Abstract:
Systems and methods for calibrating a solid-imaging system (10) are disclosed. A calibration plate (110) having a non-scattering surface (140) with a plurality (150) of light-scattering fiducial marks (156) in a periodic array is disposed in the solid-imaging system. The actinic laser beam (26) is scanned over the fiducial marks, and the scattered light (26S) is detected by a detector (130) residing above the calibration plate. A computer control system (30) is configured to control the steering of the light beam and to process the detector signals (SD) so as to measure actual center positions (xA, yA) of the fiducial marks and perform an interpolation that establishes a calibrated relationship between the angular positions of the mirrors and (x,y) locations at the build plane (23). The calibrated relationship is then used to steer the laser beam in forming a three-dimensional object (50).
Abstract:
The invention is a passive method to measure the translational speed of a visual scene using the distribution of light intensities. Measuring the speed of translation is useful for control, safety, management of resources, fuel efficiency, and many more application fields. It is however technically challenging because a wide-field translating scene projects on an image plane as a heterogeneous field of apparent speeds. The invention solves this problem by combining two principles: perspective distortion matching over a broad field of view, and temporal filtering variation. In conventional systems, an acquired image is calibrated to obtain linear coordinates. Instead, the invention uses the perspective distortion of the image to sample the visual scene at different linear wavelengths over the visual field. The result is a spatial sensitivity map of the visual scene. The obtained signal is then temporally filtered with cutoff frequencies proportional to the spatial sensitivity. The final result is the wide-spectrum computation of the ratio between temporal and linear spatial frequencies, in other words linear speed. The technique is passive because it does not require the emission of a reference signal. This is an advantage over active speed sensors mainly because of reduced power consumption, but it is an enabling factor for other applications. Where it is difficult or impossible using standard device-centered techniques, like on aircrafts or in fluids, the invention enables measuring absolute linear speed. The advantage over non-device-centered techniques like—GPS—is the independence from external infrastructures. The small computational overhead makes it ideal for mobile applications.
Abstract:
There is provided a film measuring device capable of accurately and easily measuring the thickness of a microporous film formed on a battery electrode plate over the entire area of the film. A color CCD sensor 8 shoots the microporous film. A video board 11 converts a color tone of a color image signal obtained by the image pickup into gradation data of respective color components of RGB. After the data conversion, an image processing board 12 extracts line images of the respective color components. A calculator 14 obtains the thickness of the microporous film by referring to pre-measured film thickness reference values corresponding to the gradation data of the green or blue color component, which are stored in a table storage 13 as reference thickness table data, using the gradation data of the line image of the green color component or the blue color component as lookup data.
Abstract:
The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.
Abstract translation:本发明涉及用于校准光致发光测量系统,特别是荧光测量系统的方法和试剂盒。 该试剂盒包括许多荧光标准品I及其校准和认证的荧光光谱Ii(λ),从而选择荧光标准品,以使其光谱校正的荧光光谱Ii(λ)覆盖高强度的宽光谱范围。 标准的特征在于它们的至少1400cm-1的带的宽半宽度FWHMi。 根据本发明的方法,通过形成测量的荧光光谱Ji(λ)和对应的校正荧光光谱Ii(λ)的商产生部分校正函数Fi(λ),然后将其组合以形成总校正 函数F(λ)用于宽光谱范围。 因此,通过仅关于相互交叉波长λi/ i + 1的预定义的有限重叠区域λi/ i + 1±&Dgr;λOL的连续部分校正函数Fi(λ)的统计平均来计算组合因子αi。
Abstract:
The invention concerns fluorescence standards, and in particular fluorescence standards for calibrating optical detectors. According to the invention, a fluorescent mineral or mixtures of minerals are employed for use as a fluorescence standard. The fluorescent mineral can be a naturally occurring mineral or a synthetically produced mineral. Preferred fluorescent minerals for use as fluorescence standards are corundum, fluorite, turquoise, amber, zircon, zoisite, iolite or cordierite, spinel, topaz, calcium fluorite, sphalerite or zincblende, calcite or calcspar, apatite, scheelite or calcium tungstate, willemite, feldspars, sodalite, a uranium mineral, a mineral containing Al3+, and in particular ruby and sapphire.
Abstract:
A portable device includes a base unit, an extension, and a mirror. The base unit includes a light source, a light detector, and at least one window through which light exits from, and is received by, the base unit. The extension is configured, during use, to be attached to the base unit and to extend from the at least one window, in a direction away from the base unit, the extension defining at least a portion of a sample volume in fluid communication with gases substantially surrounding one or more of the extension and the base unit. The mirror is attached to the extension at a distance from the at least one window. An optical path is defined between the mirror and the at least one window such that light from the light source moves through the sample volume along the optical path, and the mirror is aligned to reflect the light back to the at least one window for detection by the light detector.
Abstract:
The positions of diffraction gratings used for calibration can be checked easily by arranging marks near the diffraction gratings, the marks indicating the coordinate positions of the diffraction gratings. Dummy patterns including a pattern of cross marks are arranged around the array of the diffraction gratings. Consequently, a uniform diffraction grating pattern is accomplished in which the proximity effect is uniform across the diffraction grating array. Furthermore, cross marks can be disposed adjacent to the diffraction grating array. Therefore, the diffraction gratings can be placed in position and calibrated accurately and easily by using a standard component capable of realizing accurate positioning of the diffraction gratings. Hence, accurate metrology calibration coping with the next generation of semiconductor lithography technology can be accomplished.
Abstract:
A field deployable optical assembly for use in testing a light-responsive sample is disclosed. The assembly includes a microfluidic device, a first optical package, and a second optical package. The first optical package includes a light emitting diode (LED), a first optical device, and a first light-path control, the first optical package configured to guide and focus light from the LED onto the sample. The microfluidic device includes a tethered control substance. In response to a substance within the sample being associated with, and attaching to, the tethered control, the sample emits light. The second optical package includes a photo sensor, a second optical device, and a second light-path control, the second optical package configured to guide and focus the light emitted from the sample onto the photo sensor.
Abstract:
According to the present invention, a laser scanner measuring system, which has a laser scanner and a calibration target, wherein the laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam for scanning, a distance measuring unit, which has a distance measuring light receiving unit, for measuring a distance by receiving a reflection light from an object to be measured, and a control unit for driving and controlling the light emitting element and the distance measuring unit, and wherein the calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position, comprising a step for judging a reflected pulsed laser beam from the reflection sector as received by the distance measuring light receiving unit by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position.
Abstract:
A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.