Method and apparatus for in situ determination of molten polycarbonate composition using electronic absorption spectroscopy
    1.
    发明授权
    Method and apparatus for in situ determination of molten polycarbonate composition using electronic absorption spectroscopy 失效
    使用电子吸收光谱法原位测定熔融聚碳酸酯组合物的方法和装置

    公开(公告)号:US06809817B2

    公开(公告)日:2004-10-26

    申请号:US09682365

    申请日:2001-08-24

    CPC classification number: G01J3/42 G01J3/28

    Abstract: The present invention relates to methods and devices for in-situ measurement of reaction components of interest during manufacturing of polycarbonate by melt polymerization. The present invention describes irradiating a molten polymer sample with UV/visible light, and generating an absorbance profile correlated to Fries products as well as uncapped phenolic groups in the sample. The methods and apparatus of the invention are suitable for monitoring of Fries products in reactions ranging in size from small scale combinatorial formats to production scale reactors. Also included in methods of the invention are univariate and multivariate analysis for prediction of linear Fries, branched Fries and uncapped phenolic end-groups in unknowns.

    Abstract translation: 本发明涉及通过熔融聚合在聚碳酸酯制造过程中原位测量感兴趣的反应组分的方法和装置。 本发明描述了用UV /可见光照射熔融聚合物样品,并产生与Fries产品相关的吸光度分布以及样品中未封端的酚基。 本发明的方法和装置适用于在尺寸从小规模组合形式到生产规模反应器的反应中监测薯条产品。 本发明方法中还包括单变量和多变量分析,用于预测未知物中的线性薯条,分枝油炸饼和未封端的酚类末端基团。

    Optical shutter for spectroscopy instrument
    2.
    发明授权
    Optical shutter for spectroscopy instrument 有权
    光学仪器光学快门

    公开(公告)号:US06753959B2

    公开(公告)日:2004-06-22

    申请号:US09958448

    申请日:2001-10-05

    Abstract: Spectroscopy apparatus for spectrochemical analysis of a sample having an excitation source (60) for providing spectral light (62) of the sample for analysis. The spectral light (62) is analysed via an optical system (64-66-68) that includes a polychromator (70, 74-80) and solid state multielement array detector (82). The elements (i.e. pixels) of the detector (82) are serially reel by means (84) to provide light intensity measurements as a function of wavelength. A problem is that the elements (pixels) of the detector (82) continue to accumulate change during the serial read-out. This is avoided by providing an optical shutter (72) for blocking the spectral light (62) whilst elements (pixels) of the detector (82) are being serially read. Shutter (72) has a piezoelectric actuator which is preferably a bimorph mounted as a cantilever. It is preferably located adjacent to the entrance aperture (70) of the polychromator. Bimorph structures for the actuator and drive and protective circuit arrangements are also disclosed.

    Abstract translation: 具有用于提供用于分析的样品的光谱光(62)的激发源(60)的样品的光谱分析用光谱仪。 分光光(62)通过包括多色分光器(70,74-80)和固态多元件阵列检测器(82)的光学系统(64-66-68)进行分析。 检测器(82)的元件(即,像素)通过装置(84)串联卷绕以提供作为波长的函数的光强度测量。 问题在于,在串行读出期间,检测器(82)的元件(像素)继续积累变化。 这是通过提供用于阻挡分光光(62)的光学快门(72)而避免的,同时检测器(82)的元件(像素)被串行读取。 快门(72)具有压电致动器,其优选地是作为悬臂安装的双压电晶片。 它优选地位于多色调色板的入口孔(70)附近。 还公开了用于致动器和驱动器和保护电路装置的双压电晶片结构。

    Device for efficient light collection from a sample
    3.
    发明授权
    Device for efficient light collection from a sample 失效
    用于从样品高效收集光的装置

    公开(公告)号:US06721049B1

    公开(公告)日:2004-04-13

    申请号:US09532851

    申请日:2000-03-22

    Abstract: A spectrometric or photo-detector device accessory for illumination of a sample and highly efficient collection of light therefrom includes an ellipsoidal mirror having focal points f1 and f2; a first optical fiber leg having a terminus positioned at or near f1 and containing fibers for conveying light to f1 and collecting light emitted from a sample positioned at f1, a second optical fiber having a terminus positioned at or near f2, for collecting light reflected by the mirror and focussed at f2 and a rigid stand for holding the mirror and fiber optic cables in fixed alignment.

    Abstract translation: 用于照射样品并高效收集光的光谱测量或光电检测器装置附件包括具有焦点f1和f2的椭圆面镜; 具有位于f1附近或附近的第一光纤腿,并且包含用于将光传输到f1并收集从位于f1处的样品发射的光的光纤,具有位于或接近f2的终点的第二光纤,用于收集由 镜子和聚焦在f2和刚性支架用于保持镜子和光纤电缆固定对齐。

    System for spectrometry
    4.
    发明授权
    System for spectrometry 有权
    光谱测定系统

    公开(公告)号:US06710872B1

    公开(公告)日:2004-03-23

    申请号:US09660592

    申请日:2000-09-13

    CPC classification number: G01J3/28

    Abstract: A system for spectrometry includes an input device, a measuring device with a spectrophotometer, a calculating device and an output device for outputting results of calculations by the calculating device. The input device allows a user to input target wavelengths at which spectrometric measurements are to be carried out, character arrays representing variables assigned to measured values which are to be stored, and character arrays representing calculation formulas created according to specified rules. The measuring device serves to measure a sample spectrometrically with the spectrophotometer to obtain measured values at the inputted target wavelengths. The calculating device analyzes the character arrays representing the calculating formulas and carries out calculations of the calculating formulas by replacing any of the character arrays representing the variables, if contained in the calculating formulas, each by corresponding one of the measured values.

    Abstract translation: 用于光谱测定的系统包括输入装置,具有分光光度计的测量装置,计算装置和用于输出计算装置的计算结果的输出装置。 输入装置允许用户输入要执行光谱测量的目标波长,表示分配给要存储的测量值的变量的字符数组和表示根据规定的规则创建的计算公式的字符数组。 测量装置用于用分光光度计测量样品的光谱,以获得输入目标波长的测量值。 计算装置分析表示计算公式的字符数组,并且通过将表示变量的任何字符数组(如果包含在计算公式中)各自由相应的一个测量值替换来计算计算公式。

    Temperature compensation method for wavemeters
    5.
    发明授权
    Temperature compensation method for wavemeters 失效
    波长计温度补偿方法

    公开(公告)号:US06667804B1

    公开(公告)日:2003-12-23

    申请号:US09686483

    申请日:2000-10-10

    CPC classification number: G01J9/0246

    Abstract: A wavemeter for monitoring a wavelength of emission from a tunable laser includes a spectrometer disposed within a housing having a controlled pressure, and a temperature sensor and/or a pressure sensor for sensing the temperature and/or pressure, respectively, within the housing. The temperature and/or pressure are controlled such that they have relative values, and materials are selected, each for substantially minimizing temperature sensitivity of the spectrometer, such as for providing a temperature sensitivity of the spectrometer within ±0.1 pm/°K.

    Abstract translation: 用于监测来自可调谐激光器的发射波长的波长计包括设置在具有受控压力的壳体内的光谱仪,以及分别用于感测壳体内的温度和/或压力的温度传感器和/或压力传感器。 控制温度和/或压力使得它们具有相对值,并且选择材料,每个用于基本上最小化光谱仪的温度敏感性,例如用于将光谱仪的温度敏感度提供在±0.1pm /°K内。

    Refractive-diffractive spectrometer
    7.
    发明授权
    Refractive-diffractive spectrometer 失效
    折射衍射光谱仪

    公开(公告)号:US06661513B1

    公开(公告)日:2003-12-09

    申请号:US09991038

    申请日:2001-11-21

    Abstract: A diffraction grating and a prism with the appropriate characteristics are employed to provide a combined dispersive characteristic that is substantially linear over the visible spectrum. Radiation from the grating and prism is collimated by a lens towards a detector array. The grating or a telecentric stop between the grating and prism is placed at a focal point of the lens in a telecentric arrangement so that equal magnification is achieved at the detector array. If the detector array is replaced by a plurality of optical channels, a multiplexer/demultiplexer is obtained.

    Abstract translation: 使用衍射光栅和具有适当特性的棱镜来提供在可见光谱上基本上线性的组合色散特性。 来自光栅和棱镜的辐射由透镜朝向检测器阵列准直。 光栅或光栅和棱镜之间的远心光阑以远心布置放置在透镜的焦点处,使得在检测器阵列处实现相等的放大倍率。 如果检测器阵列被多个光通道替代,则获得多路复用器/解复用器。

    Apparatus and method for measuring the degradation of a tool
    8.
    发明授权
    Apparatus and method for measuring the degradation of a tool 失效
    用于测量工具退化的装置和方法

    公开(公告)号:US06633379B2

    公开(公告)日:2003-10-14

    申请号:US09877531

    申请日:2001-06-08

    Abstract: A machining apparatus (10) comprises a material removing tool (12) movably mounted for removing material from a workpiece (14); means for illuminating (42, 54) a sample area upon a tool surface (34) with excitation radiation; means for receiving (42, 54) sample light emitted from the sample area; a spectral analyzer (54) for performing a spectral analysis of the sample light received; and means for determining (60) the condition of the tool at the sample area from the spectral analysis of the sample light. The wear of the tool (12) is determined as such a condition. Operation parameters of the machining apparatus (10) are adjusted according to the determined wear. An example application is a wafer dicing tool.

    Abstract translation: 加工装置( 10 )包括可移动地安装以从工件去除材料的材料去除工具( 12 HIL> 14 ); 用于通过激发辐射照射( 42,54 )工具表面上的样品区域( 34 )的装置; 用于从样品区域发射的样品光的装置( 42,54 )。 用于对所接收的样本光进行光谱分析的光谱分析仪( 54 ) 以及用于从样本光的光谱分析中确定( 60 )样品区域中的工具的条件的装置。 刀具的磨损( 12 )被确定为这样的条件。 根据确定的磨损调整加工装置( 10 )的操作参数。 示例应用是晶片切割工具。

    Compact birefringent spectrometer
    9.
    发明授权
    Compact birefringent spectrometer 失效
    紧凑型双折射光谱仪

    公开(公告)号:US06618142B1

    公开(公告)日:2003-09-09

    申请号:US09891704

    申请日:2001-06-26

    Inventor: Mark W. Roberts

    CPC classification number: G01J3/28 G01J3/0256 G01J3/0259

    Abstract: A spectrometer uses collimated, P-polarized light made incident on a surface of an optically transparent material at angle &thgr;INC. The material transmits the light which reaches a boundary surface between the input material and an output optically transparent material. The input material is preferably highly dispersive, making Snell component values at the boundary surface markedly different for different wavelengths. The output material is preferably of low dispersion and high birefringence. Only one wavelength at the boundary surface has a Snell component value tangent to its corresponding index surface in the output section. Within this section, the ray vector for this wavelength is parallel to the boundary surface. Because optical energy propagates in the ray vector direction, only the narrow range of wavelengths having ray vectors substantially parallel to the boundary surface reach an output surface of the device. This narrow range of wavelengths comprises the passband incident on a detector.

    Abstract translation: 光谱仪使用以角度θINC入射在光学透明材料的表面上的准直的P偏振光。 该材料透射到达输入材料和输出光学透明材料之间的边界表面的光。 输入材料优选是高度分散的,使得在不同波长处的边界表面上的Snell分量值显着不同。 输出材料优选为低分散性和高双折射性。 在边界面上只有一个波长的Snell分量值与输出部分的相对应的折射面相切。 在该部分内,该波长的射线矢量平行于边界面。 因为光能在光线向量方向传播,所以只有具有基本上平行于边界表面的射线矢量的窄波长范围到达装置的输出表面。 这种窄的波长范围包括入射到检测器上的通带。

    Spectrometry measuring apparatus
    10.
    发明授权
    Spectrometry measuring apparatus 失效
    光谱测量仪

    公开(公告)号:US06597451B1

    公开(公告)日:2003-07-22

    申请号:US09686934

    申请日:2000-10-12

    Applicant: Nobuhiro Araki

    Inventor: Nobuhiro Araki

    CPC classification number: G01J3/02 G01J3/0208 G01J3/1838 G01J3/20

    Abstract: In a spectrographic type spectrometry measuring apparatus employing a concave holographic diffraction grating or a replica thereof, a small-size and light-weight spectrometry measuring apparatus having a high reliability with a spectrum position does not move in a photo detector plane in spite of an occurrence of a temperature change. This measuring apparatus is composed of a light-condensing device, a concave holographic diffraction grating or a replica thereof, and a telecentric correction lens for condensing a diffracted light from the diffraction grating telecentrically on the spectrum condensing plane. In this constitution, the spectral ray enters vertically to the spectrum focusing plane, and if the photo detector is moved in the optical axis direction due to a temperature change, the spectrum is not moved on the photo detector surface, and it is not necessary to calibrate an optical element due to an ambient temperature change.

    Abstract translation: 在使用凹面全息衍射光栅或其复制品的光谱型光谱测量装置中,尽管发生了光谱检测器平面中具有光谱位置的高可靠性的小尺寸和重量轻的光谱测量装置不会移动 的温度变化。 该测量装置由聚光装置,凹面全息衍射光栅或其复制品组成,以及用于将衍射光栅的衍射光以中心方向聚集在光谱冷凝平面上的远心校正透镜。 在这种结构中,光谱射线垂直于光谱聚焦平面进入,并且如果光电检测器由于温度变化而在光轴方向上移动,则光谱在光检测器表面上不移动,并且不需要 由于环境温度变化,校准光学元件。

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