1.
    实用新型
    失效

    公开(公告)号:JPS54100551U

    公开(公告)日:1979-07-16

    申请号:JP17523477

    申请日:1977-12-27

    2.
    实用新型
    失效

    公开(公告)号:JPS529330Y2

    公开(公告)日:1977-02-26

    申请号:JP8780774

    申请日:1974-07-25

    4.
    实用新型
    失效

    公开(公告)号:JPS51110449U

    公开(公告)日:1976-09-07

    申请号:JP2893075

    申请日:1975-03-05

    5.
    实用新型
    失效

    公开(公告)号:JPS529328Y1

    公开(公告)日:1977-02-26

    申请号:JP13920873

    申请日:1973-12-06

    COLD CATHODE ION SOIRCE
    7.
    发明专利

    公开(公告)号:AU534599B2

    公开(公告)日:1984-02-09

    申请号:AU5029079

    申请日:1978-08-25

    Abstract: A plasma discharge ion source for a mass spectrometer, having a magnet forming an axial magnetic field, two cathodes axially spaced in said field and an annular anode between the cathodes. Ions generated by the source emerge via an opening in one cathode and then pass in succession through axially aligned openings in two planar electrodes. The electrode closest said one cathode has a further disc or cone shaped electrode positioned in the opening of that electrode so as to form an annular gap between the peripheries of the disc shaped electrode and opening. Ions from the source opening pass in succession through the annular gap and then through the electrode opening in the electrode furtherest from the source opening. By applying suitable electric potentials to the electrodes ions of an energy above a predetermined level are prevented from passing through the electrodes. A mass spectrometer employing the source is also disclosed this employing an electrostatic ion filter and an ion collector to receive filtered ions from the source via the filter. The collector includes a slow ion deflector arranged to deflect emergent ions from the filter to a collector member of the collector and to which deflector emergent ions of high energy travel directly without such deflection.

    ELECTRON DISCHARGE DEVICE ELECTRODES

    公开(公告)号:GB1529437A

    公开(公告)日:1978-10-18

    申请号:GB4902374

    申请日:1975-11-12

    Applicant: EMI LTD

    Abstract: 1529437 Discharge tube electrodes; semiconductor devices EMI Ltd 12 Nov 1975 [12 Nov 1974] 49023/74 Headings H1D and H1K A semi-conductor anode 150 of a photomultiplier tube comprises zones 152, 153 defining a P-N junction 163, the external boundary of junction 163 being protected by a silicon dioxide sealing layer 155 which is bonded by means of glass 156 to a plinth 158 of alumina. The surface on which electrons are incident is covered by a layer of aluminium 151, 1000 A thick. Zone 152 is P#-type silicon and N-type zone 153 is formed by diffusion of phosphorus and is 0À2 to 3À0 Ám thick. A guard ring 160 surrounds the junction 163.

    10.
    发明专利
    未知

    公开(公告)号:DK129882C

    公开(公告)日:1975-05-12

    申请号:DK525368

    申请日:1968-10-30

    Abstract: 1,202,467. Determining the position of an ionizing event. UNITED STATES ATOMIC ENERGY COMMISSION. Sept.27, 1968 [Nov.3, 1967], No.46149/68. Heading G1A. In an arrangement for indicating the position of an event along the collector of an ionizing radiation detecting element the collector is of sufficient resistance per unit length to provide a voltage pulse at its output end whose rise time is proportional to the distance between the position of the event and the output end of the collector, the voltage pulse is applied to shaping circuitry to provide two time differing bi-polar pulses of at least two half-cycles and having a time difference proportional to the rise time of the voltage pulse from the collector, and the time difference of these bi-polar pulses is detected and recorded to indicate the position. The detector may be a gas filled tube having a fused graphite coated quartz fibre collector or a surface barrier diode having an elongated semi-conductor body of an N-type material and a thin collector of P-type material. The shaping circuitry may comprise two parallel circuits differentiatorintegrator-differentiator in whichthe time constants are different, or a tapped chain, differentiatorintegrator-differentiator-differentiator, and the timing of the crossover points may be detected. Times and resistance values are exemplified and use of the arrangement in nuclear diffraction is referred to.

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