High-speed delay scanning and deep learning techniques for spectroscopic SRS imaging

    公开(公告)号:US11237111B2

    公开(公告)日:2022-02-01

    申请号:US17162455

    申请日:2021-01-29

    Abstract: Systems and methods implement of high-speed delay scanning for spectroscopic SRS imaging characterized by scanning a first pulsed beam across a stepwise reflective surface (such as a stepwise mirror or a reflective blazed grating) in a Littrow configuration to generate near continuous temporal delays relative to a second pulsed beam. Systems and methods also implement deep learning techniques for image restoration of spectroscopic SRS images using a trained encoder-decoder convolution neural network (CNN) which in some embodiments may be designed as a spatial-spectral residual net (SS-ResNet) characterized by two parallel filters including a first convolution filter on the spatial domain and a second convolution filter on the spectral domain.

    SYSTEMS AND METHODS FOR BOND-SELECTIVE TRANSIENT PHASE IMAGING

    公开(公告)号:US20200348182A1

    公开(公告)日:2020-11-05

    申请号:US16865082

    申请日:2020-05-01

    Abstract: A method includes directing a first plurality of probe laser pulses through a sample, dividing each of the first plurality of probe laser pulses to generate a first interferogram, and generating first image data reproducible as a first phase image of the sample. A plurality of pump laser bursts are directed onto the sample to heat the sample. A second plurality of probe laser pulses are directed through the sample at a predetermined time delay. Each of the second plurality of probe laser pulses are divided to generate a second interferogram. Second image data is generated that is reproducible as a second phase image of the sample. A transient phase shift is determined in the second phase image relative to the first phase image. A vibrational spectroscopy property is determined of the sample based on the transient phase shift, thereby allowing an identification of chemical bond information of within the sample.

    APPARATUS AND METHOD FOR SHORTWAVE INFRARED PHOTOTHERMAL (SWIP) MICROSCOPY

    公开(公告)号:US20250116852A1

    公开(公告)日:2025-04-10

    申请号:US18906687

    申请日:2024-10-04

    Abstract: A short-wave infrared photothermal (SWIP) microscopy system and method for vibrational imaging of a sample generates shortwave infrared excitation light probe light. The excitation light and the probe light are combined to generate a combined beam, which is focused to generate a focused combined beam, which is directed onto the sample to obtain a SWIP signal generated by absorption-induced thermo-optic selective heating of the sample. The SWIP signal is collected through an aperture in a condenser and detected.

    BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

    公开(公告)号:US20250012557A1

    公开(公告)日:2025-01-09

    申请号:US18761623

    申请日:2024-07-02

    Abstract: A wide-field bond-selective optical coherence tomography (OCT) system and method for imaging a sample includes generating infrared light and directing the infrared light onto the sample to selectively heat the sample. Probe light is also directed onto the sample. A first actuator provides sample depth scanning with respect to a first objective in a reference arm of the system, and a second actuator provides sample depth scanning with respect to a second objective in a sample arm of the system. A detection system receives scattered probe light reflected from the sample. A change in the received probe light from the sample that is indicative of absorption of infrared light.

    Dark-field mid-infrared photothermal microscopy

    公开(公告)号:US12147022B2

    公开(公告)日:2024-11-19

    申请号:US18205152

    申请日:2023-06-02

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    DARK-FIELD MID-INFRARED PHOTOTHERMAL MICROSCOPY

    公开(公告)号:US20220308327A1

    公开(公告)日:2022-09-29

    申请号:US17704896

    申请日:2022-03-25

    Abstract: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    METHODS AND DEVICES FOR OPTOACOUSTIC STIMULATION

    公开(公告)号:US20220287758A1

    公开(公告)日:2022-09-15

    申请号:US17690948

    申请日:2022-03-09

    Abstract: A tapered fiber optoacoustic emitter includes a nanosecond laser configured to emit laser pulses and an optic fiber. The optic fiber includes a tip configured to guide the laser pulses. The tip has a coating including a diffusion layer and a thermal expansion layer, wherein the diffusion layer includes epoxy and zinc oxide nanoparticles configured to diffuse the light while restricting localized heating. The thermal expansion layer includes carbon nanotubes (CNTs) and Polydimethylsiloxane (PDMS) configured to convert the laser pulses to generate ultrasound. The frequency of the ultrasound is tuned with a thickness of the diffusion layer and a CNT concentration of the expansion layer.

    Stimulated Raman photothermal microscope

    公开(公告)号:US12196682B2

    公开(公告)日:2025-01-14

    申请号:US18424128

    申请日:2024-01-26

    Inventor: Ji-Xin Cheng

    Abstract: A stimulated Raman photothermal (SRP) microscope for imaging a sample. A first optical source omits an intensity-modulated pump beam. A second optical source omits an intensity-modulated Stokes beam. The Stokes beam is combined with the pump beam to form a combined beam. The combined beam is directed to the sample to induce a thermal effect caused by the stimulated Raman process. A third optical source emits a probe beam, the probe beam is directed to the sample. An optical detector detects modulation of the probe beam after modulation by the sample to measure an SRP signal.

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