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    RAIL TRACK ASSET SURVEY SYSTEM
    145.
    发明申请
    RAIL TRACK ASSET SURVEY SYSTEM 审中-公开
    轨道资产调查系统

    公开(公告)号：US20170066459A1

    公开(公告)日：2017-03-09

    申请号：US14982212

    申请日：2015-12-29

    Applicant: Sameer Singh

    Inventor： Sameer Singh

    IPC: B61L15/00 ,  B61L23/04 ,  G06K9/46 ,  G06K9/62 ,  H04N5/247

    CPC classification number: B61L23/042 ,  B61K9/08 ,  B61L15/0072 ,  B61L15/0081 ,  B61L23/04 ,  B61L23/044 ,  B61L23/045 ,  B61L23/047 ,  B61L23/048 ,  B61L25/021 ,  B61L25/023 ,  B61L25/025 ,  B61L2205/04 ,  G01B11/22 ,  G01N21/8851 ,  G01N2201/10 ,  G01N2201/12 ,  G06K9/00771 ,  G06K9/46 ,  G06K9/6202 ,  G06K9/6215 ,  G06K9/6218 ,  G06K9/628 ,  G06K2209/19 ,  H04N5/247

    Abstract: The present application involves a railroad track asset surveying system comprising an image capture sensor, a location determining system, and an image processor. The image capture sensor is mounted to a railroad vehicle. The location determining system holds images captured by the image capture sensor. The image processor includes an asset classifier and an asset status analyser. The asset classifier detects an asset in one or more captured images and classifies the detected asset by assigning an asset type to the detected asset from a predetermined list of asset types according to one or more features in the captured image. The asset status analyser identifies an asset status characteristic and compares the identified status characteristic to a predetermined asset characteristic so as to evaluate a deviation therefrom.

    Abstract translation: 本申请涉及包括图像捕获传感器，位置确定系统和图像处理器的铁路轨道资产测量系统。 图像捕获传感器安装在铁路车辆上。 位置确定系统保持由图像捕获传感器捕获的图像。 图像处理器包括资产分类器和资产状态分析器。 资产分类器检测一个或多个捕获图像中的资产，并根据所捕获的图像中的一个或多个特征，从资产类型的预定列表分配资产类型到检测到的资产，从而对检测到的资产进行分类。 资产状态分析器识别资产状态特性，并将识别的状态特性与预定的资产特征进行比较，以评估其偏差。

    Defect inspection device and defect inspection method
    146.
    发明授权
    Defect inspection device and defect inspection method 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US09568439B2

    公开(公告)日：2017-02-14

    申请号：US15088673

    申请日：2016-04-01

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

    IPC: G01N21/00 ,  G01N21/95 ,  G01N21/956 ,  G01J1/04

    CPC classification number: G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷，高度精确地测量检测器的尺寸，检测检查装置被配置为包括：照射单元，其照射样品表面上的线性区域中的光; 检测单元，其检测来自所述线性区域的光; 以及处理通过检测光而获得的信号并检测缺陷的信号处理单元。 检测单元包括：光学组件，其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件，其具有阵列传感器，其中检测像素被二维地定位，其检测沿与所述一个方向正交的方向成像的沿所述一个方向扩散的光，并将每个所述检测像素的输出信号相加 光漫射的方向，并输出。

    Wavelength Scanning Apparatus and Method of Use Thereof
    147.
    发明申请
    Wavelength Scanning Apparatus and Method of Use Thereof 有权
    波长扫描仪及其使用方法

    公开(公告)号：US20170023479A1

    公开(公告)日：2017-01-26

    申请号：US14809175

    申请日：2015-07-25

    Applicant: STEM ARTS PROJECTS, LLC

    Inventor： Abraham Oommen ,  Matthew Greenleaf ,  Adam Koch ,  Amitabha Sarkar

    IPC: G01N21/64

    CPC classification number: G01J3/4406 ,  G01N21/0332 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/10

    Abstract: A wavelength scanning apparatus that detects at least four different florescent emission wavelengths simultaneously or nearly simultaneously is described. The wavelength scanning apparatus includes a heating block having at least four sample wells, each sample well configured for receiving a sample, at least four excitation activation apertures, and at least four fluorescence emission discharge apertures. The wavelength scanning apparatus also includes an analysis scanner having at least four light sources, where the at least four light sources excite at least four fluorophores, at least four excitation light filters that filter out light except that of the desired excitation wavelength/s, at least four fluorescence emission light filters that filter out light except that of the desired florescent emission wavelengths, and at least four photodetectors to detect light of the desired florescent emission wavelengths.

    Abstract translation: 描述了同时或几乎同时检测至少四种不同的荧光发射波长的波长扫描装置。 所述波长扫描装置包括具有至少四个样品阱的加热块，每个样品良好地配置用于接收样品，至少四个激发活化孔和至少四个荧光发射排放孔。 所述波长扫描装置还包括具有至少四个光源的分析扫描器，其中所述至少四个光源激发至少四个荧光团，至少四个激发光滤光器，其将除了所需激发波长/ 至少四个荧光发射滤光器，其滤出除所需荧光发射波长以外的光，以及至少四个光电检测器，以检测所需荧光发射波长的光。

    HIGH-RESOLUTION FLUORESCENCE MICROSCOPY USING A STRUCTURED BEAM OF EXCITATION LIGHT
    149.
    发明申请
    HIGH-RESOLUTION FLUORESCENCE MICROSCOPY USING A STRUCTURED BEAM OF EXCITATION LIGHT 有权
    高分辨率荧光显微镜，采用结构化的激光束

    公开(公告)号：US20160305884A1

    公开(公告)日：2016-10-20

    申请号：US15189300

    申请日：2016-06-22

    Applicant: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.

    Inventor： Stefan W. Hell

    IPC: G01N21/64 ,  G02B21/00 ,  G01B11/14

    CPC classification number: G01N21/6458 ,  G01B11/14 ,  G01N2201/068 ,  G01N2201/10 ,  G02B21/0032 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/16 ,  G02B21/367 ,  G02B27/58

    Abstract: In order to determine the locations of individual fluorescent molecules in a sample, which keep a minimum distance with regard to each other, the individual molecules are excited for emission of fluorescence light by means of excitation light. The fluorescence light is registered for different positions of a zero point of an intensity distribution of the excitation light. The distance between these positions is at least half the minimum distance of the fluorescent molecules. The locations of the fluorescent molecules are derived from the course of the intensity of the fluorescence light over the positions of the zero point of the excitation light.

    Abstract translation: 为了确定样品中各个荧光分子的位置，它们彼此保持最小距离，通过激发光激发单个分子发射荧光。 对于激发光的强度分布的零点的不同位置登记荧光。 这些位置之间的距离至少是荧光分子最小距离的一半。 荧光分子的位置是从激发光的零点的位置处的荧光强度的过程导出的。

    3D LASER PROJECTION, SCANNING AND OBJECT TRACKING
    150.
    发明申请
    3D LASER PROJECTION, SCANNING AND OBJECT TRACKING 有权
    3D激光投影，扫描和对象跟踪

    公开(公告)号：US20160265948A1

    公开(公告)日：2016-09-15

    申请号：US14642160

    申请日：2015-03-09

    Applicant: Laser Projection Technologies, Inc.

    Inventor： STEVEN P. KAUFMAN ,  KARI J. METTINEN ,  MASOUD MOHAZZAB ,  ARKADY SAVIKOVSKY ,  JOEL H. STAVE

    IPC: G01D5/34 ,  G02B5/136 ,  G03B21/20

    CPC classification number: H04N9/3194 ,  B23Q7/00 ,  G01B11/14 ,  G01N21/94 ,  G01N2201/10 ,  G01S3/786 ,  G02B5/136 ,  H04N9/3129 ,  H04N9/3161 ,  H04N9/3185

    Abstract: Techniques are disclosed for tracking the position of moving parts and assemblies using 3D laser projection, and projecting templates and other information onto the parts and assemblies based on position. The projected template may then be used, for example, to assist in fabrication of an assembly by indicating where to put a next component or layer, or to assist in post-fabrication inspection of an assembly by indicating where the various components or layers should have been placed. Reference targets can be used as fiducial points for aligning a laser projector with the work piece in question. When the work piece rotates or is otherwise moved to a next manufacturing or inspection position, the relative position of the laser projector and the work piece is updated by bucking-in to the reference targets. The laser projector can then project patterns or other information onto the work piece at the appropriate locations.

    Abstract translation: 公开了用于跟踪使用3D激光投射的移动部件和组件的位置以及基于位置将模板和其它信息投影到零件和组件上的技术。 然后可以使用投影的模板，例如通过指示在何处放置下一个组件或层来协助制造组件，或者通过指示各种组件或层应该具有哪些部分来辅助组装的后制造检查 被放置 参考目标可以用作将激光投影机与所讨论的工件对准的基准点。 当工件旋转或者否则移动到下一个制造或检查位置时，激光投影仪和工件的相对位置通过抵靠参考目标来更新。 然后，激光投影机可以在适当的位置将图案或其他信息投影到工件上。

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