公开(公告)号：US08901477B2

公开(公告)日：2014-12-02

申请号：US13614431

申请日：2012-09-13

Applicant: Kazunori Shiota ,  Akiyoshi Irisawa

Inventor： Kazunori Shiota ,  Akiyoshi Irisawa

IPC: G01J1/04 ,  G01J1/42 ,  G01J5/08 ,  G02F1/35 ,  G01J9/02 ,  G01J9/04 ,  G01J11/00 ,  G02B6/34

CPC classification number: G02F1/3534 ,  G01J9/02 ,  G01J9/04 ,  G01J11/00 ,  G02B6/34 ,  G02F1/3544

Abstract: According to the present invention, an electromagnetic wave detection device includes an optical waveguide, an electromagnetic wave input unit, and a phase difference measurement unit. According to the thus constructed electromagnetic wave detection device, an optical waveguide is a nonlinear crystal, and includes a branching portion for receiving a probe light pulse, and causing the probe light pulse to branch into two beams of branching light, and two branching light transmission portions for receiving the branching light from the branching portion, and transmitting the branching light. An electromagnetic wave input unit inputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] tilted by an angle generating Cherenkov phase matching with respect to a travel direction of the branching light into one of the two branching light transmission portions.

Abstract translation: 根据本发明，电磁波检测装置包括光波导，电磁波输入单元和相位差测量单元。 根据这样构成的电磁波检测装置，光波导是非线性晶体，并且包括用于接收探测光脉冲的分支部分，并使探测光脉冲分支成两束分支光，以及两个分支光透射 用于从分支部分接收分支光并传送分支光的部分。 一个电磁波输入单元输入一个频率等于或大于0.01 [THz]并且等于或小于100 [THz]的频率的电磁波，其倾斜角相对于分支光的行进方向产生切伦科夫相位匹配的角度进入 两个分支光透射部分中的一个。

公开(公告)号：US20140285085A1

公开(公告)日：2014-09-25

申请号：US14354942

申请日：2012-08-07

Applicant: Katsuyuki Kinoshita

Inventor： Katsuyuki Kinoshita

IPC: H01J31/42 ,  H01J29/08

CPC classification number: H01J31/42 ,  G01J11/00 ,  G01J2011/005 ,  H01J29/08 ,  H01J29/74 ,  H01J29/92 ,  H01J31/50

Abstract: A steak tube has a container with an entrance plate and an output plate, a photocathode disposed in the container and configured to emit electrons according to light to be measured, the light having been incident through the entrance plate, and a sweep electrode disposed in the container, having a pair of deflection plates for generating an electric field and a connection lead connected to each deflection plate, and configured to sweep the electrons in a sweep direction along the output plate. An opposing of edges of the deflection plate in a direction of the output plate are formed so as to extend in a direction from the entrance plate to the output plate, the connection lead has a first connection portion electrically connected to the deflection plate, and the first connection portion is connected to the opposing of edges.

Abstract translation: 牛排管具有容器，该容器具有入口板和输出板，光电阴极设置在容器中并且被配置为根据被测量的光发射电子，入射到入射板的光和设置在其中的扫掠电极 容器，具有用于产生电场的一对偏转板和连接到每个偏转板的连接引线，并且被配置为沿着输出板沿扫掠方向扫掠电子。 沿着输出板的方向偏转板的边缘相对地形成为从从入口板向输出板的方向延伸，连接引线具有电连接到偏转板的第一连接部分，并且 第一连接部分连接到边缘的相对侧。

公开(公告)号：US20140176183A1

公开(公告)日：2014-06-26

申请号：US14012668

申请日：2013-08-28

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Herschel A. Ainspan ,  SEONGWON KIM ,  FRANCO STELLARI ,  ALAN J. WEGER

IPC: G01R31/26 ,  H03K19/094

CPC classification number: H04N17/002 ,  G01J1/44 ,  G01J11/00 ,  G01J2001/4238 ,  G01R31/26 ,  H03K19/094 ,  H03K19/14

Abstract: PICA test circuits are shown that include a first transistor and a second transistor laid out drain-to-drain, such that a gap between respective drain regions of the first and second transistors has a minimum size allowed by a given fabrication technology.

Abstract translation: 示出了PICA测试电路，其包括布置在漏极到漏极的第一晶体管和第二晶体管，使得第一和第二晶体管的各个漏极区之间的间隙具有由给定制造技术允许的最小尺寸。

公开(公告)号：US08706437B2

公开(公告)日：2014-04-22

申请号：US13123497

申请日：2009-10-12

Applicant: Ian Alexander Walmsley ,  Brian John Smith ,  Jeffrey Stephen Lundeen ,  Peter James Mosley ,  Graciana Puentes ,  Hendrik Bernd Coldenstrodt-Ronge ,  Nicholas Lloyd Thomas-Peter ,  Andrew Philip Worsley

Inventor： Ian Alexander Walmsley ,  Brian John Smith ,  Jeffrey Stephen Lundeen ,  Peter James Mosley ,  Graciana Puentes ,  Hendrik Bernd Coldenstrodt-Ronge ,  Nicholas Lloyd Thomas-Peter ,  Andrew Philip Worsley

IPC: G06F19/00

CPC classification number: G01J11/00

Abstract: A method of calibrating an optical detector arrangement (38,42) comprises simultaneously generating a plurality of entangled photon pairs, such that one photon from each pair traverses a first path (36-38-42) and the other photon from each pair traverses a second path (36-40-44). The number of photons received along the first path is calculated using the detector arrangement (38,42), while the number of simultaneously-generated photons received along the second path is calculated using a second detector arrangement (40,44). These photon numbers are used to calculated an estimate of the detection efficiency (50) of the first detector arrangement (38,42).

Abstract translation: 校准光学检测器装置（38,42）的方法包括同时产生多个纠缠的光子对，使得每一对的一个光子穿过第一路径（36-38-42），并且来自每一对的另一个光子穿过一个 第二路（36-40-44）。 使用检测器装置（38,42）计算沿着第一路径接收的光子的数量，而使用第二检测器装置（40,44）计算沿着第二路径接收的同时生成的光子的数量。 这些光子数用于计算第一检测器装置（38,42）的检测效率（50）的估计。

公开(公告)号：US08644356B2

公开(公告)日：2014-02-04

申请号：US13611271

申请日：2012-09-12

Applicant: Lawrence Shah ,  James M. Bovatsek ,  Alan Y. Arai ,  Tadashi Yamamoto ,  Rajesh S. Patel ,  Donald J. Harter

Inventor： Lawrence Shah ,  James M. Bovatsek ,  Alan Y. Arai ,  Tadashi Yamamoto ,  Rajesh S. Patel ,  Donald J. Harter

IPC: H01S3/10

CPC classification number: H01S3/10038 ,  G01J11/00 ,  H01S3/0014 ,  H01S3/005 ,  H01S3/0057 ,  H01S3/0064 ,  H01S3/0078 ,  H01S3/06754 ,  H01S3/10023 ,  H01S3/10061 ,  H01S3/102 ,  H01S3/1024 ,  H01S3/108 ,  H01S3/109 ,  H01S3/1305 ,  H01S3/1618

Abstract: A femtosecond laser based laser processing system having a femtosecond laser, frequency conversion optics, beam manipulation optics, target motion control, processing chamber, diagnostic systems and system control modules. The femtosecond laser based laser processing system allows for the utilization of the unique heat control in micromachining, and the system has greater output beam stability, continuously variable repetition rate and unique temporal beam shaping capabilities.

Abstract translation: 飞秒激光激光处理系统，具有飞秒激光，变频光学，光束操纵光学，目标运动控制，处理室，诊断系统和系统控制模块。 基于飞秒激光的激光加工系统允许在微加工中利用独特的热控制，并且该系统具有更大的输出光束稳定性，连续可变的重复率和独特的时间波束整形能力。

公开(公告)号：US20130278285A1

公开(公告)日：2013-10-24

申请号：US13452092

申请日：2012-04-20

Applicant: HERSCHEL A. AINSPAN ,  SEONGWON KIM ,  FRANCO STELLARI ,  ALAN J. WEGER

Inventor： HERSCHEL A. AINSPAN ,  SEONGWON KIM ,  FRANCO STELLARI ,  ALAN J. WEGER

IPC: H03K19/00 ,  H03K19/094

CPC classification number: H04N17/002 ,  G01J1/44 ,  G01J11/00 ,  G01J2001/4238 ,  G01R31/26 ,  H03K19/094 ,  H03K19/14

Abstract: PICA test circuits are shown that include a first transistor and a second transistor laid out drain-to-drain, such that a gap between respective drain regions of the first and second transistors has a minimum size allowed by a given fabrication technology; a first NOR gate having an output connected to the drain region of the first transistor and accepting a first select signal and an input signal; and a second NOR gate having an output connected to the drain region of the second transistor and accepting a second select signal and the input signal. One of said NOR gates biases the connected transistor's drain region, according to the select signal of said NOR gate, to inhibit an optical emission when said connected transistor is triggered.

Abstract translation: 显示了PICA测试电路，其包括第一晶体管和布置为漏极到漏极的第二晶体管，使得第一和第二晶体管的各个漏极区之间的间隙具有由给定制造技术允许的最小尺寸; 第一或非门，其输出连接到第一晶体管的漏极区，并接受第一选择信号和输入信号; 以及第二或非门，其输出连接到第二晶体管的漏极区，并接受第二选择信号和输入信号。 所述或非门之一根据所述或非门的选择信号偏置所连接的晶体管的漏极区，以在所述连接的晶体管被​​触发时抑制光发射。

公开(公告)号：US20130075610A1

公开(公告)日：2013-03-28

申请号：US13372466

申请日：2012-02-13

Applicant: Liejia Qian ,  Yongzhi Wang ,  Peng Yuan ,  Jingui Ma ,  Guoqiang Xie

Inventor： Liejia Qian ,  Yongzhi Wang ,  Peng Yuan ,  Jingui Ma ,  Guoqiang Xie

IPC: G01J5/00

CPC classification number: G01J11/00

Abstract: A high-fidelity device for single-shot pulse contrast measurement based on quasi-phase-matching includes a generating unit of sampling pulse, a high-fidelity cross-correlation unit of nonlinear SFG and a high-sensitivity signal detecting unit. An innovatively designed dot-mirror or dot-attenuator and correlating crystal. The dot-mirror or dot-attenuator is adopted to suppress the scattering noise, which is mainly induced by air scattering of the main peak of the correlation beam, to a level below the real pulse background. While the crystal is introduced into the device as a nonlinear correlation crystal to move two kinds of artifacts introduced by a correlation process respectively out of the temporal window and behind the main pulse, so that effects of the artifacts on measurement results are removed and the single-shot measurement of the contrast in a pulse leading edge is accomplished, without obviously affecting other parameters. The device is also fit for measuring contrasts of high-power lasers of various wavelengths.

Abstract translation: 基于准相位匹配的单次脉冲对比度测量的高保真装置包括采样脉冲的产生单元，非线性SFG的高保真互相关单元和高灵敏度信号检测单元。 创新设计的点镜或点衰减器和相关晶体。 采用点镜或点衰减器将主要由相关光束主峰引起的散射噪声抑制在低于实脉冲背景的水平。 当将晶体作为非线性相关晶体引入器件时，将相关过程引入的两种伪像分别从时间窗口和主脉冲之后移动，从而消除伪像对测量结果的影响，单个 实现脉冲前沿中对比度的快速测量，而不会明显影响其他参数。 该器件还适用于测量各种波长的大功率激光器的对比度。

公开(公告)号：US08189190B2

公开(公告)日：2012-05-29

申请号：US11848886

申请日：2007-11-02

Applicant: Dennis R. Alexander

Inventor： Dennis R. Alexander

IPC: G01J3/18

CPC classification number: G01J11/00 ,  G01J3/4412 ,  G01N21/636

Abstract: Systems and methods are provided for monitoring materials using ultra fast laser pulses. Ultra fast laser pulses, such as femtosecond or attosecond laser pulses, are applied to the materials and laser pulses that result from interactions between the ultra fast laser pulses and the materials are collected. Spectral content of the resulting pulses is generated and presented. The elemental composition of the materials is determined using the spectral content.

Abstract translation: 提供了使用超快激光脉冲监测材料的系统和方法。 将超快激光脉冲（例如飞秒或阿秒激光脉冲）施加到材料上，并且通过收集超快激光脉冲和材料之间的相互作用而产生的激光脉冲。 产生和呈现所得脉冲的光谱内容。 使用光谱含量确定材料的元素组成。

公开(公告)号：US08183514B2

公开(公告)日：2012-05-22

申请号：US12550895

申请日：2009-08-31

Applicant: Hiroyasu Fujiwara ,  Tadashi Kawazoe ,  Motoichi Ohtsu

Inventor： Hiroyasu Fujiwara ,  Tadashi Kawazoe ,  Motoichi Ohtsu

IPC: H03F3/08 ,  G02F1/35

CPC classification number: G01J11/00

Abstract: A signal waveform measuring apparatus 1A is configured from: a signal optical system 11, a reference optical system 16, a time difference setting unit 12 setting a time difference between signal light L1 and reference light L2, a wavelength conversion element 20 including an aggregate of crystals of a dye molecule and generating converted light L5, which has been wavelength-converted to a shorter wavelength than incident light made incident on the crystal aggregate, at an intensity proportional to an r-th power (r>1) of the intensity of the incident light, a photodetector 30 detecting the converted light L5, generated at the element 20 at the intensity that is in accordance with the intensity of the signal light L1, the intensity of the reference light L2, and the time difference between the two, and a signal waveform analyzer 40 performing analysis of the detection result of the converted light L5 and thereby acquiring a time waveform of the signal light L1. A signal waveform measuring apparatus and a measuring method that enable a time waveform of signal light to be measured with good precision by a simple configuration are thereby realized.

Abstract translation: 信号波形测量装置1A由信号光学系统11，参考光学系统16，设置信号光L1和参考光L2之间的时间差的时差设定单元12构成，波长转换元件20包括 并且以与入射到晶体聚集体上的入射光波长转换为更短波长的转换光L5的强度成比例的第r次幂（r> 1） 入射光，检测在元件20处以与信号光L1的强度相关的强度，参考光L2的强度和两者之间的时间差产生的转换光L5的光电检测器30， 以及信号波形分析器40，对转换光L5的检测结果进行分析，从而获取信号光L1的时间波形。 从而实现了通过简单的结构实现以高精度测量信号光的时间波形的信号波形测量装置和测量方法。

公开(公告)号：US20120057153A1

公开(公告)日：2012-03-08

申请号：US13294929

申请日：2011-11-11

Applicant: Prakash Kasturi ,  Adrian Nastase

Inventor： Prakash Kasturi ,  Adrian Nastase

IPC: G01J1/42

CPC classification number: G01J1/02 ,  G01J1/0219 ,  G01J1/0228 ,  G01J1/0271 ,  G01J1/08 ,  G01J1/4257 ,  G01J11/00

Abstract: Machines and methods measure an unknown characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the unknown characteristic based on the comparison of the output signal and the computationally determined response of the detector. Another method receives an output signal from an optical detector detecting one or more optical signals, accesses a predetermined characteristic curve of detector response, compares the output signal from the detector to the predetermined characteristic curve of detector response, and calculates at least one unknown characteristic of one or more optical signals based on results of the comparing step.

Abstract translation: 机器和方法测量入射在由一个或多个动态响应参数表征的检测器上的光信号的未知特性。 一种方法从检测器接收输出信号，并将该输出信号和检测器的计算确定响应与入射到检测器上的已知光信号进行比较。 所述响应基于所述一个或多个动态参数。 该方法基于输出信号与检测器的计算确定响应的比较来确定未知特性。 另一种方法从检测一个或多个光信号的光检测器接收输出信号，访问检测器响应的预定特性曲线，将来自检测器的输出信号与检测器响应的预定特性曲线进行比较，并计算至少一个未知特性 基于比较步骤的结果的一个或多个光信号。