公开(公告)号：US20170241837A1

公开(公告)日：2017-08-24

申请号：US15588005

申请日：2017-05-05

Applicant: Kaiser Optical Systems, Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White

IPC: G01J3/02 ,  G01J3/44

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01J2003/2866

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US20160356646A1

公开(公告)日：2016-12-08

申请号：US14728818

申请日：2015-06-02

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White

IPC: G01J3/02 ,  G01J3/44

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01J2003/2866

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

Abstract translation: 描述了用于光谱仪暗校正的方法和系统，其实现更稳定的基线，特别是对于强度校正放大任何非零零暗结果的边缘的边缘，以及由于相机窗框的温度变化引起的暗电流变化通常更多 发音。 由此导致的基线曲率使得这些区域难以定量化。 使用本发明可以提供用于识别系统故障状态的度量，例如相机真空密封的损失，温度稳定的漂移和光泄漏。 在本发明的系统方面，处理器从光谱仪中的光检测器接收信号，并执行软件程序以计算光谱响应，总和或平均结果，并执行执行所公开方法所需的其它操作。 在最优选的实施例中，从样品接收的光信号用于拉曼分析。