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公开(公告)号:US20170372924A1
公开(公告)日:2017-12-28
申请号:US15193502
申请日:2016-06-27
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Abner BELLO , Stephanie WAITE , William J. FOSNIGHT , Thomas BEEG
CPC classification number: G01J5/0096 , G01J5/0007 , G01J5/025 , G01J5/0825 , G01J5/0896 , G01N21/211 , G01N21/55 , G01N2201/06113 , G01N2201/0683 , G01N2201/12 , G01R27/00 , H01L21/67253 , H01L21/6732 , H01L21/67353 , H01L21/67386 , H01L22/12
Abstract: A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.
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公开(公告)号:US20180143077A1
公开(公告)日:2018-05-24
申请号:US15876472
申请日:2018-01-22
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Abner BELLO , Stephanie WAITE , William J. FOSNIGHT , Thomas BEEG
IPC: G01J5/00
CPC classification number: H01L21/6732 , G01J5/0007 , G01J5/025 , G01J5/0825 , G01J5/0896 , G01N21/211 , G01N21/55 , G01N2201/06113 , G01N2201/0683 , G01N2201/12 , G01R27/00 , G05B2219/37224 , H01L21/67253 , H01L21/67353 , H01L21/67386 , H01L21/67745 , H01L22/12
Abstract: A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.
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公开(公告)号:US20180048169A1
公开(公告)日:2018-02-15
申请号:US15233454
申请日:2016-08-10
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Abner BELLO , Stephanie WAITE , William J. FOSNIGHT
IPC: H02J7/00 , H02J50/10 , H01L21/677 , H02J7/02 , H01L21/67
CPC classification number: H02J50/10 , H01L21/67379 , H01L21/67386 , H01L21/67396 , H01L21/6773 , H01L21/67736 , H01L21/67775 , H02J7/0044 , H02J7/025
Abstract: Rechargeable wafer carrier systems and methods are provided. A rechargeable wafer carrier system includes, for instance, a housing for holding at least one wafer and at least one electronics system therein, a rechargeable power source operably connected to the housing for powering the at least one electronics system, and a charging interface for receiving a supply of power for charging the rechargeable power source. The housing may be configured for transport within an automated material handling system. Also provided are methods of charging a rechargeable wafer carrier system, which includes, for instance, providing a rechargeable wafer carrier system having at least one electronics system and a rechargeable power source, operably connecting the rechargeable wafer carrier system to a charging base, and supplying power from the charging base to the rechargeable power source.
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公开(公告)号:US20140308108A1
公开(公告)日:2014-10-16
申请号:US13859773
申请日:2013-04-10
Applicant: GLOBALFOUNDRIES INC.
Inventor: William J. FOSNIGHT , Ryan J. GALLAGHER , Stephen B. MINER
IPC: H01L21/677
CPC classification number: H01L21/67775 , H01L21/67379
Abstract: A system for separately handling different size FOUPs includes an end effector having a surface thereon for supporting a FOUP. The end effector and surface is configured to support different size FOUPs. A fixture or means for engaging and maintaining a FOUP, of different size FOUPs, included to position and maintain each of a different size FOUP on the end effector during transport thereof. A shelf is configured to receive each of said different size FOUPs. The end effector is thus capable of transporting either a first size FOUP or a second, smaller size FOUP.
Abstract translation: 用于分开处理不同尺寸的FOUP的系统包括其上具有用于支撑FOUP的表面的端部执行器。 端部执行器和表面配置为支持不同尺寸的FOUP。 包括用于接合和保持不同尺寸FOUP的FOUP的固定装置或装置,用于在其运送期间在末端执行器上定位和保持每个不同尺寸的FOUP。 架子被配置为接收每个所述不同大小的FOUP。 因此,末端执行器能够运送第一尺寸FOUP或第二较小尺寸的FOUP。
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