公开(公告)号：US12025498B2

公开(公告)日：2024-07-02

申请号：US17778094

申请日：2020-11-20

Applicant: SPECTRICON IKE

Inventor： Konstantinos Balas

IPC: G01J3/28 ,  G01J3/02 ,  G01J3/12 ,  G01J4/04 ,  G01N21/17 ,  G01N21/21 ,  G01N21/23 ,  G01N21/31

CPC classification number: G01J3/2823 ,  G01J3/021 ,  G01J3/0224 ,  G01J3/2803 ,  G01J4/04 ,  G01N21/21 ,  G01N21/23 ,  G01N21/31 ,  G01J2003/1213 ,  G01J2003/1226 ,  G01J2003/1247 ,  G01J2003/2806 ,  G01N2021/1765 ,  G01N2021/216

Abstract: The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a-priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.

公开(公告)号：US20240210246A1

公开(公告)日：2024-06-27

申请号：US18291204

申请日：2022-07-22

Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE

Inventor： Noah A. RUBIN ,  Paul CHEVALIER ,  Federico CAPASSO

IPC: G01J4/04 ,  G02B1/00 ,  G02B5/18 ,  G02B26/08

CPC classification number: G01J4/04 ,  G02B1/002 ,  G02B5/1842 ,  G02B26/0808

Abstract: An attachment for an intensity-only sensor in an imaging device includes a polarization-sensitive diffraction grating. The polarization-sensitive diffraction grating is configured to receive incident light from a scene, and to modify the incident light to simultaneously produce a plurality of non-overlapping images of the scene. each of a different diffraction order, on the intensity-only sensor to facilitate full-Stokes imaging polarimetry. The attachment includes a first adjustment mechanism configured to control at least one of: vignetting of the plurality of non-overlapping images on the intensity-only sensor, or an object distance of the imaging device.

公开(公告)号：US20240201015A1

公开(公告)日：2024-06-20

申请号：US18537880

申请日：2023-12-13

Applicant: Commissariat à I'Énergie Atomique et aux Énergies Alternatives

Inventor： François Deneuville

IPC: G01J4/04

CPC classification number: G01J4/04

Abstract: A polarimetric image sensor formed inside and on top of a semiconductor substrate, the sensor including: —a plurality of pixels, each comprising a photodetector formed in the semiconductor substrate; —a polarizing filter arranged on the side of an illumination surface of the photodetectors, the filter including, for each pixel, a polarizing structure; and—a polarization router comprising a two-dimensional metasurface arranged on the side of the polarizing filter opposite to the photodetectors, the metasurface including a two-dimensional array of pads.

公开(公告)号：US20240142308A1

公开(公告)日：2024-05-02

申请号：US17979395

申请日：2022-11-02

Applicant: Roger Smith

Inventor： Roger Smith

IPC: G01J4/04 ,  G01J3/02 ,  G01J3/28

CPC classification number: G01J4/04 ,  G01J3/0224 ,  G01J3/2823

Abstract: This disclosure is directed to pulsed spectropolarimeters for conducting remote, non-perturbative measurements of the local magnetic field, density and temperature fields of a magnetized plasma medium. In one aspect, a pulsed spectropolarimeter includes a light source emitting a polarized light pulse having sufficiently narrow spatial extent at a prescribed wavelength and a light gathering optical system including a light gathering optic having an optic axis directed toward the medium and positioned to collect and collimate a predetermined solid angle of the scattered emission by the pulse in the backward direction, toward the source, while preserving the polarization state of the emission. A proportion of the emission is redirected to a spectrometer detector to determine the spectral distribution of the emission. A second optical collection and spectrometer system collects emission other than backscatter localized to the intersection of the pulse trajectory and the focus of this collection system.

公开(公告)号：US20240044712A1

公开(公告)日：2024-02-08

申请号：US18268701

申请日：2021-12-14

Applicant: Oxford University Innovation Limited

Inventor： Chao HE ,  Martin BOOTH

IPC: G01J4/04

CPC classification number: G01J4/04

Abstract: A polarimeter (10) is disclosed. The polarimeter (10) comprises: a full Poincaré generator (110) configured to receive an incident light beam with unknown polarisation state and generate a full Poincaré beam therefrom; a polariser (130) configured to select an eigenstate from the full Poincaré beam generated by the full Poincaré generator (110); a detector (170) configured to detect a spatial distribution of intensity of the eigenstate selected by the polariser; and a processor (250) configured to determine a polarisation state of the incident light beam in dependence on the output from the detector (170).

公开(公告)号：US20240011836A1

公开(公告)日：2024-01-11

申请号：US18253647

申请日：2021-11-18

Applicant: Arizona Board of Regents on Behalf of the University of Arizona

Inventor： Stanley Pau

IPC: G01J4/04

CPC classification number: G01J4/04

Abstract: Methods, systems and devices are described that enable simultaneous measurement of the direction and polarization of electromagnetic waves. One example device includes a first, a second and a third detector, each configured to receive and measure an irradiance of an incoming electromagnetic radiation, and each are positioned such that their normal vectors point in a first, a second and a third direction that are different from one another. At least one of the detectors is further configured to obtain polarization information associated with the incoming electromagnetic radiation. The measured irradiances from the first, the second and the third detectors and the obtained polarization information enable identification of the direction of propagation and polarization state of the incoming electromagnetic radiation.

公开(公告)号：US11709097B2

公开(公告)日：2023-07-25

申请号：US17379507

申请日：2021-07-19

Applicant: University of South Florida

Inventor： Zhimin Shi ,  Darrick Hay ,  Ziyi Zhu ,  Yiyu Zhou ,  Robert W. Boyd

IPC: G01J4/04 ,  G01J11/00

CPC classification number: G01J4/04 ,  G01J11/00

Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

公开(公告)号：US20230231069A1

公开(公告)日：2023-07-20

申请号：US17998203

申请日：2021-05-25

Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCY

Inventor： Ayumi NIHEI ,  Tsutomu MIYASAKA

IPC: H01L31/08 ,  G01J4/04 ,  H10K71/12 ,  H10K85/50

CPC classification number: H01L31/08 ,  G01J4/04 ,  H10K71/12 ,  H10K85/50

Abstract: This thin film is a thin film for detecting circularly polarized light, and includes a plurality of inorganic layers constituting a layered structure and/or a plurality of inorganic chains constituting a chain structure, which are formed of a perovskite type substance, and chiral molecules incorporated in at least a part of a boundary part between the adjacent inorganic layers and/or between the inorganic chains, wherein the chiral molecules include only one of S-form chiral molecules and R-form chiral molecules or chiral molecules with a higher abundance proportion of one of S-form chiral molecules and R-form chiral molecules than an abundance proportion of the other of S-form chiral molecules and R-form chiral molecules, and wherein the crystal structure of the perovskite type substance is oriented in a predetermined direction.

公开(公告)号：US20230204494A1

公开(公告)日：2023-06-29

申请号：US18066374

申请日：2022-12-15

Applicant: Tata Consultancy Services Limited

Inventor： ACHANNA ANIL KUMAR ,  TAPAS CHAKRAVARTY ,  SUBHASRI CHATTERJEE ,  ARPAN PAL ,  JAYAVARDHANA RAMA GUBBI LAKSHMINARASIMHA ,  ROKKAM KRISHNA KANTH

IPC: G01N21/23 ,  G01J4/04 ,  G01N21/958

CPC classification number: G01N21/23 ,  G01J4/04 ,  G01N21/958

Abstract: Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

公开(公告)号：US11637967B2

公开(公告)日：2023-04-25

申请号：US17044533

申请日：2019-01-15

Applicant: SONY CORPORATION

Inventor： Ying Lu ,  Yasutaka Hirasawa ,  Yuhi Kondo ,  Tuo Zhuang ,  Legong Sun

IPC: H04N5/243 ,  G06T7/80 ,  G01J4/04 ,  G01N21/21 ,  H04N5/225 ,  H04N5/235 ,  H04N17/00

Abstract: Provided is a polarization imaging unit that acquires a polarization image using a lens. In a parameter storage unit of an information processing unit, parameters related to a change in polarization state due to the lens which are estimated in advance from polarization state information acquired by imaging a light source in a predetermined polarization state using the lens and polarization state information indicating the polarization state of the light source, for example, change parameters indicating the change in polarization state due to the lens or correction parameters for correcting the change in polarization state due to the lens are stored. A polarization state correction unit of the information processing unit corrects the change in polarization state due to the lens, using the parameters stored in advance in the parameter storage unit.