Abstract:
Disclosed herein is an apparatus for and method of measuring bio-chips, which can implement an illumination method of a novel type that illuminates a bio sample (which may be also referred to as a “bio specimen”) through a side face of a substrate using a diffusion plate to form an evanescent field by the illumination light over the entire surface of a substrate so as to uniformly secure brightness of the illuminated light over a wide area of a substrate, thereby more efficiently measuring fluorescence information of a bio-chip over a wide field of view.
Abstract:
The present application provides a detection method of a crease degree of a screen and a visual detection device, the detection method includes: providing detection rays, and obliquely irradiating the detection rays onto a surface to be measured of the screen; acquiring detection rays reflected by the surface to be measured of the screen to obtain a corresponding light source reflection image; analyzing the light source reflection image to obtain deformation curvatures of the light source reflection image and taking one of a maximum deformation curvature and an average deformation curvature that are obtained through the deformation curvatures as an evaluation index of a crease degree of the screen; and evaluating the crease degree of the screen.
Abstract:
A data acquisition apparatus includes a light source, a first beam splitter, a predetermined beam splitter, a first light deflector, a second light deflector, a first measuring unit, a second measuring unit, a second beam splitter, and a photodetector. A second measurement optical path is positioned in a first direction and a reference optical path is positioned in a second direction. The predetermined beam splitter is disposed in the second measurement optical path or the reference optical path. A first measurement optical path is positioned between the predetermined beam splitter and the photodetector. The first light deflector and the first measuring unit are disposed in the first measurement optical path, and the second light deflector and the second measuring unit are disposed in the second measurement optical path. The first measurement optical path and the second measurement optical path intersect.
Abstract:
An image capture device may include a first spectral filter and a second spectral filter arranged so that a panoramic image capture operation captures light filtered by the first spectral filter and light filtered by the second spectral filter in a same region of a combined image and one or more processors to: capture a plurality of images based on the panoramic image capture operation; extract first information and second information from the plurality of images, wherein the first information is associated with the first spectral filter and the second information is associated with the second spectral filter; identify an association between the first information and the second information based on a feature captured in the plurality of images via the first spectral filter and the second spectral filter; and store or provide information based on the association between the first information and the second information.
Abstract:
The present invention relates, in part, to systems for characterizing force (e.g., friction, wear, and/or torque). In one embodiment, the system allows for wear testing of samples in a high throughput manner. In another embodiment, the system allows for torque sensing in a non-contact manner.
Abstract:
Apparatus and methods relating to photonic bandgap optical nanostructures are described. Such optical nanostructures may exhibit prohibited photonic bandgaps or allowed photonic bands, and may be used to reject (e.g., block or attenuate) radiation at a first wavelength while allowing transmission of radiation at a second wavelength. Examples of photonic bandgap optical nanostructures includes periodic and quasi-periodic structures, with periodicity or quasi-periodicity in one, two, or three dimensions and structural variations in at least two dimensions. Such photonic bandgap optical nanostructures may be formed in integrated devices that include photodiodes and CMOS circuitry arranged to analyze radiation received by the photodiodes.
Abstract:
A confocal chromatic device is provided, including at least one chromatic lens with an extended axial chromatism; at least one broadband light source; at least one optical detector; and at least one measurement channel with a planar Y-junction made with a planar waveguide optics technology, and arranged for transferring light from the at least one light source towards the at least one chromatic lens and for transferring light reflected back through the at least one chromatic lens towards the at least one optical detector.
Abstract:
A polarized light imaging apparatus for separating light from a superficial single-scattering layer of a sample and its deeper diffuse layer as a function of space is disclosed. The apparatus has a light source for producing light beams; an illumination optic coupled to the light source for guiding the light beams towards the sample; a linear polarizer coupled to the illumination optic; a non-total internal reflection (TIR) birefringent polarizing prism (BPP) communicatively coupled to the sample to maximize a refraction difference between ordinary waves and extraordinary waves of light returning from the sample; and a detection optic unit coupled to the non-TIR BPP for guiding the light waves returning from the sample towards a single polarization sensitive sensor element.
Abstract:
A method for detecting a clarity of a transparent display panel and a detecting apparatus thereof are provided. The detecting method includes: detecting directly a reference pattern sheet by a measuring device to obtain a without-panel measurement value of the reference pattern sheet; placing the transparent display panel between the measuring device and the reference pattern sheet; detecting the reference pattern sheet through the transparent display panel to obtain a with-panel measurement value of the reference pattern sheet; acquiring clarity of the transparent display panel according to the without-panel and with-panel measurement value; wherein, the reference pattern sheet includes a plurality of pattern groups sequentially arranged in a first direction, each of which includes a first region and a second region, and widths of the plurality of pattern groups in the first direction are different. The detecting method can better evaluate a transparent effect of the transparent display panel.
Abstract:
Provided is an aperture-plate drive mechanism including an aperture-plate open-close mechanism and a rotation mechanism for rotating the open-close mechanism. The open-close mechanism includes: drive blocks 308 fixed to a pair of aperture plates 301; a linear motion guide 306 allowing the drive blocks to move along an axis; a feed screw 302 parallel to the axis, on which a pair of helical threads proceedimg in opposite directions formed; nut members 305 each of which is provided in a manner to be engaged with one of the pair of helical threads and is prevented from rotating due to a rotation of the feed screw; an urging member 309 for pressing the drive blocks onto the nut members, respectively; and a distance adjustment member 310 placed between one drive block and the corresponding nut member, for adjusting the distance between them. With this mechanism, a discrepancy between the open-close center of the aperture plates from the rotation center can be cancelled even after the mechanism is assembled.