公开(公告)号：EP4495559A1

公开(公告)日：2025-01-22

申请号：EP24176312.7

申请日：2024-05-16

Applicant: Zolix Instruments Co., Ltd. ,  Zolix Analytical Instruments Co., Ltd.

Inventor： TONG, Fei ,  PENG, Wenjuan ,  LEI, Zemin ,  ZHANG, Suxia ,  TANG, Tianyun

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/18

Abstract: The present disclosure provides an auto-focus spectrometer, including: a grating element configured to split light; an imaging element configured to converge a light beam; a controller configured to move the imaging element to realize autofocus, and connected to the imaging element; and a detector; and an incident light is diffracted through the grating to the imaging element, and then converged to the detector through the imaging element to obtain spectrogram information. The present disclosure automatically adjusts the imaging element position according to the configuration and operation state of the spectrometer, so that the spectrometer can be automatically kept at an optimal imaging position and exert the best performance thereof.

公开(公告)号：EP3715934B1

公开(公告)日：2024-04-24

申请号：EP18881898.3

申请日：2018-11-09

IPC: G02B26/00 ,  B81B3/00 ,  B81C99/00 ,  G01M11/00 ,  G01R1/06 ,  G01R31/28 ,  H01L21/66 ,  G01J3/26 ,  G02B5/28 ,  G01J3/02 ,  G01J3/04 ,  G01J3/06 ,  G01J5/0802 ,  G01J5/0875 ,  G01J5/04 ,  G01J5/06 ,  G01J5/10 ,  G01J3/12 ,  G01R27/26 ,  G01R31/26

CPC classification number: G02B26/001 ,  G01J3/26 ,  G01J5/045 ,  G01J5/10 ,  G01J5/0875 ,  G01J3/0202 ,  G01J2003/121320130101 ,  G01R27/2605 ,  G01R31/2834 ,  G01R31/2601 ,  G01R31/54 ,  G01M11/005 ,  G01M11/00 ,  G01J5/064 ,  G01J5/0802

公开(公告)号：EP4249866A1

公开(公告)日：2023-09-27

申请号：EP23163360.3

申请日：2023-03-22

Applicant: Ricoh Company, Ltd.

Inventor： TATEBE, Tetsuroh ,  NOGUCHI, Hidetaka ,  TOKITA, Toshiaki

IPC: G01J3/02 ,  G02B7/182 ,  G01J3/04 ,  G01J3/20

Abstract: A spectroscope includes: light incidence means (1) configured to allow light from an outside to be incident; a diffraction grating (2) configured to disperse wavelengths of the light incident on the diffraction grating (2) by the light incidence means (1); reflecting means (3) having a reflecting surface having an inclination variable around a rotation axis of the reflecting surface; and light emitting means (4) configured to emit the light reflected by the reflecting means (3) to the outside. At least one of the light incidence means (1), the diffraction grating (2), and the reflecting means (3), and the light emitting means (4) are changeable in a direction orthogonal to the rotation axis. The position of the light emitting means (4) is changeable in a direction along a center axis of the light emitted from the light emitting means (4).

公开(公告)号：EP2694931B1

公开(公告)日：2022-04-27

申请号：EP12713521.8

申请日：2012-03-27

Inventor： COMSTOCK, Lovell E., II ,  WIGGINS, Richard L.

IPC: G01J3/18 ,  G01J3/28 ,  G01J3/02 ,  G01J3/04

公开(公告)号：EP3483573B1

公开(公告)日：2022-03-02

申请号：EP17827481.7

申请日：2017-07-04

Inventor： KONISHI, Tsuyoshi

IPC: G01J3/45 ,  G01J3/04 ,  G01J9/02 ,  G01J3/28 ,  G01J3/453 ,  G02B27/60

公开(公告)号：EP3134757B1

公开(公告)日：2018-08-29

申请号：EP15719940.7

申请日：2015-04-16

Applicant: X-Rite, Inc.

Inventor： SALYER, David ,  HARNESS, Weston

IPC: G02B6/42 ,  G01J1/04 ,  G01J3/04 ,  G01J3/02

CPC classification number: G01J3/0289 ,  G01J1/0425 ,  G01J1/0462 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/04 ,  G02B6/42

Abstract: A targeting system for a spectrophotometer includes a plurality of fiber channels, including at least one measurement channel and at least one illumination channel. A slit assembly includes a translucent layer disposed adjacent the plurality of fiber channels, and reflective portion disposed adjacent the translucent layer. Each fiber channel includes a first end, the first end offset from the reflective portion of the slit assembly to allow light transfer from one fiber channel to an adjacent fiber channel. A light source is in optical communication with the at least one illumination channel. A sample plane is in optical communication with a second end of the measurement channel. The system is configured such that light is transmitted from the light source, through the at least one illumination channel, reflected off the slit assembly, transmitted through the measurement channel, and onto the sample plane.

公开(公告)号：EP2869047A1

公开(公告)日：2015-05-06

申请号：EP14190341.9

申请日：2011-10-24

Applicant: CANON KABUSHIKI KAISHA

Inventor： Kobayashi, Hisanori ,  Komori, Shin ,  Obara, Mitsuhiro

IPC: G01J3/50 ,  G01J3/20 ,  G01J3/28 ,  G01J3/02 ,  G01J3/04

CPC classification number: G01J3/502 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0248 ,  G01J3/04 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/50 ,  G01J2003/2866

Abstract: A spectral colorimetric apparatus includes a concave surface reflection type diffraction element configured to disperse an incident light beam; a sensor including a plurality of photoelectric conversion elements, wherein the plurality of photoelectric conversion elements is arranged in a direction parallel to a tangential line of a Rowland circle of the concave surface reflection type diffraction element, each photoelectric conversion elements being configured to receive the light beam dispersed by the concave surface reflection type diffraction element; a housing configured to support the concave surface reflection type diffraction element and the sensor; and a bonding portion provided on the housing, wherein the sensor is fixed to the housing with an adhesive provided between the bonding portion and the sensor. The bonding portion is provided only at a position corresponding to a center of the plurality of photoelectric conversion elements of the sensor in the direction in which the plurality of photoelectric conversion elements is arranged.

Abstract translation: 光谱比色装置包括被配置为分散入射光束的凹面反射型衍射元件; 包括多个光电转换元件的传感器，其中所述多个光电转换元件布置在与所述凹面反射型衍射元件的Rowland圆的切线平行的方向上，每个光电转换元件被配置为接收所述光 由凹面反射型衍射元件分散的光束; 壳体，其构造成支撑所述凹面反射型衍射元件和所述传感器; 以及设置在所述壳体上的接合部分，其中所述传感器通过设置在所述接合部分和所述传感器之间的粘合剂固定到所述壳体。 接合部仅在与多个光电转换元件配置的方向上的传感器的多个光电转换元件的中心对应的位置处设置。

公开(公告)号：EP2126527B1

公开(公告)日：2013-09-18

申请号：EP08762169.4

申请日：2008-02-27

Applicant: Horiba Jobin Yvon S.A.S.

Inventor： THEVENON, Alain ,  MILLET, Viviane ,  CORDE, Pierre-André

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0237 ,  G01J3/04 ,  G01J3/2803

公开(公告)号：EP2613132A1

公开(公告)日：2013-07-10

申请号：EP12156700.2

申请日：2012-02-23

Applicant: Raytheon Company

Inventor： Cook, Lacy

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01J3/12 ,  G01J5/06

CPC classification number: G01J3/02 ,  G01J5/061

Abstract: A dispersive infrared spectrometer in which only a minimum number of optical components, for example, the detector (160) sub-system only, are housed within a cold/cryogenic dewar and the remaining optical components are at ambient temperature during operation of the spectrometer. In one example, the spectrometer includes a slit substrate (120) with a highly reflective surface, and the optical components of the spectrometer are configured and arranged such that for all in-band wavelengths, substantially all off-slit optical paths in the detector (160) field of view are retro-reflected off the reflective surface of the slit substrate (120) into the cryogenic dewar.

Abstract translation: 其中只有最少数量的光学部件（例如，检测器（160）子系统）被容纳在冷/低温杜瓦瓶内的分散红外光谱仪，并且剩余的光学部件在光谱仪操作期间处于环境温度。 在一个示例中，光谱仪包括具有高反射表面的狭缝基板（120），并且光谱仪的光学部件被配置和布置成使得对于所有带内波长，基本上所有检测器中的非狭缝光路 160）视野从狭缝基板（120）的反射表面反射回到低温杜瓦瓶中。

公开(公告)号：EP2551655A1

公开(公告)日：2013-01-30

申请号：EP12173022.0

申请日：2012-06-21

Applicant: Raytheon Company

Inventor： Robinson, Ian S. ,  Cook, Lacy G. ,  Shaham, Yifal J.

IPC: G01J3/04 ,  G01J3/28 ,  G01J3/02

CPC classification number: G01J3/0294 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/2823

Abstract: An imaging assembly for a spectrometer includes a substrate with first and second modules thereon containing respective arrays of detector elements positioned so the arrays are elongated along a first axis with a gap therebetween. A third module including a third array of detector elements is also thereon, spaced from the first axis, at least as long as the gap, and smaller than the elongation of either of the first or second arrays. Further thereon are first and second slits elongated along a second axis spaced from and generally parallel to the first axis, each being at least as long as the respective arrays. A third slit at least as long as the gap is also therein, spaced from the first axis, second axis, and third array such that the gap, third slit, and third array are generally along a third axis generally perpendicular to the first and second axis.

Abstract translation: 用于光谱仪的成像组件包括其上具有第一和第二模块的基板，其上包含相应的检测器元件阵列，所述检测器元件被定位成使得阵列沿着第一轴线在其间具有间隙而细长。 包括检测器元件的第三阵列的第三模块也在其上，与第一轴线间隔开至少等于间隙，并且小于第一或第二阵列中的任一个的伸长率。 此外，还具有沿着与第一轴线间隔开并且大致平行于第一轴线的第二轴线延伸的第一和第二狭缝，每个狭缝至少与相应的阵列一样长。 第三狭缝至少与间隙一样长，与第一轴线，第二轴线和第三阵列间隔开，使得间隙，第三狭缝和第三阵列通常沿着大致垂直于第一和第二阵列的第三轴线 轴。