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    Imaging spectrometer with freeform surfaces
    111.
    发明授权
    Imaging spectrometer with freeform surfaces 有权

    公开(公告)号：US10444069B2

    公开(公告)日：2019-10-15

    申请号：US15579201

    申请日：2016-06-07

    Applicant: University of Rochester

    Inventor： Jannick P. Rolland ,  Jacob Reimers

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/18

    Abstract: Expanded performance opportunities for imaging spectrometers are described using ϕ-polynomial freeform surfaces in reflective and diffractive optics. The imaging spectrometers are generally of a type that include an entrance aperture for admitting radiation over a range of wavelengths, a detector array, a primary reflective optic with optical power, a secondary reflective diffractive optic, and a tertiary reflective optic with optical power for collectively imaging the entrance aperture onto the detector array through a range of dispersed positions. One or more of the primary reflective optic, the secondary reflective diffractive optic, and the tertiary reflective optic can include a ϕ-polynomial optical surface with no axis of symmetry and represented by a function that depends on both a radial component and an azimuthal component.

    Method of securing a modulation range
    113.
    发明授权
    Method of securing a modulation range 有权

    公开(公告)号：US10401226B2

    公开(公告)日：2019-09-03

    申请号：US15828512

    申请日：2017-12-01

    Applicant: SICK AG

    Inventor： Julian Edler ,  Thomas Beyer ,  Samson Frank

    IPC: G01N21/25 ,  G01J3/51 ,  G02B27/10 ,  G01J3/18 ,  G01J3/10 ,  G01J3/42 ,  G01N21/27 ,  G01N21/39 ,  G01J3/02 ,  H01S3/13

    Abstract: A method of securing a modulation range of a wavelength-variable radiation source as part of the measurement of an absorption line of a substance comprises: the radiation source being controlled to transmit radiation such that the wavelength of the radiation runs through the modulation range in accordance with a time pattern; the radiation being filtered by means of a filter in whose pass band the absorption line is disposed and which has at least one filter flank whose actual wavelength is within the modulation range; a spectrum of the filtered radiation being determined in that the intensity of the filtered radiation is detected with respect to the time pattern; and a determination being made whether the spectrum has the at least one filter flank.

    Spectroscope
    114.
    发明授权
    Spectroscope 有权

    公开(公告)号：US10393581B2

    公开(公告)日：2019-08-27

    申请号：US16217604

    申请日：2018-12-12

    Applicant: JVC KENWOOD CORPORATION

    Inventor： Yuichi Hagihara ,  Taiki Kobayashi ,  Norikazu Takahashi

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/18

    Abstract: A spectroscope includes a light receiving element and a wavelength selection filter unit. The light receiving element includes a pixel region where a plurality of pixels are disposed. The wavelength selection filter unit is disposed on the pixel region and includes a plurality of wavelength selection filters. The plurality of wavelength selection filters have transmission wavelength characteristics which are different from each other, and split incident light for each wavelength or each wavelength band. The light receiving element generates a light receiving signal by photoelectrically converting light which is split by the wavelength selection filter and is incident on the pixel region, for each pixel.

    Wideband spectrograph
    115.
    发明授权
    Wideband spectrograph 有权

    公开(公告)号：US10386234B2

    公开(公告)日：2019-08-20

    申请号：US15485097

    申请日：2017-04-11

    Applicant: KLA-Tencor Corporation

    Inventor： Kenneth P. Gross

    IPC: G01J3/28 ,  G01J1/42 ,  G01J3/10 ,  G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  G01N21/21

    Abstract: A wideband spectrograph apparatus includes a first spectrograph assembly and one or more subsequent spectrograph assemblies. Each subsequent spectrograph assembly is optically coupled to a previous spectrograph assembly and is configured to receive a cascading beam from one or more dispersion elements of the previous spectrograph assembly. The first spectrograph assembly is configured for detecting illumination in a first wavelength range and the one or more subsequent spectrograph assemblies are configured for detecting illumination in wavelength ranges different from the first or any previous wavelength ranges to provide simultaneous sampling of different spectral portions of an input beam.

    Method of spectrometer and spectrometer
    119.
    发明授权
    Method of spectrometer and spectrometer 有权

    公开(公告)号：US10345149B2

    公开(公告)日：2019-07-09

    申请号：US15206992

    申请日：2016-07-11

    Applicant: Graduate School at Shenzhen, Tsinghua University

    Inventor： Kai Ni ,  Qian Zhou ,  Jinchao Pang ,  Jinchao Zhang ,  Rui Tian ,  Mingfei Xu ,  Hao Dong

    IPC: G06F17/10 ,  G01J3/18 ,  G01J3/28

    Abstract: A design method of a spectrometer and a spectrometer are disclosed, including the following steps: 1) determining an incident angle of a second incident slit and a groove-shaped cycle of a concave grating; 2) estimating a blaze angle of the concave grating, determining a surface material and a groove-shaped structure of the concave grating; 3) acquiring wavelength-diffraction efficiency curves; 4) determining values of incident angles θA1 and θA3 and values of wavelengths λ2 and λ3, and setting λ4 to equal λ2; 5) acquiring a record structural parameter and a use structural parameter; 6) determining a manufacture parameter of the concave grating; 7) determining locations of the three incident slits and the three photodetectors relative to the concave grating. The spectrometer acquired by using this method has relatively high diffraction efficiency in most spectrum regions and effectively alleviates the problem of relatively low diffraction efficiency in a broad spectrum region.

    Echelle grating demux/mux in SiN
    120.
    发明授权
    Echelle grating demux/mux in SiN 有权

    公开(公告)号：US10317621B2

    公开(公告)日：2019-06-11

    申请号：US15885544

    申请日：2018-01-31

    Applicant: Finisar Corporation

    Inventor： Daniel Mahgerefteh

    IPC: G02B6/12 ,  G02B6/293 ,  G02B5/18 ,  G01J3/18 ,  G01J3/02

    Abstract: In an example, an Echelle grating wavelength division multiplexing (WDM) device includes a first waveguide, a slab waveguide, multiple second waveguides, an Echelle grating, and a metal-filled trench. The first waveguide includes either an input waveguide or an output waveguide. The multiple second waveguides are optically coupled to the first waveguide through the slab waveguide. The multiple second waveguides include multiple output waveguides if the first waveguide includes the input waveguide or multiple input waveguides if the first waveguide includes the output waveguide. The Echelle grating includes multiple grating teeth formed in the slab waveguide. The metal-filled trench forms a mirror at the grating teeth to reflect incident light from the first waveguide toward the multiple second waveguides or from the multiple second waveguides toward the first waveguide.

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