公开(公告)号：US20050249331A1

公开(公告)日：2005-11-10

申请号：US10838893

申请日：2004-05-04

Applicant: James Wear ,  Robert Washenko

Inventor： James Wear ,  Robert Washenko

IPC: G01T1/24 ,  A61B6/00 ,  G01B15/02 ,  G01J1/00 ,  G01T1/36 ,  H01L25/00 ,  H01L27/14 ,  H01L27/146 ,  H01L31/0296 ,  H01L31/09

CPC classification number: G01T1/241 ,  G01T1/366 ,  H01L27/14623 ,  H01L27/14676 ,  H01L31/0296

Abstract: A monolithic detector uses a grid to block x-rays from inter-pixel regions such as are believed to cause electrical noise in the pixel signals.

Abstract translation: 单片检测器使用网格来阻止诸如被认为在像素信号中产生电噪声的像素间区域的x射线。

公开(公告)号：US20050242285A1

公开(公告)日：2005-11-03

申请号：US11167179

申请日：2005-06-28

Applicant: Hiroshi Tanaka

Inventor： Hiroshi Tanaka

IPC: G01B11/00 ,  G03F9/00 ,  G06T7/00 ,  H01L21/00 ,  H01L21/027 ,  H01L21/68 ,  G21K7/00 ,  G01J1/00

CPC classification number: H01L21/682 ,  G03F9/7084 ,  G03F9/7088 ,  G06T7/73 ,  H01L21/67259 ,  H01L2223/54453

Abstract: An apparatus which exposes a substrate to radiant energy includes a unit which holds a first mask having a pattern which includes a pattern of a target mark, a unit which projects a pattern of radiant energy to the substrate through the first mask, a unit which holds a second mask having an auxiliary pattern for identifying the target mark to be formed on the substrate, and a unit which controls the projecting unit so as to project a pattern of radiant energy to the substrate through the second mask.

Abstract translation: 将衬底暴露于辐射能的装置包括保持具有包括目标标记图案的图案的第一掩模的单元，通过第一掩模将辐射能模式投射到衬底的单元，保持 具有用于识别要在基板上形成的目标标记的辅助图案的第二掩模，以及控制投影单元以通过第二掩模将辐射能图案投射到基板的单元。

公开(公告)号：US06960776B2

公开(公告)日：2005-11-01

申请号：US10000206

申请日：2001-11-02

Applicant: Nicolo F. Machi

Inventor： Nicolo F. Machi

IPC: B64D47/02 ,  F21V5/04 ,  F21V29/00 ,  H01L33/48 ,  H01L33/58 ,  H01L33/64 ,  G01J1/00

CPC classification number: F21V5/048 ,  B64D47/02 ,  F21V29/00 ,  F21Y2115/10 ,  H01L33/483 ,  H01L33/58 ,  H01L33/645

Abstract: The present invention is directed to an infrared light assembly (10, 30, 80, 90). A preferred embodiment of the light assembly (10, 30, 80, 90) may be used on aircraft or other vehicles for landing, taxi mode, or search operations. The light assembly (10, 30, 80, 90) preferably only requires about 10 to 20 watts of power. The light assembly (10, 30, 80, 90) may include a housing (12, 32, 82), a base (14, 34, 50), an IR diode (16, 36, 60), and an aspheric lens (18, 38). The base (14, 34, 50) is preferably connected to the bottom portion (22) of the housing(12, 32, 82), and the aspheric lens (18, 38) is preferably connected to the top portion (24) of the housing (12, 32, 82). The IR diode (16, 36, 60) may be mounted on the base (14, 34, 50). The housing (12, 32, 82) and the base (14, 34, 50) preferably have high thermal conductivity, and they preferably act as heat sinks. In addition, a plurality of thermal electric coolers (20, 40, 70) may be positioned between the base (14, 34, 50) and the IR diode (16, 36, 60) for additional dissipation of the heat generated by the light assembly. The IR diode (16, 36, 60) is adapted to emit infrared light. The light assembly (10, 30, 80, 90) preferably maintains a substantially constant operating temperature so that the peak emission of the IR diode (16, 36, 60) is substantially maintained. The infrared light may radiate through the hollow of the housing(12, 32, 82) to the aspheric lens (18, 38). The aspheric lens (18, 38) is preferably adapted to collimate infrared light. As a result, the light assembly (10, 30, 80, 90) may provide a collimated beam of infrared light having a NVIS radiant intensity greater than about 2.

Abstract translation: 本发明涉及一种红外灯组件（10,30,80,90）。 灯组件（10,30,80,90）的优选实施例可以用于飞机或其他车辆用于着陆，出租车模式或搜索操作。 光组件（10,30,80,90）优选仅需要约10至20瓦的功率。 灯组件（10,30,80,90）可包括壳体（12,32,32），基座（14,34,50），IR二极管（16,36,60）和非球面透镜 18，38）。 基部（14,34,50）优选地连接到壳体（12,32,82）的底部（22），并且非球面透镜（18,38）优选地连接到顶部（24,32）的顶部 壳体（12,32,82）。 IR二极管（16,36,60）可以安装在基座（14,34,50）上。 壳体（12,32,82）和基座（14,34,50）优选地具有高导热性，并且它们优选地用作散热器。 此外，多个热电冷却器（20,40,70）可以位于基座（14,34,50）和IR二极管（16,36,60）之间，用于额外耗散由光产生的热量 部件。 IR二极管（16,36,60）适于发射红外光。 光组件（10,30,80,90）优选地保持基本上恒定的工作温度，使得IR二极管（16,36,60）的峰值发射被基本保持。 红外光可以通过壳体（12,32,82）的中空辐射到非球面透镜（18,38）。 非球面透镜（18,38）优选地适于准直红外光。 结果，灯组件（10,30,80,90）可以提供具有大于约2的NVIS辐射强度的准直的红外光束。

公开(公告)号：US20050224691A1

公开(公告)日：2005-10-13

申请号：US10514287

申请日：2003-04-22

Applicant: Anton Van Arendonk ,  Nicolaas Van Veen

Inventor： Anton Van Arendonk ,  Nicolaas Van Veen

IPC: H04N5/225 ,  G01J1/00

CPC classification number: H04N5/2256 ,  H04N5/2253

Abstract: The present invention relates to a sensor device for sensing an image of an object, wherein a detection means (14) for detecting radiation received from the object is supported by a light-emitting semiconductor means (12) for emitting radiation towards said object during a predetermined operation period of the detection means (14). The detection means (14) can be operated even at low light intensity conditions and at a low power consumption. The detection means (14) may be a two-side illuminated detection means, wherein one side is supported by the light-emitting semiconductor means (12) and the other side is a back-etched side with increased sensitivity. A cheap and very small multi-purpose camera or sensor module can thereby be provided.

Abstract translation: 本发明涉及用于感测物体的图像的传感器装置，其中用于检测从物体接收的辐射的检测装置（14）由发光半导体装置（12）支持，用于在 检测装置（14）的预定操作周期。 检测装置（14）即使在低光强条件下也能够以低功耗工作。 检测装置（14）可以是双侧照明检测装置，其中一侧由发光半导体装置（12）支撑，另一侧是具有增加的灵敏度的背面蚀刻侧。 由此可以提供便宜且非常小的多用途照相机或传感器模块。

公开(公告)号：US06952015B2

公开(公告)日：2005-10-04

申请号：US10202910

申请日：2002-07-26

Applicant: Toshio Kameshima

Inventor： Toshio Kameshima

IPC: G01J1/00 ,  G01T1/175 ,  G01T1/20 ,  G01T1/24 ,  H01L27/14 ,  H01L27/146 ,  H01L31/101 ,  H04N5/32 ,  H04N5/335 ,  H04N5/357 ,  H04N5/374

CPC classification number: H04N5/3577 ,  G01T1/2018 ,  G01T1/24 ,  H01L27/14609 ,  H01L27/14676 ,  H04N5/32 ,  H04N5/3658 ,  H04N5/374 ,  H04N5/3765 ,  H04N5/378

Abstract: An image pick-up apparatus and an image pick-up system constructed to prevent occurrence of random noise in a photographed image due to a random noise component produced in a reference supply circuit. An image pick-up apparatus has an area sensor driven by matrix driving, and a reference supply circuit for supplying a reference voltage for driving of the area sensor, and the reference voltage is supplied through a low-pass filter (LPF) coupled to the reference supply circuit. Further, a cutoff frequency of the low-pass filter preferably is determined so that an effective value of noise of the reference voltage having passed through the low-pass filter becomes not more than one-tenth of an effective value of random noise produced in pixels of the area sensor.

Abstract translation: 一种图像拾取装置和图像拾取系统，其被构造为防止由于在参考供应电路中产生的随机噪声分量而在拍摄图像中发生随机噪声。 图像拾取装置具有由矩阵驱动驱动的区域传感器和用于提供用于驱动区域传感器的参考电压的参考电源电路，并且通过耦合到所述区域传感器的低通滤波器（LPF）提供参考电压。 参考电源电路。 此外，优选地确定低通滤波器的截止频率，使得已经通过低通滤波器的参考电压的噪声的有效值不超过以像素产生的随机噪声的有效值的十分之一 的区域传感器。

公开(公告)号：US20050206879A1

公开(公告)日：2005-09-22

申请号：US11014062

申请日：2004-12-17

Applicant: Remco Van Dijk ,  Donis Flagello ,  Michel Klaassen ,  Tammo Uitterdijk

Inventor： Remco Van Dijk ,  Donis Flagello ,  Michel Klaassen ,  Tammo Uitterdijk

IPC: G01M11/00 ,  G01J1/00 ,  G01J4/04 ,  G03F1/14 ,  G03F7/20 ,  H01L21/027

CPC classification number: G03F7/70566 ,  G01J4/04 ,  G03F1/44 ,  G03F7/70125 ,  G03F7/70133 ,  G03F7/70591

Abstract: A method for determining a polarization state of light passed through the projection lens of a lithographic apparatus is described. Polarizing structures are disposed on an object side of the projection lens of the lithographic apparatus. By measuring light that has passed through the polarizing structures information regarding the polarization characteristics of the projection lens can be determined.

Abstract translation: 描述了一种用于确定通过光刻设备的投影透镜的光的偏振状态的方法。 极化结构设置在光刻设备的投影透镜的物体侧。 通过测量已经通过偏振结构的光，可以确定关于投影透镜的偏振特性的信息。

公开(公告)号：US06946858B2

公开(公告)日：2005-09-20

申请号：US10627923

申请日：2003-07-28

Applicant: Jinsho Matsuyama

Inventor： Jinsho Matsuyama

IPC: G01J1/00 ,  G01M11/00 ,  G01R31/00 ,  G01R31/26 ,  H01J40/14 ,  H01L31/04 ,  H01M14/00

CPC classification number: G01R31/2603 ,  H02S50/10

Abstract: A measuring method for measuring current-voltage characteristics of a photoelectric conversion device by irradiating light to said photoelectric conversion device and a reference device corresponding to said photoelectric conversion device at the same time while detecting an irradiance of said light using said reference device, characterized in that a light responsive time constant of a irradiance detection circuit in which said reference device is used is adjusted so that said light responsive time constant of said irradiance detection circuit comes closer to a light responsive time constant of said photoelectric conversion device. An apparatus for practicing said measuring method.

Abstract translation: 一种测量方法，用于通过在使用所述参考装置检测所述光的辐照度的同时同时向所述光电转换装置照射光并对应于所述光电转换装置的参考装置来测量光电转换装置的电流 - 电压特性，其特征在于， 调整使用所述参考装置的辐照度检测电路的光响应时间常数，使得所述辐照度检测电路的所述光响应时间常数更接近所述光电转换装置的光响应时间常数。 一种用于实施所述测量方法的装置。

公开(公告)号：US20050199816A1

公开(公告)日：2005-09-15

申请号：US11102704

申请日：2005-04-11

Applicant: Kensuke Amemiya ,  Yuuichirou Ueno ,  Hiroshi Kitaguchi ,  Osamu Yokomizo ,  Shinichi Kojima ,  Katsutoshi Tsuchiya ,  Norihito Yanagita ,  Kazuma Yokoi

Inventor： Kensuke Amemiya ,  Yuuichirou Ueno ,  Hiroshi Kitaguchi ,  Osamu Yokomizo ,  Shinichi Kojima ,  Katsutoshi Tsuchiya ,  Norihito Yanagita ,  Kazuma Yokoi

IPC: G01T1/24 ,  G01J1/00 ,  G01T1/161 ,  G01T1/164 ,  G01T1/166 ,  G01T1/29 ,  H01L27/14 ,  H01L31/09

CPC classification number: G01T1/2928 ,  G01T1/2985

Abstract: Each semiconductor radiation detector used for a nuclear medicine diagnostic apparatus (PET apparatus) is constructed with an anode electrode A facing a cathode electrode C sandwiching a CdTe semiconductor member S which generates charge through interaction with γ-rays. Then, a thickness t of the semiconductor member S sandwiched between these mutually facing anode electrode A and cathode electrode C is set to 0.2 to 2 mm. Furthermore, the devices are mounted (laid out) on substrates in such a way that the distance (distance of conductor) between the semiconductor radiation detector and an analog ASIC which processes the signal detected by this detector is shortened. Furthermore, the substrates on which the detectors are mounted are housed in a housing as a unit (detector unit).

公开(公告)号：US20050178970A1

公开(公告)日：2005-08-18

申请号：US11102810

申请日：2005-04-11

Applicant: Kensuke Amemiya ,  Yuuichirou Ueno ,  Hiroshi Kitaguchi ,  Osamu Yokomizo ,  Shinichi Kojima ,  Katsutoshi Tsuchiya ,  Norihito Yanagita ,  Kazuma Yokoi

Inventor： Kensuke Amemiya ,  Yuuichirou Ueno ,  Hiroshi Kitaguchi ,  Osamu Yokomizo ,  Shinichi Kojima ,  Katsutoshi Tsuchiya ,  Norihito Yanagita ,  Kazuma Yokoi

IPC: G01T1/24 ,  G01J1/00 ,  G01T1/161 ,  G01T1/164 ,  G01T1/166 ,  G01T1/29 ,  H01L27/14 ,  H01L31/09

CPC classification number: G01T1/2928 ,  G01T1/2985

Abstract: Each semiconductor radiation detector used for a nuclear medicine diagnostic apparatus (PET apparatus) is constructed with an anode electrode A facing a cathode electrode C sandwiching a CdTe semiconductor member S which generates charge through interaction with γ-rays. Then, a thickness t of the semiconductor member S sandwiched between these mutually facing anode electrode A and cathode electrode C is set to 0.2 to 2 mm. Furthermore, the devices are mounted (laid out) on substrates in such a way that the distance (distance of conductor) between the semiconductor radiation detector and an analog ASIC which processes the signal detected by this detector is shortened. Furthermore, the substrates on which the detectors are mounted are housed in a housing as a unit (detector unit).

公开(公告)号：US20050173644A1

公开(公告)日：2005-08-11

申请号：US10500951

申请日：2001-06-29

Applicant: Peter Gnauck ,  Volker Drexel ,  Erik Essers

Inventor： Peter Gnauck ,  Volker Drexel ,  Erik Essers

IPC: H01J37/18 ,  H01J37/244 ,  H01J37/28 ,  G01J1/00

CPC classification number: H01J37/244

Abstract: A detector for scanning electron microscopes, which can be used under different pressure conditions in the specimen chamber of the electron microscope, designed for the detection of both electrons and light. For this purpose, the detector has a photodetector and a scintillator of a material transmissive for visible light connected before the photodetector. The scintillator can be provided with a coating transparent to visible light. By the application of different potentials, the detector is suitable for the detection of electrons in high vacuum and for the detection of light with high pressures in the specimen chamber.

Abstract translation: 用于扫描电子显微镜的检测器，其可以在电子显微镜的样品室中在不同压力条件下使用，被设计用于检测电子和光。 为此目的，检测器具有光电检测器和用于在光电检测器之前连接的可见光透射的材料的闪烁体。 闪烁体可以具有对可见光透明的涂层。 通过应用不同的电位，检测器适用于检测高真空中的电子和检测样品室中高压的光。