公开(公告)号：US20100165343A1

公开(公告)日：2010-07-01

申请号：US12663485

申请日：2009-02-17

Applicant: Kazuhiko Takeda

Inventor： Kazuhiko Takeda

IPC: G01B11/14 ,  G01J4/00

CPC classification number: B41F33/0081 ,  B41P2233/52

Abstract: A register mark detecting apparatus detects a transparent register mark printed on a conveyed transparent web. The register mark detecting apparatus includes a light source, a parallel light flux irradiation optical system, a collective optical system, a knife-edge, and a light receiving element. The parallel light flux irradiation optical system converts a light flux from the light source into a parallel light flux to irradiate a transparent web with the parallel light flux. The collective optical system collects the light flux transmitted through the transparent web. The knife-edge is disposed near a back focus of the collective optical system. The knife-edge interrupts the light flux going straight in the transparent web and causes only the light flux refracted by being transmitted through the transparent register mark to pass by. The light receiving element receives the light flux transmitted through the knife-edge.

Abstract translation: 对准标记检测装置检测打印在所传送的透明幅材上的透明对准标记。 对准标记检测装置包括光源，平行光束照射光学系统，集体光学系统，刀刃和光接收元件。 平行光束照射光学系统将来自光源的光束转换为平行光束，以使平行光束照射透明幅材。 集体光学系统收集透过透明网的光通量。 刀刃设置在集体光学系统的后焦点附近。 刀刃中断在透明纤维网中直线的光通量，并且仅使透过透明对准标记的光束折射通过。 光接收元件接收透过刀刃的光束。

公开(公告)号：US07742169B2

公开(公告)日：2010-06-22

申请号：US11822294

申请日：2007-07-03

Applicant: Masato Morita

Inventor： Masato Morita

IPC: G01J4/00

CPC classification number: G01J4/04 ,  G02B27/26 ,  G02B27/286 ,  H04N3/08 ,  H04N13/337 ,  H04N13/363

Abstract: A polarizing device including a plurality of polarized light radiating units for radiating polarized light rays each of which is polarized in a particular direction, a rotary reflector for receiving light rays emitted by the plurality of polarized light radiating units while being rotated and for outputting reflected light in a certain direction, and an analyzer disposed midway an optical path of the reflected light from the rotary reflector to set a polarization direction of the reflected light in a certain direction, wherein each of the polarized light radiating units includes a light source, a polarizer for setting a polarization direction of light from the light source, and a first compensator for compensating for a change in a state of polarization attributable to the rotary reflector, and the plurality of polarized light radiating units are disposed in a radial arrangement that is centered at the rotary reflector.

Abstract translation: 一种偏振装置，包括：多个偏振光发射单元，用于照射各向异性偏振的偏振光;旋转反射镜，用于接收由多个偏振光发射单元发射的光，同时旋转并输出反射光 以及分析器，其设置在来自旋转反射器的反射光的光路的中间，以将反射光的偏振方向设定在一定方向，其中每个偏振光辐射单元包括光源，偏振器 用于设置来自光源的光的偏振方向，以及第一补偿器，用于补偿归因于旋转反射器的偏振状态的变化，并且多个偏振光辐射单元以径向布置设置，其以 旋转反射器。

公开(公告)号：US20100113941A1

公开(公告)日：2010-05-06

申请号：US12527727

申请日：2008-02-18

Applicant: Bernardus H.W. Hendriks ,  Antonius T.M. Van Gogh ,  Hans Zou

Inventor： Bernardus H.W. Hendriks ,  Antonius T.M. Van Gogh ,  Hans Zou

IPC: A61B6/00 ,  G01J3/447 ,  G01J4/00 ,  G01N21/47

CPC classification number: A61B5/0084 ,  A61B5/0075 ,  A61B5/444 ,  A61B2562/0242 ,  G01N21/4795 ,  G01N2021/4792

Abstract: The present invention relates to an optical device for assessing optical depth (D) in a sample (100) illuminated by polarized radiation (20) from a source (10). A first and a second radiation guide have their end portions (3Oa′, 30b′) arranged for capturing reflected radiation (25a, 25b) from the sample. A detector (40) measures a first polarization (P1) and a second polarization (P—2) of the reflected radiation (25), and a first and a second intensity (II, 12) of the reflected radiation (25a, 25b) in the first (30a) and the second (30b) radiation guide, respectively. Processing means (60) then calculates a first (f) and a second (g) spectral function, both spectral functions (f, g) being indicative of single scattering events in the sample. The processing means (60) is further arranged to calculate a measure of the correlation (C) between the first (f) and a second (g) spectral function so as to assess whether the single scattering events originate from substantially the same optical depth (D) within the sample. Thus, the causal relation between the first and second spectral functions can be used for assessing whether the single scattering events giving rise to the two spectral functions come from substantially the same optical depth (D) within the sample. The invention is particular advantageous for optically probing an epithelial layer of a patient.

Abstract translation: 本发明涉及一种用于评估从源极（10）被偏振辐射（20）照射的样品（100）中的光学深度（D）的光学装置。 第一和第二辐射引导件具有其端部（30a'，30b'），用于从样品捕获反射辐射（25a，25b）。 检测器（40）测量反射辐射（25）的第一偏振（P1）和第二偏振（P-2），以及反射辐射（25a，25b）的第一和第二强度（II，12） 分别在第一（30a）和第二（30b）辐射导向件中。 处理装置（60）然后计算第一（f）和第二（g）光谱函数，两个光谱函数（f，g）指示样本中的单个散射事件。 处理装置（60）还被布置成计算第一（f）和第二（g）光谱函数之间的相关性（C）的度量，以便评估单个散射事件是否源于基本上相同的光学深度（ D）样品内。 因此，第一和第二光谱函数之间的因果关系可用于评估引起两个光谱函数的单个散射事件是否来自样本内的基本相同的光学深度（D）。 本发明特别有利于光学检测患者的上皮层。

公开(公告)号：US20100110420A1

公开(公告)日：2010-05-06

申请号：US12604052

申请日：2009-10-22

Applicant: Neil Judell ,  Ian Thomas Kohl ,  Songping Gao ,  Richard Earl Bills

Inventor： Neil Judell ,  Ian Thomas Kohl ,  Songping Gao ,  Richard Earl Bills

IPC: G01N21/88 ,  G01J4/00

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable polarization a polarizing relay assembly arranged to selectively permit the scattered light having a selected polarization orientation to pass along a detector optical axis to a light detection unit in the detection subsystem. They system also features a collector output width varying subsystem for varying the width of an output slit in response to changes in the location of the location scanned on the workpiece.

Abstract translation: 提供了表面检查系统，以及相关的部件和方法。 表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。 该系统具有可变极化，偏振继电器组件被布置成选择性地允许具有选定的偏振取向的散射光沿着检测器光轴传递到检测子系统中的光检测单元。 它们还具有收集器输出宽度变化子系统，用于响应于在工件上扫描的位置的位置的变化来改变输出狭缝的宽度。

公开(公告)号：US20100103421A1

公开(公告)日：2010-04-29

申请号：US12447825

申请日：2007-10-29

Applicant: Knut Johansen ,  Mats Ränby

Inventor： Knut Johansen ,  Mats Ränby

IPC: G01N21/55 ,  G01J4/00

CPC classification number: G01N21/553 ,  G01N21/03 ,  G01N2021/0307 ,  G01N2021/0346

Abstract: The invention relates to a sensor unit for a Surface Plasmon Resonance (SPR) unit, comprising a transparent sensor structure forming at least one wall of a cavity, the wall being defined by a concave inner surface and a convex outer surface The inner surface is provided with a layer of a conductive material capable of supporting a surface plasmon. In the cavity there is provided a flow structure in said cavity so as to form at least one compartment for sample between the flow structure and the inner wall of the cavity. Also, a method for the detection of events at a surface by utilizing surface plasmon resonance is provided. It comprises placing a sample with an analyte of interest in a sensor unit as claimed in claim 1, and measuring the reflectance from said sensor unit at a single or plurality of angle/angles.

Abstract translation: 本发明涉及一种用于表面等离子体共振（SPR）单元的传感器单元，其包括形成空腔的至少一个壁的透明传感器结构，该壁由凹内表面和凸形外表面限定。内表面设置 具有能够支撑表面等离子体激元的导电材料层。 在空腔中，在所述空腔中设置有流动结构，以便在流动结构和空腔的内壁之间形成用于样品的至少一个隔室。 另外，提供了利用表面等离子共振来检测表面的事件的方法。 其包括将具有感兴趣的分析物的样品放置在如权利要求1所述的传感器单元中，并且以单个或多个角度/角度测量来自所述传感器单元的反射率。

公开(公告)号：US20100103417A1

公开(公告)日：2010-04-29

申请号：US12225384

申请日：2007-03-16

Applicant: Yukitoshi Otani ,  Mizue Ebisawa

Inventor： Yukitoshi Otani ,  Mizue Ebisawa

IPC: G01J4/00

CPC classification number: G01N21/21 ,  G01J4/04 ,  G01N21/23

Abstract: An optical characteristic measuring device includes: an optical system (10), a light intensity information acquisition unit (40) for acquiring light intensity information on the light to be measured, and an operation process unit (60). The optical system (10) introduces the light emitted from a light source (12) to a sample (100) via a polarizer (22), a ½ wavelength plate (24), and a first ¼ wavelength plate (26), and introduces the light emitted from the sample (100) to a reception unit (14) via a second ¼ wavelength plate (34) and a detector (36). The ½ wavelength plate (24), the first and the second ¼ wavelength plate (26, 34) and the detector (36) are configured so as to be rotated. The light intensity information

Abstract translation: 一种光学特性测量装置，包括：光学系统（10），用于获取关于待测光的光强度信息的光强度信息获取单元（40），以及操作处理单元（60）。 光学系统（10）通过偏振器（22），1/2波长板（24）和第一¼波长板（26）将从光源（12）发射的光引入样品（100），并引入 经由第二波长板（34）和检测器（36）从样品（100）发射到接收单元（14）的光。 1/2波长板（24），第一和第二波长板（26,34）和检测器（36）构造成旋转。 光强信息

公开(公告)号：US07705985B2

公开(公告)日：2010-04-27

申请号：US10586842

申请日：2005-01-20

Applicant: Stuart Lucas ,  Stuart Gordon ,  Nicole Phair-Sorensen

Inventor： Stuart Lucas ,  Stuart Gordon ,  Nicole Phair-Sorensen

IPC: G01J4/00

CPC classification number: G01N33/362 ,  G01N21/21

Abstract: The present disclosure relates to a method for measuring the maturity or cell wall thickening of a sample of cellulosic fiber. The method at least includes exposing the sample of fiber to polarized light, capturing one or more images of the sample through crossed polar lenses and a compensator plate so that the image(s) include interference colors from the sample; and conducting computer analysis on the captured image(s) to determine the maturity or degree of cell wall thickening of the cellulosic fiber by comparing the image(s) to reference color interference data.

Abstract translation: 本公开涉及一种测量纤维素纤维样品的成熟度或细胞壁增厚的方法。 该方法至少包括将光纤样本暴露于偏振光，通过交叉极化透镜和补偿板捕获样品的一个或多个图像，使得图像包括来自样品的干涉色; 并对所捕获的图像进行计算机分析，以通过将图像与参考颜色干扰数据进行比较来确定纤维素纤维的细胞壁增厚的成熟度或程度。

公开(公告)号：US20100091281A1

公开(公告)日：2010-04-15

申请号：US12597016

申请日：2008-02-12

Applicant: Masahiko Suzuki

Inventor： Masahiko Suzuki

IPC: G01J4/00 ,  H01L21/677

CPC classification number: G01B11/028 ,  G02F1/1303

Abstract: An apparatus for detecting an edge of a transparent substrate includes a light source provided on a rear side of the edge of the transparent substrate, a first polarizer provided between the transparent substrate and the light source and arranged to convert light from the light source to linearly polarized light, a light receiving unit provided on a front side of the edge of the transparent substrate, and a second polarizer provided between the transparent substrate and the light receiving unit, and having a polarization axis that is perpendicular or substantially perpendicular to a polarization axis of the first polarizer. The light receiving unit is configured to observe, through the second polarizer, the linearly polarized light that is converted by the first polarizer and is transmitted through the edge of the transparent substrate, the linearly polarized light that is converted by the first polarizer and passes outside the transparent substrate, and emitted light that is converted by the first polarizer, and is propagated through inside of the transparent substrate and emitted from a side surface of the edge of the transparent substrate.

Abstract translation: 用于检测透明基板的边缘的装置包括设置在透明基板的边缘的后侧的光源，设置在透明基板和光源之间的第一偏振器，并且布置成将来自光源的光线转换成线性 偏振光，设置在透明基板的边缘的前侧的光接收单元，以及设置在透明基板和光接收单元之间的第二偏振器，并且具有垂直于或基本垂直于偏振轴的偏振轴 的第一偏振器。 光接收单元被配置为通过第二偏振器观察由第一偏振器转换并通过透明基板的边缘的线偏振光，由第一偏振器转换并通过外部的线偏振光 透明基板和由第一偏振片转换的发射光，并且通过透明基板的内部传播并从透明基板的边缘的侧面发射。

公开(公告)号：US07697139B2

公开(公告)日：2010-04-13

申请号：US12289077

申请日：2008-10-20

Applicant: Kazuhiko Fukazawa ,  Takeo Oomori

Inventor： Kazuhiko Fukazawa ,  Takeo Oomori

IPC: G01J4/00

CPC classification number: G01B11/25 ,  G01N21/21 ,  G01N21/95684

Abstract: A surface inspection apparatus includes units illuminating repetitive patterns formed on a surface of a suspected substance and measuring a variation in an intensity of regular reflection light caused by a change in shapes of the repetitive patterns, units illuminating the repetitive patterns with linearly polarized light, setting an angle formed between a repetitive direction of the repetitive patterns and a direction of a plane of vibration of the linearly polarized light at a tilt angle, and measuring a variation in a polarized state of the regular reflection light caused by the change in the shapes of the repetitive patterns, and a unit detecting a defect of the repetitive patterns based on the variation in the intensity and the variation in the polarized state of the regular reflection light.

Abstract translation: 表面检查装置包括照射形成在可疑物质的表面上的重复图案的单元，并且测量由重复图案的形状变化引起的常规反射光的强度变化，用线性偏振光照射重复图案的单元，设定 在重复图案的重复方向和倾斜角度的线偏振光的振动平面的方向之间形成的角度，以及测量由形状变化引起的正反射光的偏振状态的变化 重复图案，以及基于正射反射光的极化状态的强度和偏差的变化来检测重复图案的缺陷的单元。

公开(公告)号：US07697123B2

公开(公告)日：2010-04-13

申请号：US12087294

申请日：2006-12-15

Applicant: Daniel Hui Bon Hoa ,  Paulette Gavignet ,  Christian Dourthe

Inventor： Daniel Hui Bon Hoa ,  Paulette Gavignet ,  Christian Dourthe

IPC: G01N21/00 ,  G01J4/00

CPC classification number: G01M11/333 ,  G01M11/332 ,  G01M11/336

Abstract: Apparatus for measuring the differential group delay τ1 in an optical fiber connection. The apparatus comprises at the inlet to said connection, a generator (10) for generating a binary signal sequence at a data rate D and a first polarization controller (30) suitable for subjecting the binary signal of an incoming sequence to a first scan through polarization states; and at the outlet from the connection, a second polarization controller (60) suitable for subjecting the signal resulting from the outgoing sequence to a second scan through polarization states, independently of said first polarization scan, a differential group delay emulator (70) suitable for introducing a variable additional group delay τ2, and an analyzer device (90) suitable for detecting the equality τ1+τ2=1/D in the resulting signal sequence.

Abstract translation: 用于测量光纤连接中的差分组延迟τ1的装置。 所述装置包括在所述连接的入口处，用于产生数据速率D的二进制信号序列的发生器（10）和适于使输入序列的二进制信号经受偏振的第一扫描的第一偏振控制器（30） 状态; 并且在所述连接的出口处，适于经由所述输出序列产生的信号经由偏振状态进行第二扫描的第二偏振控制器（60），所述第二偏振控制器与所述第一偏振扫描无关，所述差分组延迟仿真器（70）适于 引入可变附加组延迟τ2，以及适用于检测所得信号序列中的相等性τ1+τ2= 1 / D的分析装置（90）。