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公开(公告)号：US20200241030A1
公开(公告)日：2020-07-30
申请号：US16649099
申请日：2018-06-20
Applicant: Shimadzu Corporation
Inventor： Hiroyuki MINATO , Takashi INOUE
Abstract: The sample plate has a principal plane in which a plurality of wells is arranged. The sample plate has a plurality of through-holes each allowing a sampling needle to pass through in a region of the principal plane where the wells are not provided, and positions of the wells and positions of the through-holes are designed such that when two pieces of the sample plates are arranged up and down with a predetermined positional relationship in a state in which respective principal planes are arranged in parallel each other, the through-holes of the sample plate arranged on an upper side is arranged at positions directly above respective wells of the sample plate arranged on a lower side.
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公开(公告)号：US20230057667A1
公开(公告)日：2023-02-23
申请号：US17796644
申请日：2020-02-21
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki MINATO , Nobumitsu FUKUSHIMA , Erika BABA
Abstract: A first attachment portion to which a packed column is attachable and a second attachment portion to which a chip column is attachable are housed in a column oven. Designation of a temperature of the column oven is received by a designated temperature receiver. In a case in which the chip column is not attached to the second attachment portion, an upper limit temperature of the column oven is set to a first temperature by a setter. An upper limit temperature of the column oven is set to a second temperature lower than the first temperature in a case in which the chip column is attached to the second attachment portion. A temperature of the column oven is adjusted to a received temperature by a temperature adjuster in a case in which the received temperature is equal to or lower than an upper limit temperature.
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公开(公告)号：US20150070695A1
公开(公告)日：2015-03-12
申请号：US14478903
申请日：2014-09-05
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki MINATO
CPC classification number: G01J3/18 , G01J3/28 , G01J2003/2866
Abstract: Provided is a method for performing a wavelength calibration of a monochromator with a diffraction grating by casting light from a standard light source whose emission intensity contains a change with a predetermined cycle onto the diffraction grating and measuring an intensity of light reflected by the grating. The method includes the steps of: measuring at least two times the intensity of the reflected light from the grating within the aforementioned cycle at each of the rotational positions of the grating corresponding to a range of wavelengths including a peak wavelength of a bright line spectral light generated by the standard light source; determining an intensity value 201 at each rotational position based on all the measured values obtained at the rotational position; and locating, as the peak wavelength of the bright line spectral light, a wavelength at which the intensity value 201 is maximized.
Abstract translation: 本发明提供一种通过将来自标准光源的发光强度包含预定周期的变化的标准光源投射到衍射光栅上并且测量由光栅反射的光的强度来进行具有衍射光栅的单色仪的波长校准的方法。 该方法包括以下步骤：在对应于包括亮线光谱光的峰值波长的波长范围的光栅的每个旋转位置处，测量上述周期内来自光栅的反射光的强度的至少两倍 由标准光源产生; 基于在所述旋转位置处获得的所有测量值来确定每个旋转位置处的强度值201; 并且将亮度光谱光的峰值波长定位为强度值201最大化的波长。
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Patent Agency Ranking
公开(公告)号：US20200049553A1
公开(公告)日：2020-02-13
申请号：US16441081
申请日：2019-06-14
Applicant: Shimadzu Corporation
Inventor： Hiroyuki MINATO
Abstract: A spectroscopic detector includes a light source, a flow cell, a diffraction grating, a diffraction grating drive unit, an optical sensor and a diffraction grating position adjustment unit. The diffraction grating drive unit is configured to adjust a rotation position of the diffraction grating within a range that light of a specified wavelength region of plus side diffracted light and light of the specified wavelength region of minus side diffracted light among diffracted light caused by the diffraction grating is selectively guided to the flow cell. The diffraction grating position adjustment unit is configured to adjust the rotation position of the diffraction grating unit in order to selectively guide one of the light of the specified wavelength region of the plus side diffracted light and the light of the specified wavelength region of the minus side diffracted light among the diffracted light caused by the diffraction grating.
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公开(公告)号：US20180341825A1
公开(公告)日：2018-11-29
申请号：US15606057
申请日：2017-05-26
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki MINATO
Abstract: In an automatic sampling device for automatically collecting a sample from a sample-holding container having a top surface on which a plurality of sample-holding portions as well as one or more reference points for position adjustment whose relative position to the sample-holding portions is previously known are provided, the automatic sampling device includes: a housing having an opening on a front side for allowing the sample-holding container to be set inside, the housing configured so that a closed space is formed inside when the opening is closed; a sample collector for collecting a sample from any one of the sample-holding portions of the sample-holding container set within the housing; and an appearance information acquisition assistant which assists in an acquisition of appearance information including the sample collector and the one or more reference points for position adjustment of the sample-holding container set within the housing.
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公开(公告)号：US20230349868A1
公开(公告)日：2023-11-02
申请号：US17799741
申请日：2020-02-27
Applicant: SHIMADZU CORPORATION
Inventor： Shotaro ANDO , Takashi INOUE , Tsutomu WATANABE , Hiroyuki MINATO , Nobumitsu FUKUSHIMA
CPC classification number: G01N30/60 , B01D15/22 , G01N30/16 , G01N30/32 , G01N2030/027
Abstract: A column accommodation device (1) includes a housing in which a column accommodation space (4) is provided, and a chip column (6) having a plate-shape and having an internal flow path (40) filled with a separation medium (41) is accommodated in the column accommodation space (4). An outer surface of the chip column (6) is provided with openings (42) respectively communicating with both ends of the internal flow path. Inside of the column accommodation space (4) is provided with a guide (18) for guiding the chip column (6) to a predetermined position. The column accommodation device (1) includes a seal device (32) for connecting and releasing pipes (44) to and from the openings (42) of the chip column (6), and a controller (46) configured to perform operation control of the seal device (32), and the controller (46) is configured to fluidly connect the pipes (44) with respect to the openings (42) of the chip column (6) when it is determined that the chip column (6) is arranged at the predetermined position.
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公开(公告)号：US20220291178A1
公开(公告)日：2022-09-15
申请号：US17635448
申请日：2020-03-23
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki MINATO , Takashi INOUE
Abstract: A needle driver moves a sampling needle. A display controller displays a layout input portion for receiving input of layout information in regard to an additional sample container in a display unit. A position information acquirer acquires position information representing positions of a predetermined count of containing portions in an additional sample container based on teaching work. A storage stores the input layout information and the acquired position information. A designation information acquirer acquires designation information designating a containing portion. A movement controller controls the needle driver based on the stored layout information, the stored position information and the acquired designation information such that the sampling needle is moved to the containing portion designated by the designation information.
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公开(公告)号：US20220018818A1
公开(公告)日：2022-01-20
申请号：US17413808
申请日：2018-12-20
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki MINATO , Masahide GUNJI
Abstract: A first liquid sending controller of an analysis control device controls a first liquid sender such that a mobile phase is supplied to a fluorescence detector through an analysis column and a junction during an analysis of a sample. A sample introduction controller controls a sample introducer such that the sample is introduced into a mobile phase by the sample introducer at a position farther upstream than the analysis column during the analysis of the sample. The second liquid sending controller causes a second liquid sender to start supplying a fluorescent reaction liquid such that the fluorescent reaction liquid arrives at the junction later than a point in time at which supply of the mobile phase starts and before the sample introduced into the mobile phase arrives at the junction during the analysis of the sample. A generator generates a chromatogram based on an output signal of the fluorescence detector during the analysis of the sample.
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