Card Edge Connector Including A Flipped Pin Foot Orientation

    公开(公告)号:US20220021139A1

    公开(公告)日:2022-01-20

    申请号:US17483913

    申请日:2021-09-24

    Abstract: In one embodiment, a card edge connector includes a housing including a slot to receive a first circuit board. A first plurality of pins extend from within the slot through a bottom of the housing. Each of the first plurality of pins includes a first end to mate with a corresponding contact of the first circuit board and a second end to mate with a corresponding one of a first plurality of contacts of a second circuit board, the second end including a heel portion and a toe portion extending from the heel portion in a direction away from a centerline of the slot. A second plurality of pins extend from within the slot through the bottom of the housing. Each of the second plurality of pins includes a first end to mate with a corresponding contact of the first circuit board and a second end to mate with a corresponding one of a second plurality of contacts of the second circuit board, the second end comprising a heel portion and a toe portion extending from the heel portion in a direction toward the centerline of the slot. Other embodiments are described and claimed.

    Technologies for verifying a de-embedder for interconnect measurement

    公开(公告)号:US11169194B2

    公开(公告)日:2021-11-09

    申请号:US16799152

    申请日:2020-02-24

    Abstract: Technologies for verifying a de-embedder for interconnect measurement include a verification compute device. The verification compute device is to measure a first signal transmitted through a single device under test and measure a second signal transmitted through a duplicated set of devices under test. Each device under test in the duplicated set is substantially identical to the single device under test. Additionally, the verification compute device is to apply a de-embedder to the measured first signal to remove an effect of test fixtures on the measured first signal, apply the de-embedder to the measured second signal to remove the effect of the test fixtures on the measured second signal, concatenate the de-embedded first signal with itself to generate a concatenated de-embedded first signal, and compare the concatenated de-embedded first signal with the de-embedded second signal to determine whether the concatenated de-embedded first signal matches the de-embedded second signal.

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