公开(公告)号：US20220317023A1

公开(公告)日：2022-10-06

申请号：US17596051

申请日：2020-03-19

Applicant: Hitachi, Ltd.

Inventor： Takuya KAMBAYASHI ,  Toshimitsu NOGUCHI ,  Shunsuke KONO ,  Akihiro NOJIMA

IPC: G01N21/03 ,  G01J1/28

Abstract: An arithmetic expression used for estimating a target item of a specimen is more easily incorporated into an optical measurement system. An optical measurement instrument includes an optical analysis unit configured to perform an optical analysis on a specimen and measure an intensity of light as a result of the optical analysis, and an arithmetic processing unit configured to download an arithmetic expression from a server device via a network, and perform a quantitative analysis on a target substance contained in the specimen by substituting the result of the optical analysis by the optical analysis unit into the arithmetic expression.

公开(公告)号：US20170211976A1

公开(公告)日：2017-07-27

申请号：US15342937

申请日：2016-11-03

Applicant: Halliburton Energy Services, Inc.

Inventor： David L. Perkins ,  Christopher Michael Jones ,  Michael T. Pelletier ,  Li Gao ,  Robert Atkinson ,  William Soltmann

IPC: G01J3/02 ,  G01J1/02 ,  G01J1/04 ,  E21B47/00 ,  G01J1/46 ,  G01J1/28 ,  G01J1/42 ,  G02B26/04 ,  G01V8/10 ,  G01J1/22

CPC classification number: G02B26/04 ,  E21B47/00 ,  G01J1/0228 ,  G01J1/0295 ,  G01J1/0444 ,  G01J1/0492 ,  G01J1/20 ,  G01J1/22 ,  G01J1/28 ,  G01J1/42 ,  G01J1/46 ,  G01J3/0235 ,  G01J3/027 ,  G01J3/0297 ,  G01V8/10

Abstract: Various embodiments include systems and methods to provide selectable variable gain to signals in measurements using incident radiation. The selectable variable gain may be used to normalize signals modulated in measurements using incident radiation. The selectable variable gain may be attained using a number of different techniques or various combinations of these techniques. These techniques may include modulating a modulator having modulating elements in which at least one modulating element acts on incident radiation differently from another modulating element of the modulator, modulating the use of electronic components in electronic circuitry of a detector, modulating a source of radiation or combinations thereof. Additional apparatus, systems, and methods are disclosed.

公开(公告)号：US07161137B2

公开(公告)日：2007-01-09

申请号：US11027944

申请日：2005-01-04

Applicant: Tomoyuki Ura ,  Tsutomu Sasaki ,  Yasuhiko Ohba ,  Masahisa Hashimoto

Inventor： Tomoyuki Ura ,  Tsutomu Sasaki ,  Yasuhiko Ohba ,  Masahisa Hashimoto

IPC: G01V8/10 ,  G01J1/34 ,  G01J1/28

CPC classification number: G10H1/344

Abstract: Keys, which are incorporated in an automatic player piano, are monitored with an optical transducer system. The optical transducer system includes sensor heads provided on both sides of the key trajectories, LEDs connected to predetermined sensor heads through optical fibers, LDDs connected to the other sensor heads through optical fibers and a controlling unit. A luminescence controller is connected to the LEDs for optimizing the luminescence, and bias controllers are respectively connected to the LDDs. The luminescence controller and bias controllers optimize the luminescence of emitted light and the bias level of electric signals so that the optical transducer system is free from the individuality of component parts and the deterioration.

Abstract translation: 使用光学换能器系统监视并入自动演奏器钢琴的琴键。 光学传感器系统包括设置在键轨迹两侧的传感器头，通过光纤连接到预定传感器头的LED，通过光纤连接到其它传感器头的LDD和控制单元。 发光控制器连接到LED以优化发光，并且偏置控制器分别连接到LDD。 发光控制器和偏置控制器优化发射光的发光和电信号的偏置电平，使得光学传感器系统不受组件的个性化和劣化。

公开(公告)号：US5875026A

公开(公告)日：1999-02-23

申请号：US763752

申请日：1996-12-11

Applicant: Cheol-Jung Kim ,  Kwang-Suk Kim

Inventor： Cheol-Jung Kim ,  Kwang-Suk Kim

IPC: G01J1/06 ,  G01J1/42 ,  G01J1/28 ,  G01J3/46

CPC classification number: G01J1/42 ,  G01J1/06

Abstract: A method and system is disclosed in which the local variation of an extended radiation source is monitored with single-element detector. The chromatic aberration of the imaging optics induces the different transmittance curves for different wavelengths, and the different shape in the transmittance curve is used as a spatial filter which is multiplied to the chromatic intensity profile of the extended radiation source to detect the local variation in the intensity profile of the extended radiation source. The signal processing of the chromatic signals is implemented to detect the size variation and the environmental effects on the extended radiation source. A fiber is also used for remote operation.

Abstract translation: 公开了一种方法和系统，其中利用单元件检测器监测扩展辐射源的局部变化。 成像光学器件的色差引起不同波长的不同透射率曲线，并且将透射率曲线中的不同形状用作空间滤波器，该空间滤波器与扩展辐射源的色度分布相乘以检测扩展辐射源中的局部变化 扩展辐射源的强度分布。 实施彩色信号的信号处理以检测尺寸变化和对扩展辐射源的环境影响。 光纤也用于远程操作。

公开(公告)号：US5275629A

公开(公告)日：1994-01-04

申请号：US762355

申请日：1991-09-19

Applicant: Natsuo Ajika ,  Masahiro Shimizu ,  Takehisa Yamaguchi

Inventor： Natsuo Ajika ,  Masahiro Shimizu ,  Takehisa Yamaguchi

IPC: G01J1/28 ,  C23C16/48 ,  H01L21/00 ,  H01L21/205 ,  H01L21/285 ,  H01L21/302 ,  H01L21/3065 ,  H01L21/31 ,  H01L21/66 ,  C23C16/00

CPC classification number: H01L21/67115 ,  C23C16/481 ,  Y10T29/41

Abstract: A semiconductor device manufacturing apparatus has a first space and a second space in a process chamber in which a semiconductor wafer is accommodated, the first and second spaces being separated by the semiconductor wafer. A process gas port opens into the first space adjacent to the obverse surface of the semiconductor wafer, and an infrared light transmission window is formed in a wall of the chamber at the second space facing the reverse surface of the semiconductor wafer. No layers are deposited on the reverse surface of the semiconductor wafer and the infrared light transmission window so that the emissivity at the reverse surface of the semiconductor wafer is not changed during layer deposition. The temperature during processing can therefore be monitored accurately with a pyrometer, and a reduction in the transmissivity of the window is prevented.

Abstract translation: 半导体器件制造装置在其中容纳有半导体晶片的处理室中具有第一空间和第二空间，第一和第二空间被半导体晶片隔开。 处理气体通道向与半导体晶片的正面相邻的第一空间开口，并且在面向半导体晶片的背面的第二空间处，在室的壁上形成红外光透射窗。 在半导体晶片和红外光透射窗的反面上没有层沉积，使得在层沉积期间半导体晶片的反面的发射率不变。 因此，可以用高温计精确地监测加工过程中的温度，并且防止窗口的透射率的降低。

公开(公告)号：US4691105A

公开(公告)日：1987-09-01

申请号：US740798

申请日：1985-06-03

Applicant: Norman P. Huffnagle

Inventor： Norman P. Huffnagle

IPC: F42C13/02 ,  G01J1/28

CPC classification number: F42C13/02 ,  Y10S250/01

Abstract: A proximity sensor comprising a thermal detector responding to the rate of change of a thermal input and connected to circuitry for performing a control function when the detector output becomes zero, which occurs when a target being approached by the detector fills the field of view of the detector.

Abstract translation: 一种接近传感器，其包括响应于热输入的变化率并且连接到电路的热检测器，所述热检测器在检测器输出变为零时执行控制功能，当检测器接近目标时，该检测器填充了视场 探测器。

公开(公告)号：US3205796A

公开(公告)日：1965-09-14

申请号：US23208962

申请日：1962-10-22

Applicant: EASTMAN KODAK CO

Inventor： ERNST LIESER

IPC: G01J1/04 ,  G01J1/06 ,  G01J1/28 ,  G01J1/42

CPC classification number: G01J1/04 ,  G01J1/0437 ,  G01J1/0448 ,  G01J1/06 ,  G01J1/28 ,  G01J1/4214

公开(公告)号：US3058389A

公开(公告)日：1962-10-16

申请号：US51997655

申请日：1955-07-05

Applicant: MORROW PRODUCTS INC

Inventor： MORROW ROBERT D

IPC: G01J1/28

CPC classification number: G01J1/28