公开(公告)号：US20180031472A1

公开(公告)日：2018-02-01

申请号：US15549507

申请日：2016-02-10

Applicant: University Court of the University of St Andrews

Inventor： Robert J H HAMMOND ,  Mario E GIARDINI ,  Stephen H GILLESPIE

IPC: G01N21/47 ,  G01N21/53 ,  C12Q1/02 ,  C12Q1/18 ,  C12Q1/06 ,  G01N21/51 ,  G01N15/06

CPC classification number: G01N21/474 ,  C12Q1/00 ,  C12Q1/02 ,  C12Q1/06 ,  C12Q1/18 ,  G01J3/0254 ,  G01J3/433 ,  G01J2003/4334 ,  G01N15/06 ,  G01N21/031 ,  G01N21/11 ,  G01N21/51 ,  G01N21/53 ,  G01N2015/0065 ,  G01N2015/0693 ,  G01N2021/6469 ,  G01N2021/6482 ,  G01N2201/06113 ,  G01N2201/0642 ,  G01N2201/065

Abstract: A system for measuring a sample comprising: an integrating sphere light collector (12) for collecting light and containing the sample; a light source (24) for introducing light in the integrating sphere light collector (12), wherein the light source (24) is operable to output light with a known modulation, preferably by using a signal generator (26); a detector (22) for detecting scattered light in the integrating sphere light collector (12) and generating a signal indicative of the scattered light, and a lock-in amplifier (28) operable use the known light modulation and the signal generated by the detector (22) to provide an output for analysis.

公开(公告)号：US20170248528A1

公开(公告)日：2017-08-31

申请号：US15507545

申请日：2015-08-28

Applicant: Aurora Solar Technologies (Canada) Inc.

Inventor： Stephen Warren BLAINE

IPC: G01N21/95 ,  H01L21/66 ,  G01J3/02 ,  G01N21/55 ,  G01J3/433

CPC classification number: G01N21/9501 ,  G01J3/0254 ,  G01J3/433 ,  G01N21/3563 ,  G01N21/55 ,  G01N21/9505 ,  G01N2021/3568 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/065 ,  H01L22/12 ,  H01L31/18

Abstract: A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material into an integrating sphere to scatter the received radiation and passing portions of the radiation through band pass filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.

公开(公告)号：US09587984B2

公开(公告)日：2017-03-07

申请号：US15165814

申请日：2016-05-26

Applicant: Korea Research Institute of Standards and Science

Inventor： Seongchong Park ,  Dong-Hoon Lee ,  Chul-Woung Park ,  Seung-Nam Park

IPC: G01J1/04 ,  G01J3/50 ,  G01J3/02 ,  G01J3/04

CPC classification number: G01J3/504 ,  G01J3/0254 ,  G01J3/0262 ,  G01J3/04 ,  G01J2003/045

Abstract: A gonio-spectroradiometer and a measuring method thereof. The gonio-spectroradiometer includes a light source rotating on a light source axis, a first integrating sphere revolving around the light source with respect to a revolving axis perpendicular to the light source axis with a fixed radius and including an entrance formed in a direction to see the light source, a light intensity modulator adapted to modulate light intensity of light received through the first integrating sphere according to the rotation amount of the revolving axis, and a detector adapted to measure output light of the light intensity modulator at each wavelength.

Abstract translation: 光谱辐射计及其测量方法。 陀螺仪辐射计包括在光源轴上旋转的光源，围绕光源围绕光源轴线垂直于光源轴线旋转的第一积分球，其具有固定的半径，并且包括沿着观察方向形成的入口 光源，适于根据旋转轴的旋转量调制通过第一积分球接收的光的光强度的光强调制器，以及适于测量每个波长的光强度调制器的输出光的检测器。

公开(公告)号：US20170010214A1

公开(公告)日：2017-01-12

申请号：US15200535

申请日：2016-07-01

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Yoshihiro OSAWA ,  Tsutomu MIZUGUCHI ,  Munehiro NOGUCHI

IPC: G01N21/64

CPC classification number: G01J3/28 ,  G01J3/0218 ,  G01J3/0251 ,  G01J3/0254 ,  G01J3/0286 ,  G01J3/18 ,  G01N21/0332 ,  G01N21/274 ,  G01N21/33 ,  G01N21/35 ,  G01N21/645 ,  G01N2201/1211

Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

Abstract translation: 提供了可以在相当短的时间内设置并且可以提高检测灵敏度的光学特性测量系统。 光学特性测量系统包括第一测量装置。 第一测量装置包括：布置在壳体中的第一检测元件; 至少部分地接合到冷却检测元件的第一检测元件的第一冷却单元; 以及抑制壳体内的检测元件周围发生的温度变化的抑制机构。

公开(公告)号：US09442010B2

公开(公告)日：2016-09-13

申请号：US14407626

申请日：2012-06-15

Applicant: Naoharu Yanagawa

Inventor： Naoharu Yanagawa

IPC: G01J3/443 ,  G01J3/02 ,  G01J1/08 ,  G01J1/04

CPC classification number: G01J3/0254 ,  G01J1/08 ,  G01J2001/0481

Abstract: The light measurement apparatus according to the present invention includes: an integrating sphere; a reference calibration light source body holding unit that is arranged on the integrating sphere and to which a reference calibration light source body is attached; a test light source body holding unit that is arranged on the integrating sphere and to which a test light source body to be measured is attached; a light detection unit that is arranged on the integrating sphere and detects light from the reference calibration light source body and the test light source body; and a control unit that controls lighting of the reference calibration light source body and the test light source body, the light measurement apparatus being configured so that only either one of the reference calibration light source body and the test light source body is able to selectively emit light in the integrating sphere.

Abstract translation: 根据本发明的光测量装置包括：积分球; 参考校准光源体保持单元，其布置在所述积分球上并附着有基准校准光源体; 测试光源体保持单元，其布置在所述积分球上，并且附接有待测量的测试光源体; 光检测单元，布置在积分球上并检测来自基准校准光源体和测试光源体的光; 以及控制单元，其控制所述基准校准光源体和所述测试光源体的照明，所述光测量装置被配置为使得仅所述参考校准光源体和所述测试光源体中的任一个能够选择性地发射 光在积分球。

公开(公告)号：US20160178431A1

公开(公告)日：2016-06-23

申请号：US14804613

申请日：2015-07-21

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Joon Sub LEE ,  Seung Won PARK

IPC: G01J1/04 ,  G01J1/42

CPC classification number: G01J1/42 ,  G01J1/58 ,  G01J3/0254 ,  G01J2001/0481 ,  G01J2001/4252

Abstract: A light measuring system including an integrating sphere having an aperture configured by opposing reflectors selectively aligned with complementary reflectors of at least one light source mounting block having a light source mounting region for mounting a light source thereon.

Abstract translation: 一种光测量系统，包括具有开口的积分球，所述积分球由相对的反射器配置，所述反射器选择性地与具有用于在其上安装光源的光源安装区域的至少一个光源安装块的互补反射器对准。

公开(公告)号：US09347823B2

公开(公告)日：2016-05-24

申请号：US14166796

申请日：2014-01-28

Applicant: National Institute of Metrology, P.R.China

Inventor： Ruoduan Sun

IPC: G01J1/10 ,  G01J1/02 ,  G01J3/02 ,  G01J1/04

CPC classification number: G01J1/0295 ,  G01J1/0437 ,  G01J1/0462 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0297

Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

公开(公告)号：US20150009501A1

公开(公告)日：2015-01-08

申请号：US14166796

申请日：2014-01-28

Applicant: NATIONAL INSTITUTE OF METROLOGY, P.R.CHINA

Inventor： Ruoduan Sun

IPC: G01J1/02 ,  G01J3/02

CPC classification number: G01J1/0295 ,  G01J1/0437 ,  G01J1/0462 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0297

Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

Abstract translation: 本发明公开了一种用于测量非线性误差绝对值的方法及其装置。 该方法包括：同时将N个反射板连接在光学测量仪器的采样端口处，其中每个反射板在采样端口具有相同的覆盖区域; 沿着光学测量仪器的光路放置孔; 根据需要测量非线性误差的光学测量仪器的测量范围中的位置调整使用的反射板数量; 在调整好的反射板被放置在采样端口之后，进行每次调整后获得输出结果; 对输出结果执行非线性误差的计算处理; 并获取光学测量仪器的输出结果的非线性误差。

公开(公告)号：US20140078507A1

公开(公告)日：2014-03-20

申请号：US14022783

申请日：2013-09-10

Applicant: BlueLight Analytics, Inc.

Inventor： Daniel LABRIE ,  Ivan Kostylev ,  Chris Felix

IPC: G01M11/02 ,  G02B5/02

CPC classification number: G01J1/0474 ,  A61C19/003 ,  G01J1/0204 ,  G01J1/0219 ,  G01J1/0271 ,  G01J1/0425 ,  G01J1/0488 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0254 ,  G01J3/0256 ,  G01J3/0264 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01M11/0235 ,  G01N21/55 ,  G02B5/02 ,  G02B5/021 ,  G02B5/0284

Abstract: The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications.

Abstract translation: 本发明的特征在于用于收集和测量来自外部光源的光的装置和方法。 通常，本发明的装置的特征在于光漫射元件，例如作为光收集器的部件，通过诸如光纤电缆的导光导管连接到诸如光谱仪的光测量装置。 该光漫射元件允许例如在其表面上实质上均匀的光扩散，从而允许精确的测量，同时允许设备的总占地面积保持相对较小和便携。 该光散射元件还允许设备的缩放的灵活性，以允许在广泛的应用中使用。

公开(公告)号：US08422018B2

公开(公告)日：2013-04-16

申请号：US13029067

申请日：2011-02-16

Applicant: Yoshihiro Osawa ,  Kazuaki Ohkubo

Inventor： Yoshihiro Osawa ,  Kazuaki Ohkubo

IPC: G01N21/55 ,  G01N21/47

CPC classification number: G01J3/0254 ,  G01J1/58 ,  G01J2001/0481 ,  G01J2001/4247

Abstract: An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.

Abstract translation: 光学测量装置包括在内壁上具有漫反射层的半球形部分和设置成包含半球形部分的大致中心的平面部分，并且关闭半球形部分的开口，并且在其上具有反射层 半球形部分的内表面侧。 平面部分包括：用于在形成在半球形部分和平面部分之间的积分空间中引入要均匀化的光的窗口中的至少一个以及用于提取在积分空间中均匀化的光的窗口; 由第一材料形成的外部，主要引起镜面反射，并且至少占据从最外周的预定宽度的区域; 以及由第二材料形成的内部，其主要引起漫反射并且具有比第一材料至少紫外区更高的反射率。