Abstract:
The present invention concerns an apparatus for slewing a light beam, having a base element and a support element carrying a light source or an optical component, wherein connecting elements which allow movement of the support element relative to the base element extend between the base element and the support element. The apparatus according to the present invention eliminates or at least reduces the disadvantages of additionally used optical components. The apparatus is characterized in that the connecting elements are spaced apart differently at their ends facing toward the base element and their ends facing toward the support element.
Abstract:
A microscope (1), preferably a confocal laser scanning microscope, having at least one light source, a detector, and two objectives (2), one of the objectives (2) being arranged on each of the two sides of the specimen plane (3) and the objectives (2) being directed toward one another and having a common focus; and at least one beam splitter (5) for distributing the illuminating light (6) to the objectives (2), and a beam recombiner (5) for combining the detected light (7) coming from the objectives (2), being provided in the illumination/detection beam path (4), is characterized, for selectable, subsequent implementation of ultrahigh-resolution microscope techniques, in that the objectives (2) and the beam splitter/beam recombiner (5) are grouped into a modular assembly (8); and the assembly (8) has an interface (9) for connection to the illumination/detection beam path (4) of the microscope (1).
Abstract:
A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.
Abstract:
An arrangement is proposed for detecting fluorescent light from a plurality of specimen points (2), in particular from microgene spots or microbiospots, the specimen points (2) being arranged on a slide (1). This arrangement comprises at least one light source for simultaneously illuminating the specimen points (2) with excitation light, and detection means, comprising detection elements (3), for simultaneously detecting the fluorescent light from the individual specimen points (2). According to the invention, the spacing d between the specimen points (2) and the respectively assigned detection elements (3) is selected to be as small as possible.
Abstract:
The invention concerns an arrangement for scanning a specimen receiving device (1) for data recording with a laser scanning microscope, preferably with a confocal laser scanning microscope (2), with which imaging of large specimen fields with sufficient speed is possible by scanning of the specimen receiving device (1), which is characterized in that the specimen receiving device (1) is alternatingly rotatable about a first axis (4) by a rotation device (3).
Abstract:
A Vibration damping device for a microscope comprises a housing. In the housing a foam rubber defining a cavity is formed which encloses a weight. The foam rubber has a plurality of interconnected pores. The housing is of the vibration damping device has in one embodiment a rectangular shape.
Abstract:
An apparatus for selecting and detecting at least one spectral region of a spectrally spread light beam, preferably in the beam path of a confocal scanning microscope, the spread light beam being focussable in a focal line, is characterized, for non-overlapping detection of the spectrally spread light beam of the selected spectral regions in the context of an increased number of detectors and an error-tolerant arrangement, in that there is arranged in the spread light beam an optical component which reflects and/or refracts the light beam to a detector and whose optically effective region becomes smaller or larger along the surface, so that by orientation of the component with respect to the focal line and the resulting superposition of the focal line and surface, the spectral region arriving at the detector is definable.
Abstract:
A point light source is disclosed for a laser scanning microscope (7). At least two lasers (1 and/or 2 and/or 3; 4) with different wavelengths may be coupled in the microscope (7). To combine the advantages of a multiline laser with those of the use of several independent one-line lasers, the point light source is characterised by at least two laser light sources the beam of which are fed into a beam combiner (5), and by an optical fibre (6) which leads directly or indirectly from the beam combiner (5) to the microscope (7).
Abstract:
A system and method for simultaneous representation of a surface profile of any given object, specially to measure the surface profile of teeth, comprises a light source to illuminate the object, an optical element to focus the light signals returning from the surface of the object, a detector to pick up the light signals, and a processor that digitizes and further processes the detected signals. The method enables quick, reproducible scanning of the surface profile by using as few devices as possible while ensuring at the same time a viable constructive size. The method includes placing a beam output coupler in the beam detection path downstream from the optical element to simultaneously couple our the light returning from the various image planes, the coupled-out light being guided to the detector.
Abstract:
A fine-focusing stage for microscopes, with an object carrier (1) , a holder (2) for the object carrier (1) and a positioning mechanism (3) adjusting the support in its horizontal position. In order to achieve parallel vertical displacement of the object carrier (1) using simple methods of construction the invention is so designed that the holder (2) comprises a mounting portion (4) preferably for mounting on an object stage or on the microscope and a connecting portion (5) with the object carrier, and articulated parallel arms (8,9) through bending elements (6,7) extend between the mounting portion (4) and the connecting portion (5).