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公开(公告)号：US20150276640A1
公开(公告)日：2015-10-01
申请号：US14230114
申请日：2014-03-31
Applicant: Todd Mathew Spath
Inventor： Todd Mathew Spath
CPC classification number: G01N27/045 , B25J13/087 , G01B7/003 , G01N27/228 , H05K1/0268 , H05K3/4638 , Y10T29/53061
Abstract: A system for aligning a first and second pattern based on alignment structures is disclosed. The system comprises a first substrate including the first alignment structure. The alignment structure has a different magnitude of the electrical characteristic than the substrate. The system also includes an electrical probe and a controller for controlling the relative position of the probe with respect to the substrate to measure the electrical characteristic at a plurality of positions proximate the substrate. The measured electrical characteristics are used to identify the location of the alignment structure by identifying a difference between the measured electrical characteristic at pairs of the plurality of positions. A controller identifies the location of a second alignment structure formed on a second substrate. A registration mechanism aligns the two substrates using the identified locations of the first and second alignment structures.
Abstract translation: 公开了一种用于基于对准结构对准第一和第二图案的系统。 该系统包括包括第一对准结构的第一基板。 对准结构具有与衬底不同的电特性。 该系统还包括电探针和控制器，用于控制探针相对于基底的相对位置以测量靠近基底的多个位置的电特性。 测量的电特性用于通过识别所测量的多个位置对的电特性之间的差异来识别对准结构的位置。 控制器识别形成在第二基板上的第二对准结构的位置。 注册机构使用第一和第二对准结构的识别位置对准两个基板。
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公开(公告)号：US20150160414A1
公开(公告)日：2015-06-11
申请号：US14097812
申请日：2013-12-05
Applicant: Ronald Steven Cok , Todd Mathew Spath
Inventor： Ronald Steven Cok , Todd Mathew Spath
CPC classification number: G02B6/122 , G02B6/13 , G02B6/138 , G02B6/4214 , G02B6/4274 , G02B2006/121 , G02B2006/12104 , G02B2006/12126 , G02B2006/12147 , G06F3/044 , H01L21/76895 , H01L23/5386 , H01L31/12 , H01L31/18 , H01L2924/0002 , H05K1/0274 , H05K3/10 , H05K3/101 , H05K3/1258 , H05K3/32 , H05K2201/0108 , H05K2201/09036 , H05K2201/10356 , H05K2203/0108 , H01L2924/00
Abstract: A method of making an imprinted optical micro-channel structure for transmitting light to an optical receiver or receiving light from an optical transmitter includes forming a curable optical layer over a substrate and imprinting one or more optical micro-channels in the optical layer with a first stamp. The curable optical layer is cured to form a cured optical layer having the optical micro-channels imprinted in the cured optical layer. A curable light-transparent material is located in the optical micro-channels and cured to form light-pipes of cured light-transparent material in the optical micro-channels. The optical transmitter located in alignment with a light-pipe for transmitting light through the light-pipe or the optical receiver is located in alignment with a light-pipe for receiving light from the light-pipe.
Abstract translation: 一种制造用于将光传输到光接收器或从光发射器接收光的压印光学微通道结构的方法包括在衬底上形成可固化的光学层，并在第一个光学层中印刷一个或多个光学微通道 邮票。 固化光学层被固化以形成固化的光学层，该光学层具有印刷在固化的光学层中的光学微通道。 可光固化的透光材料位于光学微通道中并固化，以在光学微通道中形成固化的透光材料的光管。 与用于透过光管或光接收器透射光的光管对准的光发射器与用于接收来自光管的光的光管对准。
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公开(公告)号：US20140242525A1
公开(公告)日：2014-08-28
申请号：US13775549
申请日：2013-02-25
Applicant: Debasis Majumdar , Lawrence A. Rowley , Jayme Diniz Ribeiro , David Andrew Johnson , Todd Mathew Spath
Inventor： Debasis Majumdar , Lawrence A. Rowley , Jayme Diniz Ribeiro , David Andrew Johnson , Todd Mathew Spath
IPC: G03F7/16
CPC classification number: G03F7/16 , C08G61/126 , C08G2261/1424 , C08G2261/3223 , C08G2261/794 , C08L65/00 , G03F7/26 , G03F7/40 , G06F3/044 , G06F2203/04103 , H01L51/0015 , H01L51/0023 , H01L51/0037 , H05K3/0076 , H05K3/02 , H05K2201/0329 , H05K2203/1142 , C08L25/18
Abstract: A method of patterning a conductive polymer includes providing a conductive polymer layer coated over a first support followed by pattern-wise transferring a layer containing polyvinyl acetal from a second support onto the conductive polymer to form a mask with at least one opening. The masked conductive polymer is subjected to treatment through the opening that changes the conductivity of the conductive polymer by at least one order of magnitude in areas not covered by the mask.
Abstract translation: 图案化导电聚合物的方法包括提供涂覆在第一载体上的导电聚合物层，然后将含有聚乙烯醇缩醛的层从第二载体图案转移到导电聚合物上以形成具有至少一个开口的掩模。 掩模的导电聚合物通过开口进行处理，该开口将导电聚合物的导电性在掩模未覆盖的区域中改变至少一个数量级。
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Patent Agency Ranking
公开(公告)号：US09426885B2
公开(公告)日：2016-08-23
申请号：US14261465
申请日：2014-04-25
Applicant: Todd Mathew Spath , Ronald Steven Cok
Inventor： Todd Mathew Spath , Ronald Steven Cok
CPC classification number: H05K1/097 , G06F3/047 , G06F2203/04103 , G06F2203/04112 , H05K1/189 , H05K3/1258 , H05K3/247 , H05K2201/0108 , H05K2201/0329 , H05K2201/0338 , H05K2201/035 , H05K2201/0376 , H05K2201/09036 , H05K2203/0108 , H05K2203/1545
Abstract: A multi-layer micro-wire structure resistant to cracking including a substrate having a surface, one or more micro-channels formed in the substrate, an electrically conductive first material composition forming a first layer located in each micro-channel, and an electrically conductive second material composition having a greater tensile ductility than the first material composition forming a second layer located in each micro-channel, the first material composition and the second material composition in electrical contact to form an electrically conductive multi-layer micro-wire in each micro-channel, whereby the multi-layer micro-wire is resistant to cracking.
Abstract translation: 一种耐裂纹的多层微线结构，包括具有表面的基底，在基底中形成的一个或多个微通道，形成位于每个微通道中的第一层的导电第一材料组合物，以及导电 第二材料组合物具有比形成位于每个微通道中的第二层的第一材料组合物更大的拉伸延展性，第一材料组合物和第二材料组合物电接触以在每个微通道中形成导电多层微线 通道，由此多层微线耐开裂。
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公开(公告)号：US09274431B2
公开(公告)日：2016-03-01
申请号：US14230153
申请日：2014-03-31
Applicant: Gary Alan Kneezel , Todd Mathew Spath
Inventor： Gary Alan Kneezel , Todd Mathew Spath
IPC: G01R31/308 , G03F7/20
CPC classification number: G03F7/20 , G03F9/7053 , G03F9/7076
Abstract: A system for determining an alignment location associated with a pattern formed on a substrate is disclosed. Electrical measurements are made as the substrate is moved along an advancement direction. An alignment structure is formed on the substrate. The alignment structure has a first member extending along a first direction that is not parallel to the advancement direction and a second member extending along a second direction that is not parallel to either the advancement direction or to the first member. The first member and the second member are electrically conductive and substantially transparent. One or more probes are used to identify portions of the first and second members of the alignment structure and produce signals in response to relative motion between the substrate and the probes. A controller, responsive to signals produced by the probe, determines an alignment location associated with the pattern formed on the substrate.
Abstract translation: 公开了一种用于确定与形成在衬底上的图案相关联的对准位置的系统。 当基板沿着前进方向移动时进行电测量。 在基板上形成对准结构。 对准结构具有沿着与前进方向不平行的第一方向延伸的第一构件和沿着与前进方向不平行的第二方向延伸的第二构件或第一构件。 第一构件和第二构件是导电的并且基本上是透明的。 使用一个或多个探针来识别对准结构的第一和第二构件的部分并且响应于衬底和探针之间的相对运动而产生信号。 响应于由探针产生的信号的控制器确定与在衬底上形成的图案相关联的对准位置。
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公开(公告)号：US20150279748A1
公开(公告)日：2015-10-01
申请号：US14230107
申请日：2014-03-31
Applicant: Todd Mathew Spath
Inventor： Todd Mathew Spath
CPC classification number: G01N27/22 , G01N27/041 , H01L21/78 , H01L22/14 , H01L23/544 , H01L2223/5442 , H01L2223/54426 , H01L2223/54453 , H01L2924/0002 , H01L2924/00
Abstract: A method for aligning a second pattern to a first pattern based on a first alignment structure on a first substrate is disclosed. The alignment structure has a different magnitude of the electrical characteristic than the substrate. A controller controls the relative position of an electrical probe with respect to the substrate to measure the electrical characteristic corresponding at a plurality of positions proximate the substrate. The measured electrical characteristics are used to identify the location of the alignment structure by identifying a difference between the measured electrical characteristic at a pair of the plurality of positions exceeding a predetermined threshold. A second substrate having the second pattern including a second alignment structure formed thereon is aligned to the first substrate by a controller based on the identified locations of the first and second alignment structures.
Abstract translation: 公开了一种基于第一基板上的第一对准结构将第二图案与第一图案对准的方法。 对准结构具有与衬底不同的电特性。 控制器控制电探头相对于基板的相对位置，以测量在靠近基板的多个位置对应的电特性。 测量的电特性用于通过识别超过预定阈值的多个位置对的测量电特性之间的差异来识别对准结构的位置。 具有包括形成在其上的第二对准结构的第二图案的第二基板通过基于所识别的第一和第二对准结构的位置的控制器与第一基板对准。
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公开(公告)号：US20150276639A1
公开(公告)日：2015-10-01
申请号：US14230140
申请日：2014-03-31
Applicant: Todd Mathew Spath , Gary Alan Kneezel
Inventor： Todd Mathew Spath , Gary Alan Kneezel
CPC classification number: G01N27/041 , B41F13/025 , B41F33/0081 , B41J2002/14491 , G01N27/226 , G03F9/00
Abstract: A system for forming a second pattern in registration with a first pattern on a substrate is disclosed. The system comprises the substrate having a first magnitude of an associated electrical characteristic and at least one alignment structure. The alignment structure has a second magnitude of the electrical characteristic different from that of the substrate. An advancing mechanism is used for moving the substrate. A probe is used for measuring an electrical characteristic at a plurality of positions proximate the moving substrate. A controller is used for interpreting the measured electrical characteristic as a function of position for identifying a location of the alignment structure. A first patterning station is used for forming the second pattern on a surface of the substrate in registration with the first pattern based on the identified location of the alignment structure.
Abstract translation: 公开了一种用于形成与衬底上的第一图案对准的第二图案的系统。 该系统包括具有相关电特性的第一大小的基板和至少一个对准结构。 对准结构具有不同于衬底的电特性的第二幅度。 使用推进机构来移动基板。 探头用于测量靠近移动基板的多个位置处的电特性。 控制器用于将测量的电特性解释为用于识别对准结构的位置的位置的函数。 基于识别的对准结构的位置，使用第一图案化台来在基板的与第一图案对准的表面上形成第二图案。
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公开(公告)号：US08709194B1
公开(公告)日：2014-04-29
申请号：US13775582
申请日：2013-02-25
Applicant: Debasis Majumdar , Lawrence A. Rowley , Jayme Diniz Ribeiro , David Andrew Johnson , Todd Mathew Spath
Inventor： Debasis Majumdar , Lawrence A. Rowley , Jayme Diniz Ribeiro , David Andrew Johnson , Todd Mathew Spath
CPC classification number: G06F3/044 , B32B2457/208 , G06F3/0412 , G06F3/045
Abstract: A method of assembling an electronic device includes providing a transparent conductive polymer layer coated over a first support followed by pattern-wise forming a transparent mask with at least one opening over the conductive polymer. The masked conductive polymer is subjected to treatment through the opening that changes conductivity of the conductive polymer by at least one order of magnitude in areas not covered by the mask to form a first electronic component. The first electronic component having the mask is secured to a second electronic component, thereby forming the electronic device.
Abstract translation: 一种组装电子器件的方法包括提供涂覆在第一载体上的透明导电聚合物层，然后以导电聚合物上的至少一个开口以图形方式形成透明掩模。 掩模的导电聚合物通过开口进行处理，该开口将导电聚合物的导电性改变至少一个数量级，未被掩模覆盖的区域中形成第一电子部件。 具有掩模的第一电子部件被固定到第二电子部件，从而形成电子装置。
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