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公开(公告)号:US20240126058A1
公开(公告)日:2024-04-18
申请号:US18547743
申请日:2022-02-23
Inventor: Dongkyun Kang , Jingwei Zhao , Clara Curiel
CPC classification number: G02B21/0032 , G01N21/47 , G02B21/0068 , G02B21/008 , G02B21/04 , G02B21/08 , G02B21/241 , G02B21/26 , G02B21/361 , G01N2021/1765 , G01N2021/4792 , G01N2201/0635 , G01N2201/0636 , G01N2201/0638 , G01N2201/0683
Abstract: Devices, systems and methods are described that enable formation of microscopic images with enhanced resolution and high specificity, which among other features and benefits can lead to increased diagnostic accuracy of skin diseases, and decrease the time needed for rendering a diagnosis and the time required for training medical personnel. One optical imaging device includes a condenser, a polarizing beam splitter, an objective lens, and an immersion medium that are arranged in a configuration that allows cross polarization imaging of a sample. The described devices can be implemented using inexpensive optoelectrical components, as well as using existing optical and processing components of commonly used mobile devices, which makes it possible to construct the microscopy devices and systems at low cost for use in a wide range of clinical settings.
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公开(公告)号:US11766176B2
公开(公告)日:2023-09-26
申请号:US17410206
申请日:2021-08-24
Applicant: The General Hospital Corporation
Inventor: Seemantini K. Nadkarni
CPC classification number: A61B5/0084 , A61B5/0062 , A61B5/02007 , A61B5/02028 , A61B5/6853 , A61B5/6869 , A61B5/6876 , A61B5/7203 , A61B5/7275 , G01N21/474 , G01N21/4788 , G01N21/49 , G02B6/0005 , G02B23/2453 , G02B23/26 , G01N2021/479 , G01N2021/4742 , G01N2201/0683 , G01N2201/08 , G01N2201/0826
Abstract: An apparatus for obtaining information regarding a biological structure(s) can include, for example a light guiding arrangement which can include a fiber through which an electromagnetic radiation(s) can be propagated, where the electromagnetic radiation can be provided to or from the structure. An at least partially reflective arrangement can have multiple surfaces, where the reflecting arrangement can be situated with respect to the optical arrangement such that the surfaces thereof each can receive a(s) beam of the electromagnetic radiations instantaneously, and a receiving arrangement(s) which can be configured to receive the reflected radiation from the surfaces which include speckle patterns.
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公开(公告)号:US11732194B2
公开(公告)日:2023-08-22
申请号:US17028823
申请日:2020-09-22
Applicant: FUJIFILM Corporation
Inventor: Keisuke Kodama , Mitsuyoshi Ichihashi , Shunya Katoh , Takeshi Nakamori
CPC classification number: C09K19/586 , B42D25/328 , G02B5/3016 , C09K19/36 , C09K2019/2078 , G01N21/21 , G01N2021/216 , G01N2201/0683 , G02B5/0841 , B42D25/328 , B42D25/30
Abstract: Provided are a cholesteric liquid crystal layer having an excellent reflection anisotropy, a low haze, and a high circular polarization degree of reflected light, and a method for producing the same. In addition, provided are a laminate, an optically anisotropic body, and a reflective film, each of which including the cholesteric liquid crystal layer. A cholesteric liquid crystal layer formed using a liquid crystal compound, in which, in at least one main plane out of a pair of main planes of the cholesteric liquid crystal layer, a direction of a molecular axis of the liquid crystal compound changes while continually rotating along at least one in-plane direction, the molecular axis of the liquid crystal compound is tilted with respect to the main plane of the cholesteric liquid crystal layer, and an arrangement direction of bright portions and dark portions derived from the cholesteric liquid crystalline phase, as observed under a scanning electron microscope in a cross section perpendicular to the main plane, is tilted with respect to the main plane of the cholesteric liquid crystal layer.
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公开(公告)号:US11717166B2
公开(公告)日:2023-08-08
申请号:US17379227
申请日:2021-07-19
Applicant: Cellview Imaging Inc.
Inventor: Ralph Zuckerman
IPC: A61B5/00 , A61B5/145 , A61B5/1455 , G01N21/64
CPC classification number: A61B5/0071 , A61B5/1455 , A61B5/14546 , A61B5/14555 , A61B5/14556 , A61B5/4842 , A61B5/7246 , A61B5/7278 , G01N21/645 , G01N21/6445 , G01N2021/6484 , G01N2201/0683 , G01N2201/12
Abstract: A non-invasive measurement of biological tissue reveals information about the function of that tissue. Polarized light is directed onto the tissue, stimulating the emission of fluorescence, due to one or more endogenous fluorophors in the tissue. Fluorescence anisotropy is then calculated. Such measurements of fluorescence anisotropy are then used to assess the functional status of the tissue, and to identify the existence and severity of disease states. Such assessment can be made by comparing a fluorescence anisotropy profile with a known profile of a control.
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95.
公开(公告)号:US20190113463A1
公开(公告)日:2019-04-18
申请号:US15940011
申请日:2018-03-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seongkeun CHO , Akinori OKUBO , Tae Hyun KIM , Sangwoo BAE , Janghwi LEE
CPC classification number: G01N21/8806 , G01N21/21 , G01N21/9501 , G01N2021/8848 , G01N2201/0683 , H01L21/67288 , H01L22/12
Abstract: An optical test system includes a stage region to accommodate an object to be tested, a first incident optical system which changes a first polarization state of a first light beam to a second polarization state and provide the first light beam in the second polarization state to the stage region in a first direction at a first incident angle which is not a right angle, a second incident optical system which changes a third polarization state of a second light beam to a fourth polarization state and inputs the second light beam in the fourth polarization state to the stage region in a second direction at a second incident angle which is not a right angle, and a main optical system to detect a first reflected light beam reflected from the stage region at a first reflection angle different from the first and second incident.
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公开(公告)号:US20180348119A1
公开(公告)日:2018-12-06
申请号:US15994431
申请日:2018-05-31
Inventor: Jeeseong C. Hwang , Heidrun Wabnitz
IPC: G01N21/25 , G01N21/27 , G01N33/49 , A61B5/1455 , A61B5/1495 , A61B5/00
CPC classification number: G01N21/255 , A61B5/14553 , A61B5/1495 , A61B5/7246 , G01N21/27 , G01N21/4785 , G01N21/4795 , G01N21/49 , G01N33/4925 , G01N2021/4797 , G01N2201/0675 , G01N2201/0683 , G01N2201/0893
Abstract: An optical phantom produces a time-resolved diffuse reflectance spectrum and includes: a light source; a spatial light modulator; and an optical delay line including optical fibers of different length that produce different time-of-flight distributions, such that different time-of-flight distributions are combined and produce phantom light having the time-resolved diffuse reflectance spectrum.
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97.
公开(公告)号:US20180217509A1
公开(公告)日:2018-08-02
申请号:US15937014
申请日:2018-03-27
Applicant: Carl Zeiss SMT GmbH
Inventor: Hans-Michael Stiepan
CPC classification number: G03F7/70633 , G01B11/02 , G01B11/272 , G01N21/8806 , G01N21/9501 , G01N2021/8848 , G01N2201/0683 , G03F7/705 , G03F7/70508 , G03F7/70625
Abstract: A method includes determining at least one characteristic variable which is characteristic of a patterned wafer based on a plurality of measurements of the intensity of electromagnetic radiation after the diffraction thereof at the patterned wafer. The intensity measurements are carried out for at least two different orders of diffraction. For at least two regions on the wafer, in each case a value of the characteristic variable that is assigned to the respective region is determined on the basis of a comparison of the measurement values obtained in the intensity measurements for the at least two orders of diffraction. The intensity measurements for determining the characteristic variable for the at least two regions on the wafer are carried out simultaneously.
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公开(公告)号:US20180184016A1
公开(公告)日:2018-06-28
申请号:US15902167
申请日:2018-02-22
Applicant: The Boeing Company
Inventor: Jeffrey H. Hunt
CPC classification number: H04N5/332 , B64F5/60 , G01N21/8806 , G01N21/95 , G01N2021/8472 , G01N2021/8845 , G01N2201/0683 , H04N5/2256
Abstract: A system for providing active real-time characterization of an article under test is disclosed. An infrared light source, a first visible light source and a second visible light source each outputs and directs a beam of coherent light at a particular area on the article under test via respective optical fibers. A visible light camera and a visible light second harmonic generation camera, an infrared camera and an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera are each configured to receive a respective return beam of light from the particular area on the article under test via respective optical fibers. A processor receives signals from the cameras and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value.
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公开(公告)号:US20180143077A1
公开(公告)日:2018-05-24
申请号:US15876472
申请日:2018-01-22
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Abner BELLO , Stephanie WAITE , William J. FOSNIGHT , Thomas BEEG
IPC: G01J5/00
CPC classification number: H01L21/6732 , G01J5/0007 , G01J5/025 , G01J5/0825 , G01J5/0896 , G01N21/211 , G01N21/55 , G01N2201/06113 , G01N2201/0683 , G01N2201/12 , G01R27/00 , G05B2219/37224 , H01L21/67253 , H01L21/67353 , H01L21/67386 , H01L21/67745 , H01L22/12
Abstract: A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.
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公开(公告)号:US09972959B2
公开(公告)日:2018-05-15
申请号:US15176346
申请日:2016-06-08
Applicant: KLA-Tencor Corporation
Inventor: Yung-Ho Chuang , J. Joseph Armstrong , Justin Dianhuan Liou , Vladimir Dribinski , David L. Brown
CPC classification number: H01S3/0057 , G01N21/21 , G01N21/9501 , G01N2201/06113 , G01N2201/0683 , G01N2201/0697 , G02B5/0816 , G02B5/3083 , G02B27/281 , G02B27/283 , G02B27/286 , H01S3/083
Abstract: A pulse multiplier includes a polarizing beam splitter, a wave plate, and a set of multi-surface reflecting components (e.g., one or more etalons and one or more mirrors). The polarizing beam splitter passes input laser pulses through the wave plate to the multi-surface reflecting components, which reflect portions of each input laser pulse back through the wave plate to the polarizing beam splitter. The polarizing beam splitter reflects each reflected portion to form an output of the pulse multiplier. The multi-surface reflecting components are configured such that the output pulses exiting the pulse multiplier have an output repetition pulse frequency rate that is at least double the input repetition pulse frequency.
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