Abstract:
Firstly, a powder matrix is kept in a fluent state, said powder matrix consisting of a first oxide having an absorbed water amount of 0.1 to 50%, an averaged particle diameter of 0.005 to 0.5 &mgr;m and a surface hydroxyl group number of 0.1 to 25 &mgr;mol/m2. Then, one or both of a halide and an alkoxide including metal or semi-metal identical with or different from the metal or semi-metal constituting said first oxide is allowed to contact with said powder matrix kept in the fluent state, by means of an inert carrier gas, and then they are heated at a temperature of from 25 to 800° C., to thereby coat said powder matrix by a coating layer consisting of a second oxide. Further, a reaction by-product consisting of one or both of a hydrogen halide or an alcohol generated by said contacting is heated at a temperature of from 200 to 1000° C. within the inert carrier gas to thereby eliminate the reaction by-product.
Abstract:
A probe whose characteristic impedance can be accurately adjusted to a desired value with the production of a small number of prototypes. The probe includes a first line with a signal terminal to be connected to a signal electrode of a circuit to be measured and at least one first region connected to the signal terminal and to which one end of a chip capacitor is connected, a second line connected to a terminal of the first line and a junction to be connected to a measuring instrument at the remaining terminal, and an impedance matched to a characteristic impedance of the measuring instrument, a ground connector with a ground terminal to be connected to the ground electrode of the circuit to be measured, and at least one second region connected to the ground terminal and on which the remaining terminal of the chip capacitor is mounted in one-to-one correspondence with the first region. The impedance of the probe viewed from the circuit to be measured is provided by the chip capacitor mounted at specified positions within the first region and the second region.
Abstract:
A scanning probe microscope for scanning a probe needle in proximity to a surface of a sample in XY-axis directions while moving at least one of the probe and the sample in a Z-axis direction has a plurality of band-pass filters for passing a plurality of band-pass signals by extracting predetermined frequency bands different one another from a surface geometry signal output by a probe. An image memory stores the respective band-pass signals and corresponding positions on the sample surface, and a color image outputting device outputs a color image by treating each of the respective band-pass signals stored as image data in the image memory as different color data and combining the data. The plurality of band-pass signals includes a first band-pass signal having a first frequency range set to include only abrupt transitions in the sample surface and a second band-pass signal having a second frequency range set to include frequencies slightly outside the first frequency range so that abrupt transitions in geometry on the sample surface are represented by a first color in response to the first band-pass signal and areas directly adjacent the abrupt transitions on the sample surface are represented by a second color different from the first color.
Abstract:
The invention provides an image color correction apparatus by which a hue in a desired region in a color image can be corrected to a desired hue readily. Based on a hue and a hue range designated, a color approximation degree hx of each of noticed pixels of input pixels of an input signal is calculated, where HSV values are represented by (h1, s1, v1), in accordance with hx=((m−|Hue−h1|)/m)×s1×v1, and where correction coefficients of color signals R, G and B of each of the input pixels are represented by (a1, a2, a3), the color signals (R, G, B) are corrected to (R′, G′, B′) so that the corrected color signals (R′, G′, B′) may satisfy (R′, G′, B′)=(R, G, B)+hx×(a1, a2, a3).
Abstract:
A semiconductor device includes a semiconductor substrate having a first main surface and a second main surface opposite the first main surface; a semiconductor chip amplifying a high frequency signal and including semiconductor cells on the first main surface, each semiconductor cell including semiconductor components and being connected to a gate pad and a drain pad, each semiconductor component having an electrode; internal matching circuits; a harmonic matching circuit for each semiconductor cell and connected between the semiconductor chip and one of the internal matching circuits, the harmonic matching circuit including a capacitor and an inductor; and a package enclosing the semiconductor substrate, the semiconductor chip, the internal matching circuits, and the harmonic matching circuit. In this structure, since harmonics are processed in each semiconductor cell, the phases of the harmonics processed in the semiconductor cells are uniform. Losses caused by the characteristic of harmonic signals themselves and a phase difference due to transmission line differences between the harmonic matching circuit and the semiconductor chip are reduced, improving harmonic load impedance.
Abstract:
A spring is connected to an edge section of a sample side of a spindle receiving a force in the Z-axial direction by a first poise coil motor, and a probe is attached to the tip of the spring. The spindle is supported by an internal tube with a spring. The movement of the spindle is enlarged by the spring to be conveyed to the probe, whereby displacement of the probe is amplified. For this reason, a resonance frequency f0 of a system comprising the movable element of the first poise coil motor, spindle, spring, spring and probe can be increased. If the spring is changed to springs in two stages, a resonance frequency f0 of the system can be increased with comparatively compact configuration.
Abstract:
In an exposure precision tester for a camera, including a flexible wiring board where a photometric sensor is implemented is contained in a case. The case has an appearance similar to that of a film cartridge loaded by drop-in operation and is insertable into a film cartridge cell of the camera. Exposure test can be performed without a back lid because the photometric sensor measures and outputs the exposure energy in the state that the photometric sensor is positioned at a film mask portion by rotating an operation part of a feed shaft with the case being inserted in the camera.
Abstract:
A method of driving a liquid crystal that has a memory capability, wherein a reset voltage is initially applied to the liquid crystal during a reset period, to bring about a Freedericksz transition in the liquid crystal. During a subsequent selection period, a selection voltage that is selected on the basis of a critical value that brings about one of two metastable states in the liquid crystal is applied to the liquid crystal, and, during a non-selection period that follows the selection period, a non-selection voltage that is less than or equal to a threshold value that maintains two metastable states is applied to the liquid crystal. A delay period is provided between the reset period and the selection period, in order to gain effective timing for applying the selection voltage to the liquid crystal after the application of the reset voltage has been turned off. This shortens the length of the selection period, and hence the write time.
Abstract translation:一种驱动具有记忆能力的液晶的方法,其中在复位期间初始向液晶施加复位电压,从而在液晶中产生Fre + E,acu e + EE dericksz跃迁。 在随后的选择期间,基于在液晶中产生两个亚稳态之一的临界值选择的选择电压被施加到液晶,并且在选择之后的非选择期间 在液晶中施加小于或等于维持两个亚稳态的阈值的非选择电压。 在复位期间和选择期间之间设置延迟期间,以便在施加复位电压已经被关闭之后获得用于将选择电压施加到液晶的有效定时。 这缩短了选择周期的长度,从而缩短了写入时间。
Abstract:
An echo removing apparatus for reducing the echo caused by sound generated turning from a speaker round to a microphone of a small-sized sound generated communication terminal, such as a portable telephone. A speaker output signal X(k), sent from a terminal 11 to a speaker 12, is sent to a smoothed power value calculation circuit 21 of a tap coefficient estimation circuit 21 where a smoothed input signal power value Px(k), which is a smoothed version of the square sum values, is found and sent to a tap coefficient updating circuit 22. Using the smoothed input signal power value Px(k), the tap coefficient updating circuit 22 updates tap coefficients of a filter 15. The filter 15 filters the speaker output signal X(k) to output a pseudo echo signal which is sent to a subtractor 14 where it is subtracted from a microphone input signal collected by a microphone 13. The filter tap coefficients may be prohibited form being fluctuated and echo removing characteristics of the echo removing apparatus may be stabilized without increasing the processing volume for tap coefficient estimation.
Abstract:
The present invention is to provide a method for identifying an optical line easily and accurately regardless of the optical line length. A plurality of reflecting parts is placed on the optical line, and a combination of relative positions of the reflecting parts is changed for every optical line to form an identification code, and the relative positions of the reflecting parts are detected based on reflected lights when a detecting light is inputted to the optical line, so that the optical line is identified based on a result. Concretely, when the detecting light is inputted to one end of the optical line, the light is reflected at the plurality of the reflecting parts which form the identification code and comes back the input end. A combination of the relative positions etc. of the reflecting parts is changed for every optical line. To detect the relative positions of the reflecting parts which form the identification code, either the optical path difference of the reflected lights from the reflecting parts is measured or the time difference between the reflected lights come back from the reflecting parts is measured. Then, based on the result, the optical line can be identified.