公开(公告)号：US20220100428A1

公开(公告)日：2022-03-31

申请号：US17464334

申请日：2021-09-01

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for operating frequency monitoring for memory devices are described for monitoring one or more operating frequency ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more operating frequency ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.

公开(公告)号：US20210397363A1

公开(公告)日：2021-12-23

申请号：US17345267

申请日：2021-06-11

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd J. Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Mark D. Ingram

IPC: G06F3/06 ,  G06F1/06

Abstract: Methods, systems, and devices for operational monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a memory device may include components configured for monitoring health or life expectancy or both of the memory device, such as components internal to the memory device that identify and store various indications of a duration of operating a memory device. An operational duration stored at the memory device may be used in various operations, such as calculations or comparisons, to evaluate health or life expectancy of the memory device, which may include or be supported by various signaling with a host device.

公开(公告)号：US12014792B2

公开(公告)日：2024-06-18

申请号：US18108302

申请日：2023-02-10

Applicant: Micron Technology, Inc.

Inventor： Mark D. Ingram ,  Todd Jackson Plum ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Scott D. Van De Graaff

IPC: G11C29/44 ,  G06F12/02 ,  G11C29/12

CPC classification number: G11C29/4401 ,  G06F12/0238 ,  G11C29/12005 ,  G11C29/12015 ,  G06F2212/7201 ,  G06F2212/7211 ,  G11C2207/2254

Abstract: Methods, systems, and devices for monitoring and adjusting access operations at a memory device are described to support integrating monitors or sensors for detecting memory device health issues, such as those resulting from device access or wear. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a metric related to access operations for the memory device. The memory device may use the metric (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.

公开(公告)号：US11644977B2

公开(公告)日：2023-05-09

申请号：US17365013

申请日：2021-07-01

Applicant: Micron Technology, Inc.

Inventor： Scott D. Van De Graaff ,  Todd Jackson Plum ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Mark D. Ingram

IPC: G06F3/06

CPC classification number: G06F3/0616 ,  G06F3/0659 ,  G06F3/0679

Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a system may include components configured for monitoring health or life expectancy of the memory device, such as components that perform comparisons between signals or other operating characteristics resulting from operating at the memory device and one or more threshold values that may be indicative of a life expectancy of the memory device. In various examples, a memory device may perform a subsequent operation based on such a comparison, or may provide an indication of a life expectancy to a host device based on one or more comparisons or determinations about health or life expectancy.

公开(公告)号：US11600355B2

公开(公告)日：2023-03-07

申请号：US17365003

申请日：2021-07-01

Applicant: Micron Technology, Inc.

Inventor： Mark D. Ingram ,  Todd Jackson Plum ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Scott D. Van De Graaff

IPC: G11C29/44 ,  G11C29/12 ,  G06F12/02

Abstract: Methods, systems, and devices for monitoring and adjusting access operations at a memory device are described to support integrating monitors or sensors for detecting memory device health issues, such as those resulting from device access or wear. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a metric related to access operations for the memory device. The memory device may use the metric (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.

公开(公告)号：US20230065593A1

公开(公告)日：2023-03-02

申请号：US17821413

申请日：2022-08-22

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Mark D. Ingram ,  Todd Jackson Plum

IPC: G11C7/24 ,  G11C7/04 ,  G11C7/10

Abstract: Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.

公开(公告)号：US20220342604A1

公开(公告)日：2022-10-27

申请号：US17724216

申请日：2022-04-19

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Todd J. Plum

IPC: G06F3/06

Abstract: Methods, systems, and devices for memory device health evaluation at a host device are described. The health evaluation relates to a host device that is associated with a memory device that monitors and reports health information, such as one or more parameters associated with a status of the memory device. The memory device may transmit the health information to the host device, which may perform one or more operations and may transmit the health information to a device of another entity of a system (e.g., ecosystem) including the host device. The host device may include one or more circuits for transmitting and processing the health information, such as a system health engine, a safety engine, a communication component, or a combination thereof. Based on a determination by the host device or information received from an external device, the host device may transmit a command to the memory device.

公开(公告)号：US20220317916A1

公开(公告)日：2022-10-06

申请号：US17695364

申请日：2022-03-15

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Todd J. Plum

IPC: G06F3/06

Abstract: Methods, systems, and devices for inter-device communications for memory health monitoring are described. These communications relate to a host device that is associated with a memory device that monitors and reports health information (e.g., one or more parameters associated with a status of the memory device). The memory device may transmit the health information to the host device (e.g., a vehicle or a computer of the vehicle), which may perform one or more operations and transmit the health information to another entity of a system (e.g., ecosystem) including the host device. The host device may additionally or alternatively use the health information. In some cases, the other entity may receive the health information and transmit a signal back to the host device based on the health information. The other entity of the ecosystem may receive the health information and may make a determination based on the health information.

公开(公告)号：US20220137827A1

公开(公告)日：2022-05-05

申请号：US17505028

申请日：2021-10-19

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Scott Van De Graaff ,  Todd Jackson Plum ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. A memory device may monitor a parameter of a component of the memory device or the memory device overall, and may determine whether the parameter satisfies a threshold. The parameter may represent or be associated with a lifetime of the component, a level of wear of the component, or an operating parameter violation of the component, or any combination thereof. The memory device may communicate, to a host device, an indication of the parameter satisfying the threshold, and the host device may use the information in the indication to adjust one or more parameters associated with operating the memory device, among other example operations.

公开(公告)号：US20220035535A1

公开(公告)日：2022-02-03

申请号：US17365013

申请日：2021-07-01

Applicant: Micron Technology, Inc.

Inventor： Scott D. Van De Graaff ,  Todd Jackson Plum ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a system may include components configured for monitoring health or life expectancy of the memory device, such as components that perform comparisons between signals or other operating characteristics resulting from operating at the memory device and one or more threshold values that may be indicative of a life expectancy of the memory device. In various examples, a memory device may perform a subsequent operation based on such a comparison, or may provide an indication of a life expectancy to a host device based on one or more comparisons or determinations about health or life expectancy.