Abstract:
A method and system for real-time, in-line measurements of thicknesses of semiconductor layers of photovoltaic devices is provided. The method and system include taking ex-situ optical data measurements after deposition of the semiconductor layers. The measurements are then used to calculate the thicknesses of the layers in real-time using optical modeling software.
Abstract:
Disclosed are photovoltaic module mounting assemblies with mounting clamps for connecting multiple photovoltaic modules into a photovoltaic array. One embodiment of the mounting assembly includes mounting clamps that are positioned on the mounting assembly parallel to the scribe lines of the module. Another embodiment of the mounting assembly uses mounting clamps that are configured to hold a portion of the module at a predetermined distance away from the photovoltaic cells of the module.
Abstract:
Photovoltaic devices with a zinc oxide layer replacing all or part of at least one of a window layer and a buffer layer, and methods of making the devices.
Abstract:
A method and apparatus for forming a crystalline cadmium stannate layer of a photovoltaic device by heating an amorphous layer in the presence of hydrogen gas.
Abstract:
Described herein is a photovoltaic module and method of manufacturing a photovoltaic module to isolate potentially stress-damaged portions of cells from non-stress-damaged portions thereof. The module has a plurality of columnar photovoltaic cells, and at least one isolation scribe at a first edge of an active area of the photovoltaic module and extending across a photovoltaic cell in a direction perpendicular to a length of the columnar cells, where the at least one isolation scribe is deep enough to electrically isolate portions of the photovoltaic cell on opposite sides of the at least one isolation scribe.