Abstract:
Determining and using the ideal size of memory to be transferred from high speed memory to a low speed memory may result in speedier saves to the low speed memory and a longer life for the low speed memory.
Abstract:
Embodiments of the invention relate to throttling accesses to a flash memory device. The flash memory device is part of a storage system that includes the flash memory device and a second memory device. The throttling is performed by logic that is external to the flash memory device and includes calculating a throttling factor responsive to an estimated remaining lifespan of the flash memory device. It is determined whether the throttling factor exceeds a threshold. Data is written to the flash memory device in response to determining that the throttling factor does not exceed the threshold. Data is written to the second memory device in response to determining that the throttling factor exceeds the threshold.
Abstract:
A storage controller is configured to determine a reliability metric of a storage division of a solid-state storage medium based on one or more test read operations. The storage division may be retired based on the reliability metric and/or the age of the data on the storage division. A storage division comprising aged data may be marked for post-write reliability testing, which may comprise determining a post-write reliability metric in response to grooming and/or reprogramming the storage division. The storage controller may project the reliability metric of the storage division to the end of a predetermined data retention period. Portions of a storage divisions that exhibit poor reliability may be removed to improve the reliability of the storage division without taking the entire storage division out of service.
Abstract:
A memory device has a plurality of dedicated data blocks for storing only user data and a plurality of dedicated overhead blocks for storing only overhead data that comprises ECC data that is used for error checking with respect to the user data in the dedicated data blocks. The dedicated data blocks can be erased without erasing the ECC data that is used for error checking with respect to the user data in the dedicated data blocks.
Abstract:
A memory management method for a rewritable non-volatile memory module including physical unit unions is provided. The physical unit unions are at least partitioned into a data area and a second area. Logical unit union addresses are managed by a file system and would be allocated and mapped to the physical unit unions of the data area. The method includes executing a procedure if a programming error occurs when programming a third physical unit union of the second area. The procedure includes obtaining a second physical unit union mapped to a second logical unit union address from the data area and mapping the second logical unit union address to the third physical unit union. Accordingly, the lifespan of the rewritable non-volatile memory module would be prolonged by the method.
Abstract:
A method and apparatus store media data on a portable electronic device. The method can include monitoring media data storage activity regarding user media data storage activity usage patterns that store media data in a memory in a portable electronic device. The method can include storing the media data storage activity data in the portable electronic device. The method can include triggering a full memory prediction algorithm based on a user action event that affects media data storage in the memory and can include running the full memory prediction algorithm in response to the trigger. The full memory prediction algorithm can predict when the memory will be substantially full based on past user media data storage behavior according to the media data storage activity data. The method can include outputting a potential upcoming full memory indication.
Abstract:
A system for wear-leveling of a non-volatile memory may include a controller configured to allocate memory blocks in the non-volatile memory, a logical-to-physical table populated with pointers to memory blocks in the nonvolatile memory, and a wear-leveling table configured to store two or more pointers to unallocated memory blocks in the non-volatile memory. The unallocated memory blocks are previously allocated to store data by the controller according to the pointers in the logical-to-physical table. The controller is further configured to identify two or more pointers in the wear-leveling table and to store data to the two or more memory blocks associated with the identified pointers.
Abstract:
A semiconductor device includes a first operation circuit configured to generate addition data by adding a column address and a page address and output a remainder obtained by dividing the addition data by a set value as seed data, a mask data output circuit configured to output mask data corresponding to the respective seed data, and a second operation circuit configured to generate random data by performing a logic operation on the mask data and program data corresponding to the column and page addresses.
Abstract:
Methods and apparatus for managing data storage in hybrid memory devices utilizing single level and multi-level memory cells. Logical addresses can be distributed between single level and multilevel memory cells based on a frequency of write operations performed. Initial storage of data corresponding to a logical address in memory can be determined by various methods including initially writing all data to single level memory or initially writing all data to multilevel memory. Other methods permit a host to direct logical address writes to single level or multilevel memory cells based on anticipated usage.
Abstract:
The present invention is provided for maintaining and replacing storage devices systematically in accordance with schedule. A storage control apparatus 1 has multiple storage devices 1A equipped with flash memory or the like. The storage control apparatus 1 monitors and records the utilization state of each storage device. When a storage device utilization state reaches a first threshold, the storage control apparatus starts an access control process to control the length of a maintenance period. When the storage device utilization state reaches a second threshold, the storage control apparatus executes blockage control, thereby causing this storage device to be replaced. The timing, at which a storage device with little lifetime remaining is replaced, is controlled to enhance maintenance work efficiency.