公开(公告)号：US20150355087A1

公开(公告)日：2015-12-10

申请号：US14761378

申请日：2014-01-16

Applicant: WESTBORO PHOTONICS

Inventor： Tim MOGGRIDGE

IPC: G01N21/47

CPC classification number: G01N21/4738 ,  G01N2201/0642 ,  G01N2201/065

Abstract: The invention relates to a light integrating cavity device, such as an integrating sphere, for measuring diffuse reflectance of a sample. A light trap is movable within a light scattering cavity of the device for controlling specular reflections during measurements. The light trap may be rotatable around the sample under test inside the cavity so that specular reflections off the sample can be included or excluded from the measurement. The sample may also be placed at the outside against a measurement port, and a measurement instrument is moveable on a rotating arm within or outside of the cavity.

Abstract translation: 本发明涉及一种用于测量样品的漫反射率的光积分腔装置，例如积分球。 光阱可在器件的光散射腔内移动，用于在测量期间控制镜面反射。 光阱可以在空腔内围绕被测试样品旋转，使得样品的镜面反射可以包含或排除在测量之外。 样品也可以放置在外部抵靠测量端口，并且测量仪器可以在空腔内部或外部的旋转臂上移动。

公开(公告)号：US20140043615A1

公开(公告)日：2014-02-13

申请号：US13570100

申请日：2012-08-08

Applicant: John G. Hagopian ,  Stephanie A. Getty ,  Manuel A. Quijada

Inventor： John G. Hagopian ,  Stephanie A. Getty ,  Manuel A. Quijada

IPC: F28F7/00 ,  B05D1/36 ,  C23C16/26 ,  G01N21/47 ,  C23C16/448 ,  B82Y40/00 ,  B82Y30/00

CPC classification number: C23C16/26 ,  B82Y30/00 ,  B82Y40/00 ,  C23C16/0281 ,  G01N2201/0642

Abstract: A system, apparatus and method employing carbon nanotubes on substrates such as silicon, titanium, copper, stainless steel and other substrates, where the carbon nanotubes are blacker than existing paints and coatings, thereby providing an exponential increase in stray light suppression depending on the number of bounces of such treated surfaces. Additionally, the present invention is directed to techniques to better absorb and radiate unwanted energies. Further, the alternate substrates offer strength of material for numerous components and in numerous physical applications. The present invention is also directed to techniques for improving the adhesion of the nanotubes to the alternate substrate materials and also extending the wavelength of operation from the near ultraviolet to the far infrared portion of the spectrum (0.2 microns to 120 microns wavelength).

Abstract translation: 在诸如硅，钛，铜，不锈钢和其他基底的基底上使用碳纳米管的系统，设备和方法，其中碳纳米管比现有的涂料和涂层更黑，从而根据数量提供杂散光抑制的指数增加 的这种处理表面的反弹。 另外，本发明涉及更好地吸收和辐射不需要的能量的技术。 此外，替代的基板提供了许多部件和许多物理应用中的材料的强度。 本发明还涉及用于改善纳米管与替代的基底材料的粘合性并且还将波长的波长从光谱的近紫外到远红外部分延伸（0.2微米到120微米波长）的技术。

公开(公告)号：US20130223832A1

公开(公告)日：2013-08-29

申请号：US13776219

申请日：2013-02-25

Applicant: Lockheed Martin Corporation

Inventor： Edward Jozef Miesak

IPC: F21V13/08 ,  G03B15/03

CPC classification number: F21V13/08 ,  G01N21/255 ,  G01N21/33 ,  G01N2201/0636 ,  G01N2201/0642 ,  G02B5/26 ,  G02B19/0047 ,  G03B15/03

Abstract: A system including a housing configured to receive a light emitted from an illumination source, a reflective filter system within the housing configured to direct a certain wavelength of the light emitted from the illumination source towards a target, and a baffle system configured to remove scattered light from the light emitted from the illumination source prior to the certain wavelength of light illuminating the target. A method and another system are also disclosed.

Abstract translation: 一种包括被配置为接收从照明源发射的光的壳体的系统，所述壳体内的反射滤光器系统，被配置为将从所述照明源发射的光的特定波长引向目标;以及挡板系统，其构造成去除散射光 从在照射目标的某一波长的光之前从照明源发射的光。 还公开了一种方法和另一系统。

公开(公告)号：US08436990B2

公开(公告)日：2013-05-07

申请号：US13055240

申请日：2009-07-22

Applicant: Daisuke Matsumoto ,  Yasunori Shiraki ,  Michio Naka

Inventor： Daisuke Matsumoto ,  Yasunori Shiraki ,  Michio Naka

IPC: G01N21/05

CPC classification number: G01N21/05 ,  B01L3/502715 ,  B01L2300/0654 ,  B01L2300/0822 ,  B01L2300/0877 ,  G01N21/0303 ,  G01N27/44791 ,  G01N2021/0346 ,  G01N2021/056 ,  G01N2201/0642

Abstract: The present invention relates to a microchip 1 having a translucent member 11, a flow channel 10 or a cell formed at a side of the translucent member 11 where light enters, and an aperture 16 formed at a position corresponding to the flow channel 10 or the cell at a side of a translucent member 10 where light goes out. The aperture 16 has a light go-through surface 17 which causes light flux being emitted from the flow channel 10 or the cell to go through and a light reflective surface 18 that totally reflects the incident light flux. A width size W1 of the light go-through surface 17 is smaller than a width size W2 of the flow channel 10 or the cell.

Abstract translation: 本发明涉及一种微芯片1，其具有半透明部件11，流路10或形成在透光部件11的光入射侧的单元，以及形成在对应于流路10或 电池在光出射的半透明构件10的一侧。 孔16具有光通过表面17，其使得从流动通道10或单元发射的光束通过;以及全反射入射光通量的光反射表面18。 光透过表面17的宽度尺寸W1小于流路10或单元的宽度尺寸W2。

公开(公告)号：US20120154806A1

公开(公告)日：2012-06-21

申请号：US12971334

申请日：2010-12-17

Applicant: Andrei Brunfeld ,  Gregory Toker ,  Bryan Clark

Inventor： Andrei Brunfeld ,  Gregory Toker ,  Bryan Clark

IPC: G01J4/00

CPC classification number: G01J1/0429 ,  G01B9/0203 ,  G01B11/0608 ,  G01B11/2441 ,  G01N21/474 ,  G01N21/8806 ,  G01N2201/0642

Abstract: An optical inspection system includes a polarizing isolator that reduces error in measurements by preventing ghost light reflected or scattered from element of a detection subsystem from re-entering the illumination and detection optical paths. The polarizing isolator may include a polarizing splitter that isolates light directionally according the a linear polarization state and two quarter-wave plates for transforming linearly polarized light to circularly polarized light.

Abstract translation: 光学检查系统包括偏振隔离器，其通过防止从检测子系统的元件反射或散射的重影光重新进入照明和检测光路来减少测量中的误差。 偏振隔离器可以包括偏振分离器，其根据线性偏振状态定向地隔离光，并且可以包括用于将线偏振光转换成圆偏振光的两个四分之一波片。

公开(公告)号：US08085388B2

公开(公告)日：2011-12-27

申请号：US12001606

申请日：2007-12-11

Applicant: Steven P. Kaufman ,  Arkady Savikovsky ,  Christopher C. Chagaris ,  Joel Stave

Inventor： Steven P. Kaufman ,  Arkady Savikovsky ,  Christopher C. Chagaris ,  Joel Stave

IPC: G01C3/08

CPC classification number: G01B11/2518 ,  G01N21/4738 ,  G01N21/9515 ,  G01N21/95623 ,  G01N2021/8411 ,  G01N2021/8472 ,  G01N2201/0642 ,  G02B26/101 ,  G02B27/2292 ,  G03B21/005 ,  G03B21/28 ,  G03B35/18 ,  G06T7/521 ,  H04N9/3129 ,  H04N9/3185 ,  H04N9/3194

Abstract: A 3D pulsed laser projection system scans an object to produce a dense 3D point cloud and projects a laser light beam onto an object as a glowing template. A high-sensitivity optical feedback system receives and detects a feedback beam of the output beam light diffusely reflected from the object. The feedback light and projected beam share the same beam path between steering mirrors and the object. A light suppression component controls stray scattered light, including ambient light, from being detected. A time-of-flight measurement subsystem provides a distance-to-object measurement for projected pulses. An acousto-optical modulator, variable gain detected signal amplification and variable photo-detector power together produce a dynamic range for detected reflected feedback signals of at least 100,000, and up to 500,000. Optical fiber cables spatially filter scattered light and isolate the photo-detectors thermally. The laser is preferably pulsed at least 50 kHz, with sampling of the projected and feedback reflected optical pulse signals at a sampling rate of up to 10 gigasamples per second.

Abstract translation: 3D脉冲激光投影系统扫描物体以产生致密的3D点云，并将激光束投射到物体上作为发光模板。 高灵敏度的光学反馈系统接收并检测从物体漫反射的输出光束的反射光束。 反射光和投影光束在转向镜和物体之间共享相同的光束路径。 光抑制部件控制被检测的杂散散射光，包括环境光。 飞行时间测量子系统为投影脉冲提供距离对象测量。 声光调制器，可变增益检测信号放大和可变光电检测器功率一起为检测到的反射信号产生至少100,000，最高达500,000的动态范围。 光纤电缆在空间上过滤散射光，并将光电检测器隔离开。 激光器优选地脉冲至少50kHz，其中投影和反射的反射光脉冲信号的采样速率最高达每秒10吉比特。

公开(公告)号：US20100136709A1

公开(公告)日：2010-06-03

申请号：US12598397

申请日：2008-06-27

Applicant: Thomas Ruckstuhl ,  Stefan Seeger

Inventor： Thomas Ruckstuhl ,  Stefan Seeger

IPC: G01N21/62 ,  G01N21/00

CPC classification number: G01N21/0303 ,  B01L3/5027 ,  B01L3/5082 ,  B01L3/5085 ,  B01L2300/0654 ,  G01N21/645 ,  G01N21/6452 ,  G01N21/6458 ,  G01N2201/0642 ,  G02B2207/113

Abstract: The invention relates to a liquid receptacle comprising a bottom and sidewalls for holding a liquid. The bottom encompasses a flat sensor surface that is in contact with the liquid when the receptacle is filled, a light-incident area that is located below the sensor surface and is suitable for focusing light onto the sensor surface, a light emergence area, and a cover area that is suitable for reflecting light from the sensor surface such that the light can emerge through the light emergence area. The invention further relates to a method for qualitatively or quantitatively determining an analyte in such a liquid receptacle. In said method, excitation light is focused onto the sensor surface via the light-incident area such that a luminescent marker which characterizes the analyte is excited, and the generated luminescence is then reflected onto the cover surface and is detected after emerging through the light emergence area. The invention also relates to an analysis device comprising a holder for a liquid receptacle, a light source that is disposed such that the light thereof can be focused onto the sensor surface of the liquid receptacle via the light-incident area, and a detector which is arranged in such a way as to be able to detect the light emerging from the light emergence area of the liquid receptacle.

Abstract translation: 本发明涉及一种液体容器，其包括用于保持液体的底部和侧壁。 底部包括当容器被填充时与液体接触的平坦传感器表面，位于传感器表面下方并且适于将光聚焦到传感器表面上的光入射区域，光出射区域和 覆盖区域，其适于反射来自传感器表面的光，使得光可以通过光出射区域出射。 本发明还涉及用于定性或定量地测定这种液体容器中的分析物的方法。 在所述方法中，激发光通过光入射区域聚焦到传感器表面上，使得表征分析物的发光标记物被激发，并且所产生的发光然后被反射到盖表面上，并且在通过光出射出现之后被检测 区。 本发明还涉及一种分析装置，其包括用于液体容器的保持器，设置成使得其光能够经由光入射区域聚焦到液体容器的传感器表面上的光源，以及检测器 以能够检测从液体容器的光出射区域出射的光的方式布置。

公开(公告)号：US07538866B2

公开(公告)日：2009-05-26

申请号：US11789228

申请日：2007-04-24

Applicant: Wolfgang Heine ,  Dieter Spriegel ,  Michael Stockmann ,  Martin Weber

Inventor： Wolfgang Heine ,  Dieter Spriegel ,  Michael Stockmann ,  Martin Weber

IPC: G01N21/88

CPC classification number: G01N21/896 ,  G01N21/8901 ,  G01N21/958 ,  G01N33/386 ,  G01N2021/4716 ,  G01N2021/4735 ,  G01N2021/8905 ,  G01N2201/0642 ,  G01N2201/1042

Abstract: In one aspect, an optical sensor is used to detect defects, which can appear on smooth surfaces, is provided. The sensor includes a telecentric laser scanner and a detection unit. The scanner includes a laser for the approximately perpendicular illumination of a smooth surface, a scanning mirror, and a telecentric optical system for guiding illumination and detection beams the detection unit includes an optical detector system, a central diaphragm, which is concentrically positioned in the vicinity of the optical detector system in the direction toward the telecentric laser scanner, a highly sensitive photomultiplier for detecting scattered light, which emanates from defects on smooth surfaces, and a slit diaphragm arranged upstream of the photomultiplier.

Abstract translation: 在一个方面，提供光学传感器来检测出现在光滑表面上的缺陷。 传感器包括远心激光扫描仪和检测单元。 扫描器包括用于光滑表面的大致垂直照明的激光器，扫描镜和用于引导照射和检测光束的远心光学系统，该检测单元包括光学检测器系统，中心光阑，其同心地位于附近 的光检测器系统朝向远心激光扫描器的方向，用于检测由平滑表面上的缺陷产生的散射光的高灵敏度光电倍增器和布置在光电倍增管上游的狭缝光阑。

公开(公告)号：US20080306390A1

公开(公告)日：2008-12-11

申请号：US11758188

申请日：2007-06-05

Applicant: Can Cinbis

Inventor： Can Cinbis

IPC: A61B1/06

CPC classification number: G01N21/15 ,  A61B5/0031 ,  A61B5/0086 ,  A61B5/1459 ,  A61N1/3706 ,  G01N21/49 ,  G01N2201/0642

Abstract: An implantable medical device system including an optical sensor monitors for the presence of overgrowth on the sensor by sensing light scattered by a measurement volume, the sensed light corresponding to a first wavelength, and deriving an overgrowth metric in response to the sensed light. The overgrowth metric is correlated to the presence of overgrowth on the sensor and is compared to a predetermined threshold. The presence of overgrowth on or near the sensor is detected in response to the overgrowth metric crossing the threshold.

Abstract translation: 包括光学传感器的可植入医疗装置系统通过感测由测量体积散射的光，对应于第一波长的感测光，以及响应于感测到的光而导出过度生长度量来监测传感器上是否存在过度生长。 过度生长度量与传感器上过度生长的存在相关，并与预定阈值进行比较。 响应于越过阈值的过度生长度量来检测在传感器上或附近存在过度生长。

公开(公告)号：US07388659B2

公开(公告)日：2008-06-17

申请号：US11359431

申请日：2006-02-23

Applicant: Yoichiro Kobayashi

Inventor： Yoichiro Kobayashi

IPC: G01N21/00

CPC classification number: G01N21/94 ,  G01N2021/95676 ,  G01N2201/0642 ,  G03F1/62 ,  G03F1/82 ,  G03F1/84

Abstract: An inspection apparatus for inspecting a surface of an object for a particle. The apparatus includes an irradiator configured to irradiate the surface with inspection light, a first detector configured to detect light scattered at the surface, a shield configured to limit an irradiation region of the inspection light emitted by said irradiator within a limited region of the surface, and a field stop arranged between the detector and the surface and having an aperture which allows the light scattered at an edge portion of an end face of the object to pass through, in which the light passing through the aperture is detected.

Abstract translation: 一种用于检查颗粒物体表面的检查装置。 所述装置包括：被配置为用所述表面照射所述检查光的照射器，构造成检测在所述表面散射的光的第一检测器，被配置为将所述照射器发射的检查光的照射区域限制在所述表面的有限区域内的屏蔽， 以及设置在所述检测器和所述表面之间并具有允许在所述物体的端面的边缘部分散射的光通过的孔，其中检测到穿过所述孔的光。