Semiconductor packaging structure
    131.
    发明授权

    公开(公告)号:US11658084B2

    公开(公告)日:2023-05-23

    申请号:US17318066

    申请日:2021-05-12

    CPC classification number: H01L23/3121 H01L21/565

    Abstract: A semiconductor packaging structure includes a substrate, a wiring layer, a mask layer, and a sealing layer. The substrate has an effective region and a dummy region surrounding the effective region. The wiring layer is disposed on the effective and dummy regions, and is formed with a predetermined pattern including spaced-apart protrusions to define at least one cavity partially exposing the dummy region. The mask layer covers the wiring layer, and is formed with a through hole to communicate in space with the cavity. The through hole is smaller in size than the cavity, and cooperates with the cavity to form an accommodating space. The sealing layer covers the mask layer, and includes an engaging element filling the accommodating space and adhering to the substrate.

    STACKED SEMICONDUCTOR PACKAGE AND PACKAGING METHOD THEREOF

    公开(公告)号:US20220165709A1

    公开(公告)日:2022-05-26

    申请号:US17210452

    申请日:2021-03-23

    Abstract: A stacked semiconductor package has a substrate, a first chip, at least one spacer, a second chip and an encapsulation. The first chip and the second chip are intersecting stacked on the substrate. The at least one spacer is stacked on the substrate to support the second chip. The encapsulation is formed to encapsulate the substrate, the first chip, the at least one spacer and the second chip. The at least one spacer is made of the material of the encapsulation. Therefore, the adhesion between the at least one spacer and the encapsulation is enhanced to avoid the delamination during the reliability test and enhances the reliability of the stacked semiconductor package.

    SEMICONDUCTOR PACKAGE
    135.
    发明申请

    公开(公告)号:US20220148955A1

    公开(公告)日:2022-05-12

    申请号:US17198653

    申请日:2021-03-11

    Abstract: A semiconductor package has a substrate, a chip and an encapsulation. The substrate has a dielectric layer, a copper wiring layer and a solder resist layer formed thereon. The copper wiring layer is formed on the dielectric layer and is covered by the solder resist layer. The solder resist layer has a chip area defined thereon and an annular opening formed thereon. The annular opening surrounds the chip area and exposes part of the copper wiring layer. The chip is mounted on the chip area and is encapsulated by the encapsulation. Therefore, the semiconductor package with the annular opening makes the solder resist layer discontinuous, and the concentration stress is decreased to avoid a crack formed on the solder resist layer or the copper wiring layer when doing thermal-cycle test.

    HEAD OF A CHIP PICKER
    136.
    发明申请

    公开(公告)号:US20220118631A1

    公开(公告)日:2022-04-21

    申请号:US17183752

    申请日:2021-02-24

    Abstract: A head of chip picker is disclosed. The head has a clipping seat and an elastic block. The clipping seat has a body and two arms. The arms are respectively and downwardly extended from two opposite sides of an inner top surface of the body, so a cavity with a wide-top and narrow-bottom shape is constituted among the inner top surface and the arms. The elastic block matches the cavity and is laterally inserted into the cavity. The elastic block is not deformed after inserting into the cavity and provides a flat bottom surface.

    MANUAL LABELING DEVICE
    138.
    发明申请

    公开(公告)号:US20220097891A1

    公开(公告)日:2022-03-31

    申请号:US17217207

    申请日:2021-03-30

    Abstract: A manual labeling device is disclosed. The manual labeling device has a platform, a plurality of positioning elements and a pivoting device. The platform has a labeling area. The positioning elements are mounted on the platform and around the labeling area. The pivoting device is pivotally mounted on one side of the platform and has a pivot shaft and a pivot arm. The operator manually places one product in the labeling area of the platform and the product is fixed in the labeling area by the positioning elements. The operator only pivots the pivot arm and the pivot arm directly aligns with the labeling area. Therefore, it does not take times to align the tool and the labeling area before attaching the label and the label attaching task is simplified to increase the productivity and quality of labeling (units per hour; UPH).

    IDENTIFICATION METHOD OF AN INTEGRATED CIRCUIT CHIP AND IDENTFICATION SYSTEM OF AN INTEGRATED CIRCUIT CHIP

    公开(公告)号:US20210365651A1

    公开(公告)日:2021-11-25

    申请号:US17037949

    申请日:2020-09-30

    Abstract: An identification method of an integrated circuit chip of the present invention includes identifying a surface structure or an internal structure of an integrated circuit chip, generating a structural information set according to the surface structure or internal structure, converting the structural information set into an identification information set. The identification information set generated by the above-mentioned identification method can be stored in a digital file, and a chip manufacturer requires no visible information printed on an outer surface of the integrated circuit chip such that factory information of the integrated circuit chip can be concealed. When retrieving the malfunctioned or defective integrated circuit chip, the manufacturer can acquire a new generated identification information set by identify the integrated circuit chip and compare the new generated identification information set and the generated identification information set stored in the file to obtain the factory information of the retrieved integrated circuit chip.

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