are accelerated through the gate electrode element. The gate electrode element is disposed between the cathode element and an anode element. the anode element having an anode voltage applied thereto to attract the electrons emitted through the gate electrode element. A tuning electrode element is disposed between the gate electrode element and the anode element. The tuning electrode element has a tuning voltage applied thereto to decelerate the electrons directed through the gate electrode element and to direct the electrons therethrough toward the anode element. An associated method of forming a field emission cathode device is also provided.

公开(公告)号：US20240055215A1

公开(公告)日：2024-02-15

申请号：US18232418

申请日：2023-08-10

Applicant: X-SIGHT INCORPORATED

Inventor： Winston Chern

IPC: H01J35/14 ,  H01J35/06 ,  H01J35/16

CPC classification number: H01J35/153 ,  H01J35/065 ,  H01J35/16 ,  H01J35/147

Abstract: An X-ray source design for improved reliability by mitigating the impact of vacuum arcs, ion back bombardment and ion sputtering includes an X-ray source including one or more field emitter arrays and a circuit configured to control the one or more field emitter arrays. The one or more field emitter arrays include a gate and an emitter. The circuit is configured to apply a voltage between the gate and the emitter.

公开(公告)号：US11817287B1

公开(公告)日：2023-11-14

申请号：US18316257

申请日：2023-05-12

Applicant: Beijing Institute of Technology

Inventor： Li Xi ,  Kaiyuan Xue ,  Daining Fang

IPC: H01J35/10 ,  H01J35/06 ,  H01J35/20 ,  H01J35/14

CPC classification number: H01J35/101 ,  H01J35/066 ,  H01J35/106 ,  H01J35/147 ,  H01J35/20 ,  H01J2235/1026 ,  H01J2235/1275

Abstract: A rotary-transmission-target microfocus X-ray source and an X-ray generation method based on the rotary-transmission-target microfocus X-ray source are provided. The X-ray source comprises a chamber, and an electron beam system is installed in the chamber. The electron beam system is arranged on a same side as an anode target rotating shaft. A motor in a rotary anode target system drives an anode target to rotate through a bevel gear transmission device. The microstructure of a target is designed. An electron beam emitted by the electron beam system vertically bombards the metal target of the rotating anode target. A cooling system is configured to cool the anode target.

公开(公告)号：EP4439620A2

公开(公告)日：2024-10-02

申请号：EP24195049.2

申请日：2015-08-19

Applicant: NUCTECH COMPANY LIMITED

Inventor： TANG, Huaping ,  CHEN, Zhiqiang ,  LI, Yuanjing ,  WANG, Yonggang ,  QIN, Zhanfeng

IPC: H01J3/02

CPC classification number: H01J3/021 ,  H01J2203/02220130101 ,  H01J2203/022420130101 ,  H01J2203/023620130101 ,  H05G1/52 ,  H01J2235/06820130101 ,  H01J35/065 ,  H01J35/14 ,  H01J35/147

Abstract: The present disclosure is directed to an electron source (1) and an X-ray source using the same. The electron source (1) of the present invention comprises: at least two electron emission zones (11, 12, 13), each of which comprises a plurality of micro electron emission units (100). The micro electron emission unit (100) comprises: a base layer (101), an insulating layer (102) on the base layer (101), a grid layer (103) on the insulating layer (102), an opening (105) in the grid layer (103), and an electron emitter (104) that is fixed at the base layer (101) and corresponds to a position of the opening (105). The micro electron emission units (100) in the same electron emission zone (11, 12, 13) are electrically connected and simultaneously emit electrons or do not emit electrons at the same time, and different electron emission zones (11, 12, 13) are electrically partitioned.

公开(公告)号：EP4243036B1

公开(公告)日：2024-08-21

申请号：EP22161257.5

申请日：2022-03-10

IPC: G21G1/12 ,  H01J35/14 ,  H05H6/00 ,  G21G1/00

CPC classification number: G21G1/12 ,  G21G2001/008920130101 ,  G21G2001/004220130101 ,  G21G2001/007320130101 ,  G21G2001/006320130101 ,  G21G2001/009420130101 ,  H01J2235/08620130101 ,  H01J2235/08120130101 ,  H01J35/147

公开(公告)号：US11974383B2

公开(公告)日：2024-04-30

申请号：US17649367

申请日：2022-01-30

Applicant: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.

Inventor： Guoping Zhu ,  Jinglin Wu ,  Tieshan Zhang ,  Siming Chen ,  Xu Chu

IPC: H05G1/52 ,  H01J35/14 ,  H05G1/58

CPC classification number: H05G1/52 ,  H01J35/147 ,  H05G1/58

Abstract: A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.

公开(公告)号：US11918830B2

公开(公告)日：2024-03-05

申请号：US17382044

申请日：2021-07-21

Applicant: Susan L. Michaud ,  Daniel J. Raymond ,  Artur Teymurazyan ,  Ran Tu

Inventor： Susan L. Michaud ,  Daniel J. Raymond ,  Artur Teymurazyan ,  Ran Tu

IPC: A61N5/10 ,  A61B6/03 ,  G21K1/087 ,  G21K1/093 ,  G21K5/04 ,  H01J35/14

CPC classification number: A61N5/1077 ,  A61B6/03 ,  A61N5/1044 ,  A61N5/1067 ,  A61N5/1082 ,  G21K1/087 ,  G21K1/093 ,  G21K5/04 ,  A61N5/107 ,  A61N2005/1074 ,  A61N2005/1087 ,  A61N2005/1097 ,  H01J35/147

Abstract: The invention comprises a method and apparatus for tuning a charged particle beam path of a charged particle beam system used to treat a tumor of a patient, comprising the steps of: positioning a two-dimensional charged particle detector in a beam line downstream from a magnet pair; operating windings of the magnet pair at a first power level to generate a first magnetic field; measuring a beam position with the first two-dimensional charged particle detector; adjusting a correction magnetic field by driving voltage of a correction coil at a second power level, the second power level less than five percent of the first power level, where the first magnetic field and the correction magnetic field combine to yield an operational magnetic field; and the steps of measuring and adjusting the correction magnetic field changing the operational magnetic field to adjust a measured beam position toward a target beam position.