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    METHOD FOR PERFORMING A MAGNETIC SEPARATION PROCEDURE
    32.
    发明申请
    METHOD FOR PERFORMING A MAGNETIC SEPARATION PROCEDURE 有权

    公开(公告)号：US20230095546A1

    公开(公告)日：2023-03-30

    申请号：US18061995

    申请日：2022-12-05

    Applicant: GEN-PROBE INCORPORATED

    Inventor： Christopher B. DAVIS ,  Norbert D. HAGEN ,  James T. TUGGLE

    IPC: B01L3/00 ,  G01N35/00 ,  B03C1/033 ,  B03C1/28 ,  B65B3/04 ,  B03C1/12 ,  B03C1/14 ,  B01L9/00 ,  B25J11/00 ,  C12N15/10

    Abstract: A method for performing a magnetic separation procedure that includes transporting a receptacle containing a fluid medium to a first location of a system, where the fluid medium contains both a sample material and a suspension of magnetically-responsive solid supports. At the first location, the fluid medium is exposed to a first magnetic field for a first dwell period, thereby isolating the solid supports within the receptacle, where no portion of the fluid medium is removed from the receptacle at the first location. The receptacle is then transported from the first location to a second location of the system, where the fluid medium is exposed to a second magnetic field for a second dwell period. Following the second dwell period, at least a portion of the fluid medium is removed from the receptacle. A suspension fluid is then dispensed into the receptacle, and the contents of the receptacle are agitated to suspend the solid supports within the suspension fluid.

    ASSEMBLY HAVING REAGENT PACK LOADING STATION
    33.
    发明申请
    ASSEMBLY HAVING REAGENT PACK LOADING STATION 有权

    公开(公告)号：US20220364153A1

    公开(公告)日：2022-11-17

    申请号：US17877832

    申请日：2022-07-29

    Applicant: Gen-Probe Incorporated

    Inventor： David A. BUSE ,  Norbert D. HAGEN ,  David OPALSKY

    IPC: C12Q1/6806 ,  G01N35/04 ,  B01L3/00 ,  B01L7/00 ,  C12Q1/686

    Abstract: An assembly includes a bracket, a magnetic elution slot, and a reagent pack loading station. The elution slot receives a multiple receptacle device having multiple receptacles interconnected by a connecting rib defining shoulders along either side of the receptacle device. The elution slot includes opposed walls attached to the bracket below a top surface of the bracket with the opposed walls disposed on either side of a slot formed in the bracket. The downwardly facing shoulders of the receptacle device are supported on the top surface of the bracket on opposed sides of the slot, and one or more magnets are attached to or embedded in one or both walls. The reagent pack loading station holds a multi-well reagent pack such that the wells of the reagent pack are accessible by a pipettor, and the reagent pack holding station includes spaced apart hold down features extending above the top surface of the bracket.

    INDEXING SIGNAL DETECTING MODULE
    35.
    发明申请
    INDEXING SIGNAL DETECTING MODULE 有权

    公开(公告)号：US20210157060A1

    公开(公告)日：2021-05-27

    申请号：US17144880

    申请日：2021-01-08

    Applicant: Gen-Probe Incorporated

    Inventor： Norbert D. HAGEN ,  David OPALSKY

    IPC: G02B6/36 ,  G02B6/06 ,  G02B6/08 ,  G01N21/25 ,  G01N21/64 ,  G02B6/42

    Abstract: An apparatus for detecting an emission signal from each of a plurality of emission signal sources includes one or more excitation sources configured to generate an excitation light of an excitation wavelength and one or more associated emission detectors configured to detect light of an emission wavelength. A transmission fiber is associated with each of the emission signal sources. A carrier is configured to move the one or more excitation sources and the one or more emission detectors relative to the transmission fibers to sequentially place each emission detector and associated excitation source in an operative position with respect to each transmission fiber. Each transmission fiber transmits both the excitation light from the excitation source and the corresponding emission light to the associated emission detector.

    SYSTEM FOR PERFORMING A MAGNETIC SEPARATION PROCEDURE
    37.
    发明申请
    SYSTEM FOR PERFORMING A MAGNETIC SEPARATION PROCEDURE 审中-公开

    公开(公告)号：US20200030805A1

    公开(公告)日：2020-01-30

    申请号：US16400752

    申请日：2019-05-01

    Applicant: GEN-PROBE INCORPORATED

    Inventor： Christopher B. DAVIS ,  Norbert D. HAGEN ,  James T. TUGGLE

    IPC: B01L3/00 ,  G01N35/00 ,  B03C1/033 ,  B03C1/28 ,  B65B3/04 ,  B03C1/12 ,  B03C1/14 ,  B01L9/00 ,  B25J11/00 ,  C12N15/10

    Abstract: A system for separating an analyte from other components of a sample includes a receptacle holding station and a magnetic separation station. The receptacle holding station includes one or more stationary, permanent magnets positioned to apply a magnetic field to the contents of a receptacle held stationary within the receptacle holding station. The magnetic separation station includes one or more permanent magnets and is configured to perform a magnetic separation procedure on the contents of a receptacle transported from the receptacle holding station to the magnetic separation station. The magnetic separation procedure includes isolating an analyte immobilized on a magnetically-responsive solid support within the receptacle and removing other components of the sample from the receptacle. The magnetic separation station is configured to provide relative movement between the receptacle and the one or more permanent magnets after the receptacle is transported to the magnetic separation station.

    SYSTEMS AND METHODS FOR PERFORMING ASSAYS
    38.
    发明申请
    SYSTEMS AND METHODS FOR PERFORMING ASSAYS 审中-公开

    公开(公告)号：US20180298426A1

    公开(公告)日：2018-10-18

    申请号：US16011229

    申请日：2018-06-18

    Applicant: GEN-PROBE INCORPORATED

    Inventor： David A. BUSE ,  David OPALSKY ,  Jason F. RHUBOTTOM ,  Norbert D. HAGEN ,  Jennifer L. TIDD

    IPC: C12Q1/6806 ,  C12Q1/686 ,  B01L7/00 ,  G01N35/04 ,  B01L3/00

    Abstract: A processing module is configured to extend the capabilities of an analyzer configured to process substances within each of a plurality of receptacles. The module includes a container transport configured to transport a container from a location within the processing module to a location within the analyzer that is accessible to a substance transfer device of the analyzer. A receptacle distribution system is configured to receive a receptacle from the analyzer, transfer the receptacle into the processing module, and to move the receptacle between different locations within the analyzer. A substance transfer device of the module is configured to dispense substances into or remove substances from the receptacle within the processing module. A reagent card exchanger provides an input device for inserting reagent cards into and removing reagent cards from the module, stores reagent cards within the module, and transfers reagent cards to different location within the module.

    SAMPLE TESTING SYSTEMS AND METHODS WITH AUTOMATED CLEANING
    40.
    发明申请
    SAMPLE TESTING SYSTEMS AND METHODS WITH AUTOMATED CLEANING 有权
    样品测试系统和自动清洗方法

    公开(公告)号：US20160299056A1

    公开(公告)日：2016-10-13

    申请号：US15094227

    申请日：2016-04-08

    Applicant: GEN-PROBE INCORPORATED

    Inventor： Norbert D. HAGEN ,  Byron J. KNIGHT ,  David OPALSKY

    IPC: G01N21/15 ,  G01N35/00

    CPC classification number: G01N21/15 ,  B08B1/00 ,  B08B9/00 ,  B08B2240/02 ,  G01N35/00623 ,  G01N35/00871 ,  G01N35/0092 ,  G01N35/0099 ,  G01N2021/152 ,  G01N2035/00277 ,  G02B6/3866

    Abstract: A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member.

    Abstract translation: 样品测试系统包括测试容器支撑结构，光学元件，定位成用于传送由设置在由测试插座支撑结构支撑的测试插座中的样本发射或反射的电磁辐射，清洁部件和自动化传输臂， i）可拆卸地联接清洁构件，（ii）将可拆卸地联接的清洁构件移动到靠近和/或接触光学元件的位置，以及（iii）将清洁构件分离。

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