公开(公告)号：US07231071B2

公开(公告)日：2007-06-12

申请号：US10241670

申请日：2002-09-12

Applicant: Hideya Takeo ,  Takashi Imamura

Inventor： Hideya Takeo ,  Takashi Imamura

IPC: G06K9/00 ,  A61B6/04 ,  G01B15/02 ,  G01N23/223 ,  G01N23/04 ,  G01N23/201 ,  G01T1/36

CPC classification number: G06T7/0012

Abstract: In an abnormal shadow detecting system, a characteristic value on the shape and/or the density of a prospective area of a micro calcification shadow set in an image of an object is extracted on the basis of image data representing the image of the object, and whether a micro calcification shadow really exists in the prospective area is determined on the basis of the calculated characteristic value.

Abstract translation: 在异常阴影检测系统中，基于表示对象的图像的图像数据，提取对象中设置的微钙化阴影的预期区域的形状和/或密度的特征值，并且 根据计算出的特征值确定预期区域中是否存在微钙化阴影。

公开(公告)号：US07197404B2

公开(公告)日：2007-03-27

申请号：US10790404

申请日：2004-03-01

Applicant: Richard Andrew Holland

Inventor： Richard Andrew Holland

IPC: A61B5/00 ,  A61B6/00 ,  A61B6/02 ,  G06F19/00 ,  G01N23/201 ,  G01N23/00 ,  G01N23/02 ,  G21K1/12 ,  G01T1/00 ,  G01T1/02 ,  G01T1/20 ,  H05G1/60

CPC classification number: G05B13/04 ,  A61N5/1031 ,  A61N5/1045 ,  A61N2005/1091 ,  G06F17/5018 ,  G06F2217/10 ,  G06F2217/16

Abstract: The present system and method for simulating particles and waves is useful for calculations involving nuclear and full spectrum radiation transport, quantum particle transport, plasma transport and charged particle transport. The invention provides a mechanism for creating accurate invariants for embedding in general three-dimensional problems and describes means by which a series of simple single collision interaction finite elements can be extended to formulate a complex multi-collision finite element.

Abstract translation: 用于模拟粒子和波的本系统和方法对于涉及核和全光谱辐射传输，量子粒子传输，等离子体传输和带电粒子传输的计算是有用的。 本发明提供了一种用于创建用于嵌入一般三维问题的精确不变量的机制，并且描述了一系列简单的单个碰撞相互作用有限元素可以被扩展以制定复杂的多冲突有限元的装置。

公开(公告)号：US07166838B1

公开(公告)日：2007-01-23

申请号：US11135974

申请日：2005-05-23

Applicant: Gary R. Janik

Inventor： Gary R. Janik

IPC: G01N23/201

CPC classification number: G01N23/04

Abstract: An x-ray metrology system includes an e-beam generator to cause a test sample to emit x-rays, x-ray optics for focusing the x-rays, and an x-ray imager to generate an image of the test sample from the focused x-rays. Because the x-ray imager provides a direct representation of the x-ray emission characteristics of the test sample, the resolution of a measurement taken using such a sensor is limited only by the resolution of the sensor (and any focusing optics), rather than by the amount of e-beam spread in the thin film. The x-ray imaging can be performed for object planes at the test sample that are not parallel to the test sample, thereby allowing vertical dimension data to be accurately generated by the x-ray imaging system.

Abstract translation: x射线测量系统包括电子束发生器，以使测试样品发射x射线，用于聚焦x射线的x射线光学元件和x射线成像仪，以从 聚焦x射线。 由于x射线成像仪提供了测试样品的x射线发射特性的直接表示，所以使用这种传感器进行测量的分辨率仅受传感器（和任何聚焦光学器件）的分辨率的限制，而不是 通过电子束在薄膜中的传播量。 可以对与测试样品不平行的测试样品的物体平面执行x射线成像，从而允许由x射线成像系统精确地产生垂直尺寸数据。

公开(公告)号：US20060256917A1

公开(公告)日：2006-11-16

申请号：US11431217

申请日：2006-05-10

Applicant: Alan Jacobs ,  Edward Dugan

Inventor： Alan Jacobs ,  Edward Dugan

IPC: G01N23/203 ,  G01N23/201 ,  G21K1/02

CPC classification number: G01N23/203

Abstract: A snapshot backscatter radiography (SBR) system and related method includes at least one penetrating radiation source, and at least one substantially transmissive radiation detector. The substantially transmissive radiation detector is interposed between an object region to be interrogated and the radiation source. The substantially transmissive radiation detector receives and detects forward radiation from the radiation source before transmitting a portion thereof to interrogate the object region, wherein a portion of backscattered radiation provided by the object region is detected by the detector. A changeable collimating grid having a plurality of spaced apart radiation absorbing features is coupled to structure changing a position of the plurality of features and is disposed in at least one of the path of the forward radiation and the path of the backscattered radiation. An image of the object can be obtained by subtracting the forward radiation detected at the detector, or an estimate thereof, from a total of all radiation detected by the detector. Integrated circuit inspection, land mine detection, and luggage or cargo screening systems can all be SBR based.

Abstract translation: 快照后向散射照相（SBR）系统和相关方法包括至少一个穿透辐射源和至少一个基本上透射的辐射探测器。 基本上透射的辐射检测器插入待询问的物体区域和辐射源之间。 基本上透射的辐射检测器在传送其部分之前接收并检测来自辐射源的正向辐射以询问物体区域，其中由检测器检测由物体区域提供的一部分后向散射辐射。 具有多个间隔开的辐射吸收特征的可变的准直栅格耦合到改变多个特征的位置的结构，并且设置在前向辐射的路径和背向散射辐射的路径中的至少一个中。 可以通过从由检测器检测到的所有辐射的总和中减去在检测器处检测到的正向辐射或其估计来获得对象的图像。 集成电路检测，地雷检测，行李或货物检测系统都可以基于SBR。

公开(公告)号：US07116755B2

公开(公告)日：2006-10-03

申请号：US10482022

申请日：2002-06-17

Applicant: Kazuhiko Omote

Inventor： Kazuhiko Omote

IPC: G01N23/201

CPC classification number: G01N23/20 ,  G01N23/201 ,  G01N23/203

Abstract: A non-uniform density sample analyzing method for analyzing a distribution state of particle-like matter in a non-uniform density sample, where an actually measured X-ray scattering curve is an in-plane X-ray scattering curve obtained by in-plane diffraction measurement, and fitting between the in-plane X-ray scattering curve and the simulated X-ray scattering curve is performed. The value of the fitting parameter when the simulated X-ray scattering curve agrees with the in-plane X-ray scattering curve serves to indicate the in-plane direction distribution sate of the particle-like matter in the non-uniform density sample. This method can analyze the in-plane direction distribution state of the particle-like matter in the anisotropic non-uniform density sample easily and accurately. Its device and system are also disclosed.

Abstract translation: 用于分析非均匀密度样品中的颗粒状物质的分布状态的非均匀密度样品分析方法，其中实际测量的X射线散射曲线是通过平面内获得的平面内X射线散射曲线 衍射测量，并且在平面内X射线散射曲线和模拟的X射线散射曲线之间进行拟合。 当模拟X射线散射曲线与平面内X射线散射曲线一致时，拟合参数的值用于表示非均匀密度样品中颗粒状物质的面内方向分布状态。 该方法可以方便，准确地分析各向异性密度样品中颗粒状物质的面内方向分布状态。 其设备和系统也被公开。

公开(公告)号：US20060043310A1

公开(公告)日：2006-03-02

申请号：US11189950

申请日：2005-07-27

Applicant: Paul Arsenault ,  Esam Hussein

Inventor： Paul Arsenault ,  Esam Hussein

IPC: G01N23/201 ,  G01T3/00 ,  G01J1/42 ,  G01T1/00

CPC classification number: G01N23/20008

Abstract: The present invention pertains to a method and an apparatus to generate a density image of an object using fan or cone beams of radiation and collimated detectors on one side of the object. The method consists of irradiating an object with a plurality of pairs of non-parallel radiation beams wherein the beams in each pair intersect a same segment along the axis of the detector. Compton-scattering radiation from the beams are then measured, and corrected attenuation coefficients along each beam are obtained. This latter step is effected by taking a first ratio of detector measurements for the beams in each pair; comparing the first ratio with a second ratio of corresponding calculated detector measurements and balancing discrepancies between the first and second ratios in a forward-inverse numerical analysis algorithm. Taking ratios of attenuation coefficients along related incident beams eliminates non-linearity problems whereby the aforesaid algorithm can be solved.

Abstract translation: 本发明涉及使用辐射的风扇或锥形束以及物体的一侧的准直检测器来生成物体的浓度图像的方法和装置。 该方法包括用多对非平行辐射束照射物体，其中每对中的光束沿着检测器的轴线与相同的部分相交。 然后测量来自波束的康普顿散射辐射，并且获得沿着每个波束的校正衰减系数。 后一步骤通过对每对中的波束进行检测器测量的第一比例来实现; 将第一比率与相应计算的检测器测量值的第二比值以及正向数值分析算法中的第一和第二比率之间的平衡差异进行比较。 沿相关入射光束的衰减系数的比率消除了非线性问题，由此可以解决上述算法。

公开(公告)号：US06993113B2

公开(公告)日：2006-01-31

申请号：US10457354

申请日：2003-06-10

Applicant: Kazuhito Hoshino ,  Yoshio Iwasaki

Inventor： Kazuhito Hoshino ,  Yoshio Iwasaki

IPC: G01N23/201 ,  G01N23/20

CPC classification number: G01N23/201

Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.

Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中，通过X射线测量装置获得离子交换膜的小角度散射曲线，该X射线测量装置可以检测相对于施加到膜的X射线的轴以小角度散射的X射线。 从这些峰的小角散射曲线上的峰位置和X射线强度的位置，确定离子交换膜的分子结构，评价离子交换膜的性能。

公开(公告)号：US06937695B2

公开(公告)日：2005-08-30

申请号：US10673185

申请日：2003-09-30

Applicant: Kazuhito Hoshino

Inventor： Kazuhito Hoshino

IPC: G01N23/201 ,  G01N27/62

CPC classification number: G01N23/201

Abstract: Provided are an analyzing apparatus and an analyzing method for analyzing a sample by performing measurements using X-rays and measuring a gas generated from the sample.

Abstract translation: 提供了一种分析装置和分析方法，用于通过使用X射线进行测量并测量从样品产生的气体来分析样品。

公开(公告)号：US20050163282A1

公开(公告)日：2005-07-28

申请号：US10968327

申请日：2004-10-20

Applicant: Ludwig Zerle

Inventor： Ludwig Zerle

IPC: G01G9/00 ,  G01N23/203 ,  G01N23/201

CPC classification number: G01N23/203 ,  G01G9/005

Abstract: The invention relates to a method for determining a gsm substance and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an X-radiation, scattered from a material sample, a detector signal corresponding to the gsm substance and/or the chemical composition of the material sample is generated and used for determining the gsm substance and/or the chemical composition of the material sample. A device for determining a gsm substance and/or a chemical composition of a material sample has a compact measurement head (10) arranged unilaterally with respect to the material sample. This measurement head includes an X-radiation source (20) and a detector arrangement (30) integrated into the measurement head of at least one X-ray detector connected to a voltage supply and an evaluation unit.

Abstract translation: 本发明涉及一种用于确定被输送材料样品的gsm物质和/或化学成分的方法。 从对材料样品散射的入射电离辐射，特别是X射线的一部分的分析，生成对应于gsm物质的检测器信号和/或材料样品的化学成分，并用于确定 gsm物质和/或材料样品的化学成分。 用于确定材料样品的gsm物质和/或化学成分的装置具有相对于材料样品单侧布置的紧凑的测量头（10）。 该测量头包括集成到连接到电压源和评估单元的至少一个X射线检测器的测量头中的X射线源（20）和检测器装置（30）。

公开(公告)号：US06895075B2

公开(公告)日：2005-05-17

申请号：US10364883

申请日：2003-02-12

Applicant: Boris Yokhin ,  Alexander Dikopoltsev ,  Tzachi Rafaeli ,  Amos Gvirtzman

Inventor： Boris Yokhin ,  Alexander Dikopoltsev ,  Tzachi Rafaeli ,  Amos Gvirtzman

IPC: G01N23/201 ,  G01N23/20 ,  G01N23/203

CPC classification number: G01N23/20

Abstract: Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.

Abstract translation: 用于检查样品的装置包括辐射源和检测器元件的阵列，其布置成由于辐射源对表面的区域的照射而从表面接收辐射。 该阵列具有用于沿着垂直于该表面的第一轴分解接收的辐射的第一操作配置，以及用于沿着平行于该表面的第二轴分解所接收的辐射的第二操作配置。 信号处理器以两种配置处理来自检测器阵列的信号，以便确定作为相对于表面的仰角的函数的表面的反射率和作为方位角的函数的表面的散射曲线作为方位角的函数 表面。