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公开(公告)号:US12101583B2
公开(公告)日:2024-09-24
申请号:US17059353
申请日:2019-03-13
Applicant: SONY CORPORATION
Inventor: Hajime Mihara , Shun Kaizu , Teppei Kurita , Yasutaka Hirasawa
CPC classification number: H04N9/3167 , G01J4/04 , G02B27/283 , G06T5/70 , H04N23/81 , H04N25/11 , H04N25/671
Abstract: An information generation unit 30 acquires, from a polarization imaging unit 20, observation values in which polarization directions are at least three or more directions (m≥3). A noise amount calculation unit 35-1 calculates an amount of noise on the basis of an observation value in a first polarization direction. Similarly, noise amount calculation units 35-2 to 35-m calculate amounts of noise on the basis of observation values in second to m-th polarization directions. A polarization model estimation unit 36 estimates a polarization model by using the observation values for the respective polarization directions and the amounts of noise calculated by the noise amount calculation units 35-1 to 35-m. Thus, it is possible to calculate a polarization model that is robust against noise.
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公开(公告)号:US12078834B2
公开(公告)日:2024-09-03
申请号:US17603574
申请日:2020-04-14
Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE
Inventor: Noah A. Rubin , Federico Capasso
CPC classification number: G02B5/3083 , G01J4/04 , G02B1/002 , G02B5/1833 , G02B27/4261
Abstract: An optical component includes a substrate and a metasurface comprising one or more linearly birefringent elements. The linearly birefringent elements define a grating configured to implement parallel polarization analysis for a plurality of polarization orders for incident light of an arbitrary polarization.
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公开(公告)号:US12025498B2
公开(公告)日:2024-07-02
申请号:US17778094
申请日:2020-11-20
Applicant: SPECTRICON IKE
Inventor: Konstantinos Balas
CPC classification number: G01J3/2823 , G01J3/021 , G01J3/0224 , G01J3/2803 , G01J4/04 , G01N21/21 , G01N21/23 , G01N21/31 , G01J2003/1213 , G01J2003/1226 , G01J2003/1247 , G01J2003/2806 , G01N2021/1765 , G01N2021/216
Abstract: The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a-priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.
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公开(公告)号:US20240210246A1
公开(公告)日:2024-06-27
申请号:US18291204
申请日:2022-07-22
Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE
Inventor: Noah A. RUBIN , Paul CHEVALIER , Federico CAPASSO
CPC classification number: G01J4/04 , G02B1/002 , G02B5/1842 , G02B26/0808
Abstract: An attachment for an intensity-only sensor in an imaging device includes a polarization-sensitive diffraction grating. The polarization-sensitive diffraction grating is configured to receive incident light from a scene, and to modify the incident light to simultaneously produce a plurality of non-overlapping images of the scene. each of a different diffraction order, on the intensity-only sensor to facilitate full-Stokes imaging polarimetry. The attachment includes a first adjustment mechanism configured to control at least one of: vignetting of the plurality of non-overlapping images on the intensity-only sensor, or an object distance of the imaging device.
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公开(公告)号:US20240201015A1
公开(公告)日:2024-06-20
申请号:US18537880
申请日:2023-12-13
Inventor: François Deneuville
IPC: G01J4/04
CPC classification number: G01J4/04
Abstract: A polarimetric image sensor formed inside and on top of a semiconductor substrate, the sensor including: —a plurality of pixels, each comprising a photodetector formed in the semiconductor substrate; —a polarizing filter arranged on the side of an illumination surface of the photodetectors, the filter including, for each pixel, a polarizing structure; and—a polarization router comprising a two-dimensional metasurface arranged on the side of the polarizing filter opposite to the photodetectors, the metasurface including a two-dimensional array of pads.
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公开(公告)号:US20240142308A1
公开(公告)日:2024-05-02
申请号:US17979395
申请日:2022-11-02
Applicant: Roger Smith
Inventor: Roger Smith
CPC classification number: G01J4/04 , G01J3/0224 , G01J3/2823
Abstract: This disclosure is directed to pulsed spectropolarimeters for conducting remote, non-perturbative measurements of the local magnetic field, density and temperature fields of a magnetized plasma medium. In one aspect, a pulsed spectropolarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of the scattered emission by the pulse in the backward direction, toward the source, while preserving the polarization state of the emission. A proportion of the emission is redirected to a spectrometer detector to determine the spectral distribution of the emission. A second optical collection and spectrometer system collects emission other than backscatter localized to the intersection of the pulse trajectory and the focus of this collection system.
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公开(公告)号:US20240044712A1
公开(公告)日:2024-02-08
申请号:US18268701
申请日:2021-12-14
Applicant: Oxford University Innovation Limited
Inventor: Chao HE , Martin BOOTH
IPC: G01J4/04
CPC classification number: G01J4/04
Abstract: A polarimeter (10) is disclosed. The polarimeter (10) comprises: a full Poincaré generator (110) configured to receive an incident light beam with unknown polarisation state and generate a full Poincaré beam therefrom; a polariser (130) configured to select an eigenstate from the full Poincaré beam generated by the full Poincaré generator (110); a detector (170) configured to detect a spatial distribution of intensity of the eigenstate selected by the polariser; and a processor (250) configured to determine a polarisation state of the incident light beam in dependence on the output from the detector (170).
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公开(公告)号:US20240011836A1
公开(公告)日:2024-01-11
申请号:US18253647
申请日:2021-11-18
Inventor: Stanley Pau
IPC: G01J4/04
CPC classification number: G01J4/04
Abstract: Methods, systems and devices are described that enable simultaneous measurement of the direction and polarization of electromagnetic waves. One example device includes a first, a second and a third detector, each configured to receive and measure an irradiance of an incoming electromagnetic radiation, and each are positioned such that their normal vectors point in a first, a second and a third direction that are different from one another. At least one of the detectors is further configured to obtain polarization information associated with the incoming electromagnetic radiation. The measured irradiances from the first, the second and the third detectors and the obtained polarization information enable identification of the direction of propagation and polarization state of the incoming electromagnetic radiation.
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公开(公告)号:US11709097B2
公开(公告)日:2023-07-25
申请号:US17379507
申请日:2021-07-19
Applicant: University of South Florida
Inventor: Zhimin Shi , Darrick Hay , Ziyi Zhu , Yiyu Zhou , Robert W. Boyd
Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
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公开(公告)号:US20230231069A1
公开(公告)日:2023-07-20
申请号:US17998203
申请日:2021-05-25
Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Inventor: Ayumi NIHEI , Tsutomu MIYASAKA
Abstract: This thin film is a thin film for detecting circularly polarized light, and includes a plurality of inorganic layers constituting a layered structure and/or a plurality of inorganic chains constituting a chain structure, which are formed of a perovskite type substance, and chiral molecules incorporated in at least a part of a boundary part between the adjacent inorganic layers and/or between the inorganic chains, wherein the chiral molecules include only one of S-form chiral molecules and R-form chiral molecules or chiral molecules with a higher abundance proportion of one of S-form chiral molecules and R-form chiral molecules than an abundance proportion of the other of S-form chiral molecules and R-form chiral molecules, and wherein the crystal structure of the perovskite type substance is oriented in a predetermined direction.
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