Abstract:
An optical coherence tomographic imaging apparatus for splitting light emitted from a light source into reference light and signal light and creating an optical coherence tomographic image and tomographic spectral information in a predetermined spectral analyzing portion in the optical coherence tomographic image based on optical interference signal information of the reference light and the signal light which are incident on an inspection target and reflected on respective layers, the optical coherence tomographic imaging apparatus including a spectral information processing unit for performing a spectral information calculation using an optical interference signal of a deeper region and creating the tomographic spectral information of the spectral analyzing portion. With this arrangement, spectral information corresponding to the optical coherence tomographic image can be output with high wavelength accuracy.
Abstract:
In some embodiments, the pathlength difference (retardation) in a step scanning infrared (IR) spectrometer interferometer is maintained under AC servomechanism (servo) control for a first period following a step change, and under DC servo control for a second period following the first period. Data is acquired during and/or after the DC servo control period. Switching off the AC servo control prior to data acquisition allows limiting the dither-frequency noise that could otherwise affect signals of interest, particularly in fast-time-scale applications such as high-speed time-resolved spectroscopy (TSR). A mirror position control circuit controls a mirror position stepping as well as switching a mirror servo control from AC to DC.
Abstract:
A system for measuring a property of a sample includes an actuation device disposed on a substrate and includes a flexible surface spaced apart from the substrate and configured so as to allow placement of the sample thereupon. The actuation device also includes a vertical actuator that is configured to cause the flexible surface to achieve a predetermined displacement from the substrate when a corresponding potential is applied thereto. A sensing probe is disposed so as to be configured to interact with the sample thereby sensing the property of the sample.
Abstract:
A method for reducing noise in a multi-aperture imaging system is provided. Each sub-collector of the system, at least one of which has an adjustable optical path length, collects a portion of a wavefront. The adjustable optical path length is varied to each of a set of predetermined lengths to generate interference patterns. Each interference pattern is recorded at an image plane of the system to generate a recorded interference pattern made up of pixels. Pixel intensity data sets are generated, each of which includes a pixel intensity level from a corresponding one of the pixels from each recorded interference pattern. Each pixel intensity data set is Fourier transformed, and in each Fourier transformed data set, spatial frequencies having power values above a predetermined level are identified. The power levels exceeding the threshold are measured and a resultant image is constructed, where each image pixel thereof corresponds to one pixel intensity data set and has one or more intensity values corresponding to the measured power values for that corresponding pixel intensity data set.
Abstract:
An angular displacement of an object is measured interferometrically by splitting a laser beam into a reference beam and a measuring beam. The reference beam is directed at a stationary reference retroreflector and then a phase shift detector. The measuring beam is directed at a rotatable reflective surface of the object and then a stationary measuring retroreflector and then back to the rotatable reflective surface and then to the phase shift detector such that the phase shift detector measures an angular displacement of the rotatable reflective surface when the length of the path of the measuring beam changes when the rotatable reflective surface is displaced.
Abstract:
A MEMS-based Fourier Transform (FT) spectrometer is provided. According to an embodiment, the MEMS-based FT spectrometer is an FT infrared (FTIR) spectrometer. The FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a fixed mirror positioned to receive the first sub-beam from the beam splitter, a scanning MEMS mirror positioned to receive the second sub-beam from the beam splitter, and a photodetector, wherein a reflected first sub-beam from the fixed mirror and a reflected second sub-beam from the scanning MEMS mirror recombine at the beam splitter and become directed to the photodetector. According to one embodiment, the photodetector is a MEMS-based IR detector. In addition, the MEMS-based IR detector can be an un-cooled IR detector having a capacitive sensing structure.
Abstract:
Apparatus and method for increasing the sensitivity in the detection of optical coherence tomography and low coherence interferometry (“LCI”) signals by detecting a parallel set of spectral bands, each band being a unique combination of optical frequencies. The LCI broad bandwidth source is split into N spectral bands. The N spectral bands are individually detected and processed to provide an increase in the signal-to-noise ratio by a factor of N. Each spectral band is detected by a separate photo detector and amplified. For each spectral band the signal is band pass filtered around the signal band by analog electronics and digitized, or, alternatively, the signal may be digitized and band pass filtered in software. As a consequence, the shot noise contribution to the signal is reduced by a factor equal to the number of spectral bands. The signal remains the same. The reduction of the shot noise increases the dynamic range and sensitivity of the system.
Abstract:
Sinusoidal in-phase and in-quadrature signals at a given spatial frequency are combined with the irradiance signals generating a correlogram of interest and integrated over the length of the correlogram data-acquisition scan. The integration outputs are then used to calculate the amplitude and the phase of the correlogram signal at the selected spatial frequency, thereby producing targeted spectral information. The signal generator used to generate the in-phase and in-quadrature sinusoidal signals may be scanned advantageously through any desired range of spatial frequencies, thereby producing corresponding amplitude and phase spectral information for the correlogram. Because the procedure produces spectral information independently of the number of data frames acquired during the interferometric scan, it is materially more rapid than conventional FFT analysis.
Abstract:
Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam.
Abstract:
Improved calibration of a dual-etalon frequency monitor having x-y outputs is provided. An ellipse is fit to the (x,y) points from a set of calibration data. For each (x,y) point, an angle θ is determined. A linear fit of frequency to θ is provided. Differences between this linear fit and the determined values of θ are accounted for by including a spline fit to this difference in the calibration.