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公开(公告)号:WO2022137261A8
公开(公告)日:2022-06-30
申请号:PCT/IN2021/051198
申请日:2021-12-22
Applicant: INDIAN INSTITUTE OF SCIENCE
Inventor: UMAPATHY, Siva , SIL, Sanchita , KUMBHAR, Dipak , KUMAR, R Vishnu
IPC: G01J3/44 , G01N21/65 , G01N2201/06113 , G01N2201/0631
Abstract: The invention provides a method for homogenized coherent excitation of a sample for determining molecular structure. The method includes selecting a monochromatic coherent light, homogenizing the monochromatic coherent light; irradiating the sample with the homogenized monochromatic light; collecting the Raman scattered light to obtain a profile and analyzing the profile to obtain chemical specific signature of the sample. The invention also provides a method for obtaining two dimensional imaging of a sample using irradiation of large sample area by homogenized monochromatic light without compromise in spatial resolution. A system for homogenized coherent excitation of a sample for determining molecular structure is also provided.
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公开(公告)号:WO2021251899A1
公开(公告)日:2021-12-16
申请号:PCT/SG2020/050327
申请日:2020-06-11
Applicant: ADVANCED INSTRUMENT PTE. LTD.
Inventor: SIEW, Ronian Han Weng , PHUA, Soo Fan , WEI, Sheau Yeng
IPC: G02B21/06 , G02B26/00 , G02B5/00 , G01N21/00 , G01N2021/6463 , G01N2021/95638 , G01N21/255 , G01N21/6456 , G01N21/8806 , G01N2201/0631 , G02B26/0816 , G02B26/0875
Abstract: Various embodiments may provide a method of illuminating a sample surface. The method may include arranging an illumination subsystem, the illumination subsystem including an optical source and at least one lens, having an optic axis at an incident angle greater than 0° and less than 90° to a normal of the sample surface such that a reference illumination distribution is directly generated on the sample surface based on optical light emitted by the illumination subsystem. The method may also include arranging an adjustment optical subsystem such that an adjusted illumination distribution which is more symmetrical compared to the reference illumination distribution is generated on the sample surface based on optical light emitted by the illumination subsystem.
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