公开(公告)号：US20150036128A1

公开(公告)日：2015-02-05

申请号：US14311362

申请日：2014-06-23

Applicant: Genesis Photonics Inc.

Inventor： Cheng-Pin Chen ,  Gwo-Jiun Sheu ,  Yun-Li Li

IPC: G01N21/01 ,  G01N21/95

CPC classification number: G01N21/6489 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9501 ,  G01N2021/646 ,  G01N2021/8819

Abstract: An inspection apparatus is capable of inspecting a light-emitting diode (LED). The inspection apparatus includes a reflecting cover, a base plate, a light-collecting unit and at least one inspection light source. An enclosed space is defined by the base plate and the reflecting cover having an opening. The LED is disposed on the base plate and located in the enclosed space. The light-collecting unit is disposed above the LED and in the enclosed space. A vertical distance from the light-collecting unit to the LED is H, a width of the opening of the reflecting cover is W, and H/W=0.05 to 10. The inspection light source is in the enclosed space. An inspection light emitted from the inspection light source is reflected by the reflecting cover and then emitted into the LED.A dominant wavelength of the inspection light source is smaller than that of the LED.

Abstract translation: 检查装置能够检查发光二极管（LED）。 检查装置包括反射盖，基板，聚光单元和至少一个检查光源。 封闭空间由基板和具有开口的反射盖限定。 LED设置在基板上并位于封闭空间中。 集光单元设置在LED的上方和封闭空间中。 从集光单元到LED的垂直距离为H，反射盖的开口宽度为W，H / W = 0.05〜10。检查光源位于封闭空间内。 从检查光源发出的检查光被反射罩反射，然后发射到LED中。 检测光源的主波长小于LED的主波长。