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    Device for determining a parameter of a medium
    13.
    发明授权
    Device for determining a parameter of a medium 有权
    用于确定介质参数的装置

    公开(公告)号：US08901502B2

    公开(公告)日：2014-12-02

    申请号：US13751613

    申请日：2013-01-28

    Applicant: KROHNE Optosens GmbH

    Inventor： Gert Sinn ,  Thomas Fritsch

    IPC: G01T1/20 ,  G01N21/64

    CPC classification number: G01N21/64 ,  B01L2300/18 ,  B01L2300/1822 ,  G01N21/6486 ,  G01N2201/0231

    Abstract: A device (1) is provided for determining at least one parameter of a medium which has a sensor device (2) and an electronic device (3). To provide such a device with a cooling system for at least a portion of its components, the sensor device (2) and/or the electronic device (3) are arranged at least partly in at least one inner space (4, 5) of a housing (6). A passage (7) borders the inner space (4, 5) and a cooling chamber (8) through which a cooling medium can flow is arranged in proximity of the passage (7).

    Abstract translation: 提供了一种用于确定具有传感器装置（2）和电子装置（3）的介质的至少一个参数的装置（1）。 为了为这种装置提供用于其部件的至少一部分的冷却系统，传感器装置（2）和/或电子装置（3）至少部分地布置在至少一个内部空间（4,5）中， 一个房屋（6）。 与通道（7）相邻的通道（7）与内部空间（4,5）和冷却室（8）相接触，冷却介质可以流过冷却室。

    AUTOMATIC ANALYZING APPARATUS
    15.
    发明申请
    AUTOMATIC ANALYZING APPARATUS 审中-公开
    自动分析仪

    公开(公告)号：US20130243657A1

    公开(公告)日：2013-09-19

    申请号：US13988083

    申请日：2011-10-19

    Applicant: Keiko Yoshikawa ,  Hajime Yamazaki

    Inventor： Keiko Yoshikawa ,  Hajime Yamazaki

    IPC: G01N21/17

    CPC classification number: G01N21/17 ,  F21Y2115/10 ,  G01N21/272 ,  G01N2021/3181 ,  G01N2035/00346 ,  G01N2201/0231 ,  G01N2201/0624 ,  G01N2201/0695 ,  G01N2201/1211

    Abstract: An automatic analyzing apparatus which can make an adjustment to a target temperature so as to stabilize the light intensity of an LED and also can make the adjustment to that temperature in a short time is provided. The automatic analyzing apparatus in which an LED is used for a light source 114 includes a temperature adjusting mechanism 201 for the LED, and the temperature adjusting mechanism 201 includes a metal member 202 provided with the light source 114, a pair of metal pipes (water-flowing pipes) 203 buried in the metal member 202 and allowing constant-temperature bath water to flow therein, and pins (small metal piece members) 204 bringing only a heat-generating lead 252 of the light source 114 into direct contact with the metal member 202. Therefore, the temperature adjusting mechanism 201 can make an adjustment to a target temperature so as to stabilize the light intensity of the LED, and the adjustment to that temperature can be made in a short time.

    Abstract translation: 一种自动分析装置，其可以对目标温度进行调节，以稳定LED的光强度，并且还可以在短时间内对该温度进行调节。 其中LED用于光源114的自动分析装置包括用于LED的温度调节机构201，温度调节机构201包括设置有光源114的金属构件202，一对金属管（水 埋入金属构件202中并允许恒温槽水流入其中的引脚（小金属构件）204，仅使光源114的发热引线252与金属直接接触 因此，温度调节机构201可以调节目标温度以稳定LED的光强度，并且可以在短时间内对该温度进行调节。

    TEST SWIPE FOR PORTABLE EXPLOSIVE OR DRUG DETECTION SYSTEM
    16.
    发明申请
    TEST SWIPE FOR PORTABLE EXPLOSIVE OR DRUG DETECTION SYSTEM 审中-公开
    用于便携式爆炸或药物检测系统的测试开关

    公开(公告)号：US20120107949A1

    公开(公告)日：2012-05-03

    申请号：US12393427

    申请日：2009-02-26

    Applicant: Jeffrey Haas ,  Douglas Haas

    Inventor： Jeffrey Haas ,  Douglas Haas

    IPC: G01N21/75

    CPC classification number: G01N1/02 ,  G01N21/78 ,  G01N25/00 ,  G01N33/22 ,  G01N33/227 ,  G01N33/94 ,  G01N35/00009 ,  G01N35/00722 ,  G01N2001/022 ,  G01N2001/028 ,  G01N2035/00425 ,  G01N2035/0091 ,  G01N2035/0097 ,  G01N2201/0231 ,  Y10T436/25375

    Abstract: A portable chemical analytical apparatus to analyze a test swipe having a base; a chemically treated pad containing the swiped sample positioned in a white zone above the base; and a tab attached to one side of the base. The apparatus includes a heater to warm the test swipe to a predetermined temperature; a clamp to secure the test swipe to the heater; one or more pumps to dispense one or more chemicals onto the test swipe from a disposable cartridge; a fan to remove chemical vapors rising a predetermined distance from the test swipe; and a camera to capture an image of the test swipe for un-biased automated analysis, and displayed on an LCD screen.

    Abstract translation: 一种用于分析具有基底的测试滑动的便携式化学分析装置; 化学处理的垫，其包含位于基底上方的白色区域中的被擦拭的样品; 以及附接到基座的一侧的突片。 该装置包括加热器，以将测试滑动加热至预定温度; 用于将测试滑动固定到加热器的夹具; 一个或多个泵将一种或多种化学品从一次性药筒分配到测试刷卡上; 用于去除从测试滑动上升预定距离的化学气体的风扇; 以及相机捕获测试滑动的图像以进行无偏压的自动分析，并显示在LCD屏幕上。

    Analytical equipment enclosure incorporating phase changing materials
    17.
    发明授权
    Analytical equipment enclosure incorporating phase changing materials 有权
    分析设备包含相变材料

    公开(公告)号：US08154728B2

    公开(公告)日：2012-04-10

    申请号：US12347368

    申请日：2008-12-31

    Applicant: Xuejiao Hu ,  Alfred Feitisch

    Inventor： Xuejiao Hu ,  Alfred Feitisch

    IPC: G01N21/00 ,  H01S3/04

    CPC classification number: G01N21/39 ,  G01N2201/022 ,  G01N2201/023 ,  G01N2201/0231

    Abstract: Thermally controlled enclosures that can be used with gas analyzers are described. The enclosures incorporate one or more phase changing materials that buffer ambient and internal heat loads to reduce the power consumption demand of mechanical or electronic heating apparatus. Maintenance of gas analyzer equipment at a consistent temperature can be important to achieving stable and reproducible results. Related systems, apparatus, methods, and/or articles are also described.

    Abstract translation: 描述了可用于气体分析仪的热控制外壳。 外壳采用缓冲环境和内部热负荷的一种或多种相变材料，以减少机械或电子加热设备的功耗需求。 在一致的温度下维护气体分析仪设备对于获得稳定和可重现的结果是重要的。 还描述了相关系统，装置，方法和/或制品。

    Inspection apparatus and inspection method
    19.
    发明申请
    Inspection apparatus and inspection method 有权
    检验仪器和检验方法

    公开(公告)号：US20090262339A1

    公开(公告)日：2009-10-22

    申请号：US11989018

    申请日：2007-06-29

    Applicant: Tadashi Suga ,  Shuichi Chikamatsu ,  Masayuki Ochi ,  Takahiko Suzuki ,  Seiji Otani

    Inventor： Tadashi Suga ,  Shuichi Chikamatsu ,  Masayuki Ochi ,  Takahiko Suzuki ,  Seiji Otani

    IPC: G01N21/88

    CPC classification number: G03F7/70858 ,  G01N21/9501 ,  G01N21/95623 ,  G01N2201/0231 ,  H01L21/67248

    Abstract: A defect inspection apparatus enable to efficiently perform a temperature control without involving an enlarged size can be achieved.The parts constituting the defect inspection apparatus are classified into parts need temperature control and parts not to need temperature control; all the parts need temperature control are accommodated together into a temperature-controlled part accommodating section 604, and the parts not to need temperature control are arranged in a heat radiating unit 605. The temperature in the temperature-controlled part accommodating section 604 is measured by a temperature measuring instrument 603 and a control CPU 602 in a temperature control unit 601 carries out control according to the measured temperature so that the interior of the temperature-controlled part accommodating section 604 is kept at a fixed temperature. Therefore, it becomes easy to keep the fixed temperature, when compared with a case in which individual parts are temperature-controlled separately by being heated or cooled, yielding an energy saving effect.

    Abstract translation: 可以实现能够有效地执行不涉及放大尺寸的温度控制的缺陷检查装置。 构成缺陷检查装置的部件分为需要温度控制的部件和不需要温度控制的部件; 将所有需要温度控制的部件一起放入温度控制部件容纳部分604中，并且不需要温度控制的部件被布置在散热单元605中。温度控制部件容纳部分604中的温度由 温度控制单元601中的温度测量装置603和控制CPU 602根据测量的温度执行控制，使得温度控制部分容纳部分604的内部保持在固定温度。 因此，与单独部件通过加热或冷却分别进行温度控制的情况相比，容易保持固定温度，产生节能效果。

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