公开(公告)号：WO2022002730A1

公开(公告)日：2022-01-06

申请号：PCT/EP2021/067240

申请日：2021-06-23

Applicant: AMS INTERNATIONAL AG

Inventor： D'ALEO, Francesco, Paolo ,  ISHIZAKI, Kotaro ,  ROENTGEN, Peter ,  SÁNCHEZ, Javier, Miguel

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/26 ,  G01J3/0248 ,  G01J3/0256 ,  G01J3/0286 ,  G01J3/0291

Abstract: The present disclosure relates to a method of manufacturing a plurality of spectral sensors. The method comprises providing a first substrate and forming the plurality of spectral sensors on the first substrate. The method further comprises dividing the first substrate to separate the plurality of spectral sensors.

公开(公告)号：WO2022002798A1

公开(公告)日：2022-01-06

申请号：PCT/EP2021/067547

申请日：2021-06-25

Applicant: AMS INTERNATIONAL AG

Inventor： D’ALEO, Francesco, Paolo ,  ISHIZAKI, Kotaro ,  ROENTGEN, Peter ,  SÁNCHEZ, Javier, Miguel

IPC: G01J3/26 ,  G01J3/02 ,  G01J3/06 ,  G02B26/00 ,  G01J3/0256 ,  G01J3/0286 ,  G02B26/001

Abstract: A spectral sensor comprising a Fabry-Perot interferometer having a pair of reflectors, a photodetector located beneath the Fabry-Perot interferometer, a capacitance measurement circuit configured to measure a capacitance of the Fabry-Perot interferometer, and a controller configured to control a voltage applied across the reflectors of the Fabry-Perot interferometer.

公开(公告)号：WO2021248209A1

公开(公告)日：2021-12-16

申请号：PCT/AU2021/050604

申请日：2021-06-11

Applicant: NEWSOUTH INNOVATIONS PTY LIMITED

Inventor： KUNZ, Oliver ,  REY, Germaine Antoine ,  TRUPKE, Thorsten ,  PADUTHOL, Appu Rshikesan

IPC: G01N21/64 ,  G01J1/58 ,  G01N21/88 ,  H02S50/15 ,  G01J3/0286 ,  G01J3/51 ,  G01N2021/317 ,  G01N21/314 ,  G01N21/6456 ,  G01N21/6489

Abstract: Methods and apparatus are presented for measuring a photoluminescence (PL) response, preferably a spatially resolved image of a PL response, from an object exposed to solar irradiation. In certain embodiments signals from the object are measured in two or more different spectral bands selected such that one of the measured signals has a higher PL component relative to ambient reflectance compared to another measured signal, enabling the PL component to be enhanced by a suitable differencing procedure. In other embodiments a signal from an object is measured in a spectral band selected such that at least 20% of the measured signal comprises PL generated from the object by the solar irradiation. The methods and apparatus have particular application to outdoor inspection of photovoltaic modules without having to modulate the operating point of the modules.

公开(公告)号：WO2021126077A1

公开(公告)日：2021-06-24

申请号：PCT/SG2020/050729

申请日：2020-12-09

Applicant: AMS SENSORS SINGAPORE PTE. LTD.

Inventor： MIGUEL SÁNCHEZ, Javier ,  ISHIZAKI, Kotaro ,  ROENTGEN, Peter ,  D’ALEO, Francesca Paolo

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/26 ,  G01J3/28 ,  G01J3/021 ,  G01J3/0286

Abstract: A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said range and operating said component to vary said driving parameter whilst detecting light transmitted through said layer of material to obtain driving parameter versus light intensity data. The obtained data is then compared with characterizing data previously derived for said layer of material in order to calibrate said driving parameter.

公开(公告)号：WO2021122985A1

公开(公告)日：2021-06-24

申请号：PCT/EP2020/086758

申请日：2020-12-17

Applicant: ROBERT BOSCH GMBH

Inventor： NOLTEMEYER, Ralf

IPC: G01J3/02 ,  G01J3/46 ,  H02J7/00 ,  G01J3/52 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/0286 ,  G01J3/524 ,  H02J50/10 ,  H02J7/00034 ,  H02J7/007

Abstract: Die vorliegende Erfindung schafft ein Verfahren zum Betreiben einer Spektrometereinrichtung (10) umfassend ein Anschließen (S1) der Energiespeichervorrichtung (1) an eine Ladevorrichtung (2), ein Ermitteln (S2) einer ersten Temperatur (T1) an der Spektrometereinrichtung (10); ein Ermitteln (S3) eines ersten Referenzspektrums an einem Referenzmaterial (RM) bei der ersten Temperatur (T1); ein Ermitteln (S5) einer zweiten Temperatur (T2) an der Spektrometereinrichtung (10) während oder nach dem Laden; ein Ermitteln (S6) eines zweiten Referenzspektrums mit der Spektrometereinrichtung (10) an dem Referenzmaterial (RM) bei der zweiten Temperatur (T2); ein Vergleichen (S7) der Referenzspektren und ein Durchführen (S8) einer Kompensation des ermittelten Unterschieds in einem ermittelten Spektrum.