公开(公告)号：US07683303B2

公开(公告)日：2010-03-23

申请号：US11333989

申请日：2006-01-17

Applicant: Patrick Denis Lincoln ,  Charles M. Patton

Inventor： Patrick Denis Lincoln ,  Charles M. Patton

IPC: H01L27/00

CPC classification number: H01L31/0352 ,  G01J1/0209 ,  G01J1/4228 ,  H01L27/14601 ,  H01L27/14683

Abstract: The invention provides an imaging device comprised of nanoscale crossbar arrays upon a transmissive medium. The preferred embodiment employs a BOPET film as the transparent material bearing addressable nanoscale arrays, and the arrays connected to leads through micro lithographic techniques, and in turn connected to a logic device. An imaging volume is provided by stacking the array-bearing sheets. The volumetric imaging device functions omnidirectionally. By means of applying Fourier and/or geometric optics techniques to imaging data, various focal points and planes of focus can be calculated. The preferred embodiment is on the order of 1 cubic mm. Alternate embodiments include display and projection devices.

Abstract translation: 本发明提供了一种在透射介质上由纳米级横杆阵列组成的成像装置。 优选实施例采用BOPET膜作为承载可寻址纳米尺寸阵列的透明材料，并且所述阵列通过微光刻技术连接到引线，并且依次连接到逻辑器件。 通过堆叠阵列承载片材来提供成像体积。 体积成像装置全功能。 通过将傅立叶和/或几何光学技术应用于成像数据，可以计算各种焦点和焦点平面。 优选的实施方案为约1立方毫米。 替代实施例包括显示和投影设备。

公开(公告)号：US07638751B2

公开(公告)日：2009-12-29

申请号：US12118187

申请日：2008-05-09

Applicant: Eric A. Dauler ,  Andrew J. Kerman ,  Karl K. Berggren ,  Vikas Anant ,  Joel K. W. Yang

Inventor： Eric A. Dauler ,  Andrew J. Kerman ,  Karl K. Berggren ,  Vikas Anant ,  Joel K. W. Yang

IPC: G01J1/44 ,  H01L27/18

CPC classification number: G01J1/4228 ,  G01J1/02 ,  G01J1/0209 ,  H01L39/10

Abstract: A multi-element optical detector includes a plurality of optical detector elements capable of producing an output signal having information about the state of an incident electromagnetic radiation as a function of time. An active region includes a photosensitive region of one of the optical detector elements separated in part or in whole from the photosensitive region of at least one other optical detector element by a distance less than the wavelength of the electromagnetic radiation that the optical detector elements are being used to detect.

Abstract translation: 多元光学检测器包括多个光学检测器元件，其能够产生具有关于作为时间的函数的入射电磁辐射的状态的信息的输出信号。 有源区包括光检测器元件中的一个的光敏区域，其部分或全部与至少一个其它光学检测器元件的感光区域分开的距离小于光学检测器元件的电磁辐射的波长 用于检测。

公开(公告)号：US20090174947A1

公开(公告)日：2009-07-09

申请号：US12316057

申请日：2008-12-09

Applicant: Masahiro Hasegawa

Inventor： Masahiro Hasegawa

IPC: G02B3/00 ,  G01J1/00 ,  B32B38/04

CPC classification number: B32B38/0004 ,  B32B37/12 ,  B32B38/04 ,  B32B2307/416 ,  B32B2310/0843 ,  B32B2315/08 ,  B32B2457/14 ,  G01J1/02 ,  G01J1/0204 ,  G01J1/0209 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0411 ,  G02B3/0012 ,  G02B3/0056 ,  G02B3/0062 ,  G02B13/0035 ,  G02B13/0085 ,  H01L2224/02372 ,  H01L2224/05001 ,  H01L2224/05009 ,  H01L2224/05022 ,  H01L2224/05026 ,  H01L2224/05548 ,  H01L2224/056 ,  H01L2224/11 ,  H01L2924/00014 ,  Y10T156/1052 ,  H01L2224/05099

Abstract: An electronic element wafer module is provided, comprising: an electronic element wafer arranged with a plurality of electronic elements having a through hole electrode; a resin adhesion layer formed in a predetermined area on the electronic element wafer; a transparent cover member covering the electronic element wafer and fixed on the resin adhesion layer; and a plurality of resin optical elements adhered and fixed on the transparent cover member to be integrated in such a manner to correspond to the respective plurality of electronic elements.

Abstract translation: 提供了一种电子元件晶片模块，包括：电子元件晶片，其布置有多个具有通孔电极的电子元件; 形成在电子元件晶片上的预定区域中的树脂粘附层; 覆盖所述电子元件晶片并固定在所述树脂粘合层上的透明盖构件; 以及多个树脂光学元件，其粘附并固定在透明盖构件上，以便以与相应的多个电子元件对应的方式集成。

公开(公告)号：US07470556B2

公开(公告)日：2008-12-30

申请号：US11167596

申请日：2005-06-28

Applicant: Ulrich C. Boettiger ,  Jin Li

Inventor： Ulrich C. Boettiger ,  Jin Li

IPC: H01L21/00

CPC classification number: H04N5/2254 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/04 ,  G01J1/0411 ,  G02B3/0018 ,  G02B3/0043 ,  H01L27/14627

Abstract: A microlens structure that includes a wedge formed to support and tilt the microlens is disclosed. The wedge results from heating a layer of patterned flowable material. The degree and direction of incline given to the wedge can be controlled in part by the type of patterning that is performed.

Abstract translation: 公开了一种微透镜结构，其包括形成为支撑和倾斜微透镜的楔形物。 通过加热图案化的可流动材料层产生楔形。 施加到楔形物的斜面的程度和方向可以部分地由所执行的图案化的类型来控制。

公开(公告)号：US20080197285A1

公开(公告)日：2008-08-21

申请号：US11915946

申请日：2006-06-06

Applicant: Laurent Frey ,  Jean-Claude Villegier

Inventor： Laurent Frey ,  Jean-Claude Villegier

IPC: H01L39/00

CPC classification number: G01J1/42 ,  B82Y20/00 ,  G01J1/02 ,  G01J1/0209 ,  G02B6/1223 ,  G02B6/305 ,  G02B6/4206

Abstract: Ultrasensitive optical detector with high resolution in time, using a waveguide, and processes for manufacturing this detectorThis detector, designed to detect at least one photon, comprises a dielectric substrate (2) and at least one detection element on this substrate, designed to generate an electrical signal starting from the energy of the photon(s) received, and a guide element to guide this or these photons the energy of which is then absorbed by the detection element (4) at an absorption zone which is less than 100 nm thick. The detection element is substantially straight on the substrate and is short, and the guide element comprises a single mode light waveguide with strong confinement (6), placed on the detection element. The invention is applicable particularly to detection and localisation of operating defects in a semiconducting circuit.

Abstract translation: 使用波导的高分辨率的超灵敏光学检测器和用于制造该检测器的工艺该设计用于检测至少一个光子的检测器包括电介质基板（2）和该基板上的至少一个检测元件，设计成产生 从所接收的光子的能量开始的电信号和引导元件，以引导这个或这些光子，其能量然后在小于100nm厚的吸收区被检测元件（4）吸收 。 检测元件在基板上基本上是直的，并且是短的，并且引导元件包括放置在检测元件上的具有强限制（6）的单模光波导。 本发明特别适用于半导体电路中的工作缺陷的检测和定位。

公开(公告)号：US07329848B2

公开(公告)日：2008-02-12

申请号：US11190139

申请日：2005-07-26

Applicant: Kyoung-Ju Shin

Inventor： Kyoung-Ju Shin

IPC: H03K17/78

CPC classification number: H01L27/12 ,  G01J1/0209 ,  G01J1/32 ,  G01J1/42 ,  G02F1/13318 ,  G02F1/1362 ,  H01L27/1446 ,  H01L31/112

Abstract: A photo sensor includes a first substrate, a switching element and a second substrate. The switching element is disposed at the first substrate and defined by a control electrode, and first and second current electrodes. The switching element includes a channel disposed between the first and second current electrodes. The channel has a first length to receive an incident external light. The second substrate includes a light receiving unit that is disposed corresponding to the channel. The light receiving unit has a second length longer than the first length and shorter than a third length of the control electrode.

Abstract translation: 光传感器包括第一基板，开关元件和第二基板。 开关元件设置在第一基板上，由控制电极以及第一和第二电流电极限定。 开关元件包括设置在第一和第二电流电极之间的通道。 通道具有第一长度以接收事件外部光。 第二基板包括对应于通道布置的光接收单元。 光接收单元具有比第一长度长的第二长度并且短于控制电极的第三长度。

公开(公告)号：US07193202B2

公开(公告)日：2007-03-20

申请号：US10949120

申请日：2004-09-23

Applicant: Johan Stiens ,  Gennady Shkerdin ,  Vladimir Kotov

Inventor： Johan Stiens ,  Gennady Shkerdin ,  Vladimir Kotov

IPC: H01L31/00

CPC classification number: G01J1/4228 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0214 ,  G01J1/4257 ,  G01J1/44 ,  H01L27/1446 ,  H01L27/14649 ,  H01L27/16 ,  H01L31/101 ,  H01L37/00

Abstract: A method and system for detecting and monitoring a temporal and spatial distribution of a light beam are provided. A semiconductor substrate (120) having a given doping concentration range is partially exposed to an incident laser beam (150). Each part of the semiconductor structure (120) which is exposed to the laser beam is provided with an electrical contact (145), which outputs a voltage which is directly related to the optical power or energy incident on the exposed area. The thermo-voltage is produced by the laser induced thermal gradients. The sensitivity and inter-pixel cross-talk is determined by pixel pitch, doping concentration and window opening (110). Depending of the design, each pixel might be sensitive to the temporal variation of the laser beam.

Abstract translation: 提供了用于检测和监视光束的时间和空间分布的方法和系统。 具有给定掺杂浓度范围的半导体衬底（120）部分地暴露于入射激光束（150）。 暴露于激光束的半导体结构（120）的每个部分设置有电触点（145），其输出与入射在暴露区域上的光功率或能量直接相关的电压。 热电压由激光诱导的热梯度产生。 灵敏度和像素间串扰通过像素间距，掺杂浓度和开窗来确定（110）。 根据设计，每个像素可能对激光束的时间变化敏感。

公开(公告)号：US20060289956A1

公开(公告)日：2006-12-28

申请号：US11167596

申请日：2005-06-28

Applicant: Ulrich Boettiger ,  Jin Li

Inventor： Ulrich Boettiger ,  Jin Li

IPC: H01L31/0232

CPC classification number: H04N5/2254 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/04 ,  G01J1/0411 ,  G02B3/0018 ,  G02B3/0043 ,  H01L27/14627

Abstract: A microlens structure that includes a wedge formed to support and tilt the microlens is disclosed. The wedge results from heating a layer of patterned flowable material. The degree and direction of incline given to the wedge can be controlled in part by the type of patterning that is performed.

Abstract translation: 公开了一种微透镜结构，其包括形成为支撑和倾斜微透镜的楔形物。 通过加热图案化的可流动材料层产生楔形。 施加到楔形物的斜面的程度和方向可以部分地由所执行的图案化的类型来控制。

公开(公告)号：US07049593B2

公开(公告)日：2006-05-23

申请号：US10969315

申请日：2004-10-19

Applicant: Roman Sobolewski ,  Grigory N. Gol'tsman ,  Alexey D. Semenov ,  Oleg V. Okunev ,  Kenneth R. Wilsher ,  Steven A. Kasapi

Inventor： Roman Sobolewski ,  Grigory N. Gol'tsman ,  Alexey D. Semenov ,  Oleg V. Okunev ,  Kenneth R. Wilsher ,  Steven A. Kasapi

IPC: H01L39/00

CPC classification number: H01L39/10 ,  G01J1/0209 ,  G01J1/0252 ,  G01J1/0411 ,  G01J1/42 ,  H01L31/101

Abstract: A single-photon detector includes a superconductor strip biased near its critical current. The superconductor strip provides a discernible output signal upon absorption of a single incident photon. In one example, the superconductor is a strip of NbN (niobium nitride). In another example, the superconductor strip meanders to increase its probability of receiving a photon from a light source. The single-photon detector is suitable for a variety of applications including free-space and satellite communications, quantum communications, quantum cryptography, weak luminescence, and semiconductor device testing.

Abstract translation: 单光子检测器包括在其临界电流附近偏置的超导体带。 超导体条在吸收单个入射光子时提供可辨别的输出信号。 在一个实例中，超导体是NbN（氮化铌）的条带。 在另一个示例中，超导体条弯曲以增加其从光源接收光子的概率。 单光子检测器适用于自由空间和卫星通信，量子通信，量子加密，弱发光和半导体器件测试等各种应用。

公开(公告)号：US20060006319A1

公开(公告)日：2006-01-12

申请号：US11216354

申请日：2005-08-31

Applicant: Jon Bechtel ,  Harold Ockerse

Inventor： Jon Bechtel ,  Harold Ockerse

IPC: H01J5/02

CPC classification number: G02B5/021 ,  B60R1/088 ,  B60R1/12 ,  B60S1/0822 ,  B60S1/0833 ,  B60S1/0885 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0219 ,  G01J1/0228 ,  G01J1/0266 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/0403 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/0422 ,  G01J1/0474 ,  G01J1/18 ,  G01J1/42 ,  G01J1/46 ,  G01J2001/4266 ,  G02B5/0215 ,  G02B5/0221 ,  G02B5/0242 ,  G02B5/0278 ,  G02B19/0028 ,  G02B19/0076

Abstract: The inventive sensor device includes a support structure, a sensing element mounted on the support substrate for sensing optical radiation and generating an electrical output signal in response thereto, and an encapsulant encapsulating the sensing element on the support structure. The encapsulant being configured to define a lens portion for focusing incident optical radiation onto an active surface of the sensing element, and an optical radiation collector portion surrounding the lens portion for collecting and redirecting optical radiation that is not incident the lens portion onto the active surface of the sensing element. The collector portion may be a parabolic reflector that reflects incident light by total internal reflection. The sensor device may be incorporated into an assembly including a diffuser positioned across an aperture, and/or may be incorporated into a vehicle accessory such as a rearview mirror assembly.

Abstract translation: 本发明的传感器装置包括支撑结构，安装在支撑基板上的感测元件，用于感测光辐射并响应于此产生电输出信号，以及将感测元件封装在支撑结构上的密封剂。 密封剂被配置为限定用于将入射光辐射聚焦到感测元件的有效表面上的透镜部分，以及围绕透镜部分的光学辐射收集器部分，用于收集并重定向未入射到透镜部分的有源表面的光学辐射 的传感元件。 收集器部分可以是通过全内反射来反射入射光的抛物面反射器。 传感器装置可以结合到包括跨过孔的扩散器的组件中，和/或可以被结合到诸如后视镜组件的车辆附件中。