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公开(公告)号：US4900150A
公开(公告)日：1990-02-13
申请号：US199858
申请日：1988-05-27
Applicant: David B. Hall
Inventor： David B. Hall
CPC classification number: H01S3/0014 , G01N21/41 , G01J2009/0207 , G01J9/04
Abstract: A variety of techniques for deriving cavity linewidth that share the use of multiple input sources of known frequency separation is disclosed allowing the measurement of resonator cavity linewidth. Among the techniques include a double peak ratio method for measuring cavity linewidth through use of a low pass filter. The double peak ratio method allows vertical measurements which are noise immune and independent of swept frequency errors as a method of determining cavity linewidth in a straightforward and accurate manner.
Abstract translation: 公开了用于导出共享使用已知频率分离的多个输入源的腔线宽度的各种技术，允许谐振腔腔线宽的测量。 这些技术包括通过使用低通滤波器来测量空腔线宽的双峰比方法。 双峰值比方法允许垂直测量，其是噪声免疫的，并且与扫频频率误差无关，作为以简单和准确的方式确定空腔线宽的方法。
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公开(公告)号：US4817101A
公开(公告)日：1989-03-28
申请号：US911842
申请日：1986-09-26
Applicant: Richard W. Wyeth , Jeffrey A. Paisner , Thomas Story
Inventor： Richard W. Wyeth , Jeffrey A. Paisner , Thomas Story
CPC classification number: H01S3/1394 , B01D59/34 , G01N21/39 , G02F2/002 , G01J9/04
Abstract: A heterodyne laser spectroscopy system utilizes laser heterodyne techniques for purposes of laser isotope separation spectroscopy, vapor diagnostics, processing of precise laser frequency offsets from a reference frequency and the like, and provides spectral analysis of a laser beam.
Abstract translation: 外差激光光谱系统利用激光外差技术用于激光同位素分离光谱学，蒸汽诊断，从参考频率等处理精确的激光频率偏移，并提供激光束的光谱分析。
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43.发明授权Differential plane mirror interferometer having beamsplitter/beam folder assembly 失效差分平面镜干涉仪具有分束器/光束夹组件
公开(公告)号：US4802764A
公开(公告)日：1989-02-07
申请号：US91354
申请日：1987-08-28
Applicant: Peter S. Young , Gary E. Sommargren
Inventor： Peter S. Young , Gary E. Sommargren
CPC classification number: G01B9/02018 , G01B9/02057 , G01J9/04 , G01B2290/70
Abstract: A differential plane mirror interferometer comprises a source (10) which emits a light beam containing two orthogonally polarized components of different frequencies; a source of a stabilized electrical reference signal (11) of a frequency corresponding to a difference frequency between the two components of the light beam; a beamsplitter/beam folder assembly (16, 16A) for converting the input beam into two separated, parallel, orthogonally polarized beams; a half-wave retardation plate (29A, 29) located in one of the separated beams to produce two separated parallel beams with the same polarization; means including a polarizing beamsplitter (44), for causing each of the separated parallel beams with the same polarization to be reflected twice by one of two plane mirrors (71, 70) to produce two parallel output beams with the same polarization; a half-wave retardation plate (29B, 29) located in one of the separated parallel output beams, with the beamsplitter/beam folder assembly (16, 16B) converting the two separated parallel orthogonally polarized output beams into a single output beam in which the phase difference between the two frequency components of the single output beam is directly proportional to the optical path length between the two plane mirrors (70, 71); a polarizer (81) for mixing the orthogonal components of the output beam; a photoelectric detector (83) to produce the measurement signal; and a phase/meter accumulator (90) to indicate the phase difference between the reference and measurement signals which is directly proportional to the changes in the optical path length between the two plane mirrors.
Abstract translation: 差分平面镜干涉仪包括发射包含不同频率的两个正交极化分量的光束的源（10）; 稳定的电参考信号源（11）的频率对应于光束的两个分量之间的差频; 用于将输入光束转换成两个分离的，平行的正交偏振光束的分束器/光束折叠组件（16,16A）; 位于所述分离光束之一中的半波延迟板（29A，29），以产生具有相同极化的两个分离的平行光束; 包括偏振分束器（44）的装置，用于使具有相同极化的每个分离的平行光束由两个平面镜（71,70）中的一个反射两次，以产生具有相同偏振的两个并行输出光束; 位于分离的平行输出光束之一中的半波延迟板（29B，29），分束器/光束折叠组件（16,16B）将两个分离的平行正交偏振输出光束转换为单个输出光束，其中 单个输出光束的两个频率分量之间的相位差与两个平面镜（70,71）之间的光程长度成正比; 偏振器（81），用于混合输出光束的正交分量; 光电检测器（83），用于产生测量信号; 以及相位/计量累加器（90），用于指示参考和测量信号之间的相位差，其与两个平面镜之间的光程长度的变化成正比。
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公开(公告)号：US4640615A
公开(公告)日：1987-02-03
申请号：US660923
申请日：1984-10-15
Applicant: Issei Sasaki
Inventor： Issei Sasaki
Abstract: A liquid refractometer comprising a light source unit, a probe unit and a detection unit. The light source unit generates a beam of polarized mixed light composed of two coherent light waves that have been linearly polarized in directions at right angles to each other. The probe unit contains a polarization separation portion, a sample holding portion, a reference portion and a beam mixing portion. The polarization separation portion separates the mixed light beam back into the two polarized waves and directs one of the beams through the sample portion and the other beam through the reference portion. The mixing portion re-mixes the two waves after having passed through the sample holding portion and the reference portion. The detection unit receives the re-mixed light and measures the refractive index differences between the liquid sample and the reference portion. Fiber optics optically connect the light source unit, the probe unit and the detector unit.
Abstract translation: 一种液体折射计，包括光源单元，探针单元和检测单元。 光源单元产生由彼此成直角的方向线性极化的两个相干光波组成的偏振混合光束。 探针单元包含偏振分离部分，样本保持部分，参考部分和光束混合部分。 偏振分离部分将混合光束分离成两个偏振波，并将一个光束通过样本部分，另一个光束通过参考部分。 混合部分在通过样品保持部分和参考部分之后重新混合两个波。 检测单元接收再混合光并测量液体样品与参考部分之间的折射率差异。 光纤光学连接光源单元，探头单元和检测器单元。
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45.发明授权Method of and apparatus for determining refractive-index profiles of cylindrical transparent bodies 失效用于确定圆柱形透明体的折射率分布的方法和装置
公开(公告)号：US4565449A
公开(公告)日：1986-01-21
申请号：US465014
申请日：1983-02-08
Applicant: Giorgo Grego
Inventor： Giorgo Grego
CPC classification number: G01N21/45 , G01J9/04 , G01N21/3581
Abstract: A body transparent to laser radiation, such as an optical fiber or a preform thereof, is transluminated by a monochromatic beam of a frequency in the THz range split off from a composite laser beam with two closely spaced frequencies produced by the Zeeman effect; the width of that beam in a plane transverse to the body axis is at least equal to the diameter of that body. Another monochromatic beam at the second laser frequency bypasses the transparent body and is recombined with the first beam downstream of the transluminated body to form a field of radiation which is photoelectrically sampled at closely spaced locations in the aforementioned transverse plane to provide a multiplicity of electrtical signals in the MHz range differing in phase from a reference wave of the same frequency photoelectrically obtained from the same monochromatic beams. The phase differences, determined by a comparator, are fed to a calculator computing the refractive-index profile therefrom.
Abstract translation: 通过由具有由塞曼效应产生的两个紧密间隔的频率的复合激光束分离的在THz范围内的频率的单色光束，对诸如光纤或其预成型体的激光辐射透明的物体进行平移; 在横向于体轴的平面中的该梁的宽度至少等于该主体的直径。 在第二激光频率处的另一个单色光束绕过透明体，并与第一光束在平行体的下游重新组合以形成辐射场，其在前述横向平面中的紧密间隔的位置处被光电取样，以提供多个电气信号 在与从相同单色光电光获得的相同频率的参考波相位不同的MHz范围内。 由比较器确定的相位差被馈送到计算器的折射率分布。
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Patent Agency Ranking46.发明授权Method for measuring an optical length of light path and a laser interferometer for carrying same into effect 失效用于测量光路的光学长度的方法和用于使其起作用的激光干涉仪
公开(公告)号：US4558952A
公开(公告)日：1985-12-17
申请号：US467847
申请日：1983-02-18
Applicant: Vladimir P. Kulesh , Leonid M. Moskalik , Anatoly A. Orlov , Jury A. Bliznjuk , Stanislav K. Shtandel
Inventor： Vladimir P. Kulesh , Leonid M. Moskalik , Anatoly A. Orlov , Jury A. Bliznjuk , Stanislav K. Shtandel
CPC classification number: G01B9/02057 , G01B9/02002 , G01B9/02012 , G01J9/04 , G01N21/45 , G01B2290/25 , G01B2290/45 , G01B2290/70 , G01J2009/0219 , G01J2009/0234 , G01J2009/0261
Abstract: A method for measuring an optical length of light path based on use of multiple-beam interference of light and carried into effect by forming an original light beam with two collinear components having mutually independent polarizations and different frequencies in such a manner that when forming each of the following interfering light beams from the preceding one, polarizations of the light components having different frequencies are mutually converted, whereupon the interfered light is converted into an electric signal and its phase is measured, by which the light path optical length is determined. A laser interferometer carrying said method into effect comprises: a laser and arranged consecutively along the direction of run of the light beam: a device for offsetting the frequency of one of the light components, reflecting elements, a polarizing element for separating the light of the interfering beams according to polarization, and a photoelectric converter of the interfered light into an electric signal, as well as a unit for measuring the phase of an electric signal, connected to the photoelectric converter and also a birefringent plate located between the reflecting elements and adapted for mutual conversion of polarizations of the two light components.
Abstract translation: 一种用于基于使用光的多光束干涉来测量光路的光学长度的方法，其通过用具有相互独立的极化和不同频率的两个共线分量形成原始光束来实现，使得当形成 来自前述的以下干涉光束被相互转换，因此被干扰的光被转换为电信号，并且测量其相位，由此确定光路光学长度。 携带所述方法的激光干涉仪实现包括：沿着光束的行进方向连续布置的激光器：用于抵消一个光分量，反射元件的频率的装置，用于分离光束的光的偏振元件 根据偏振的干涉光束和被干扰的光的光电转换器变成电信号，以及连接到光电转换器的电信号的相位测量单元，以及位于反射元件之间的双折射板， 用于两个光分量的偏振的相互转换。
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公开(公告)号：US4387966A
公开(公告)日：1983-06-14
申请号：US167265
申请日：1980-07-09
Applicant: Sandor Holly
Inventor： Sandor Holly
CPC classification number: G01J9/04
Abstract: Wave front deformations resulting, for example, from the interaction of a laser beam with a deformable mirror are measured by causing the beam, or a sampled portion thereof, to interfere with a reference beam having a slightly different frequency in order to produce interference patterns in a detection plane. Spaced-apart detectors in that plane brightness oscillation at the difference frequency; and relative phase differences in these oscillations are used to determine wave front tilt, spherical and astigmatic aberrations, and, possibly, other deformations. Control signals are provided for correcting these wave front deformations by controlling the surface contour of the deformable mirror. The measuring laser beam may intercept the mirror within and as part of a polarization-type interferometer, or the measuring beam may be derived from a high-energy beam. In the former case, the reference beam does not intercept the deformable mirror; in the latter case, the reference beam is also derived from the high-energy beam, but "cleaned" by spatial filtering.
Abstract translation: 通过使激光束与可变形反射镜的相互作用产生的波前变形通过使光束或其采样部分与具有稍微不同的频率的参考光束相干扰来测量，以产生干涉图案 检测平面。 在该平面上的间隔探测器在差频下亮度振荡; 并且这些振荡中的相对相位差用于确定波前倾斜，球面和像散像差以及可能的其他变形。 提供控制信号以通过控制可变形反射镜的表面轮廓来校正这些波前变形。 测量激光束可以在偏振型干涉仪内部并作为偏振型干涉仪的一部分截取反射镜，或者测量光束可以从高能束导出。 在前一种情况下，参考光束不会拦截可变形反射镜; 在后一种情况下，参考光束也是从高能量光束导出的，而是通过空间滤波“清除”。
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公开(公告)号：US3796495A
公开(公告)日：1974-03-12
申请号：US3796495D
申请日：1972-05-30
Applicant: ZENITH RADIO CORP
Inventor： LAUB L
Abstract: This disclosure depicts methods and apparatus for detecting minute phase variations on reflective or transmissive specimens. A scanning phase profilometer is depicted which includes means for producing from a coherent input light beam a set, here shown as a pair, of distinguishably coded interrogating beams which are focused and scanned across a specimen as a pair of slightly displaced light spots. The interrogating beams are recombined after interaction with the specimen. Phase demodulating means are provided including a light responsive means in the path of the recombined interrogating means for detecting phase variations between the interrogating beams caused by optical path length variations as the beams are scanned across the specimen. Means are provided for producing an electrical phase differential signal characterizing the detected phase variations and electrical integrating means for integrating the phase differential signal to produce a signal characterizing the phase profile of the scansion across the specimen. Methods and apparatus for producing a two-dimensional display of the phase profile of a specimen are also disclosed.
Abstract translation: 该公开描述了用于检测反射或透射样品上的微小相位变化的方法和装置。 描绘了一种扫描相位轮廓仪，其包括用于从相干输入光束产生一组（这里示出为一对）可分辨编码的询问光束的装置，其被聚焦并扫过横跨样本的一对稍微偏移的光点。 询问光束与样品相互作用后重组。 提供了相位解调装置，其包括在重组询问装置的路径中的光响应装置，用于检测横跨样本扫描的光路长度变化引起的询问光束之间的相位变化。 提供了用于产生表征所检测的相位变化的电相差分信号的装置，以及用于积分相位差信号以产生表征跨越样本的扩张的相位分布的信号的电积分装置。 还公开了用于产生样本的相位轮廓的二维显示的方法和装置。
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公开(公告)号：US11879981B2
公开(公告)日：2024-01-23
申请号：US17951386
申请日：2022-09-23
Applicant: BlueHalo, LLC
Inventor： Levi Judah Smolin , Alexis H. Clark
CPC classification number: G01S17/95 , G01J9/04 , G01K3/14 , G01K13/00 , G01K15/005 , G01K15/007 , G01K3/06 , G01W2001/003
Abstract: The present disclosure is of an atmospheric characterization system that has a central processing board that has a first and a second communication interface. Further, the atmospheric characterization system further has a first precision temperature sensor that is communicatively coupled to the central processing board via the first communication interface and positioned a distance from a first side of the processing board, wherein the precision temperature measures a first temperature and transfers data indicative of the first temperature to the central processing board. In addition, the atmospheric characterization system has a second precision temperature sensor that is communicatively coupled to the central processing board via the second communication interface and positioned the distance from a second opposing side of the processing board such that the first precision temperature sensor and the second precision temperature sensor are equidistance from the processing board and a distance between the first precision sensor and the second precision sensor is a predetermined distance, r, and the second precision temperature sensor measures a second temperature and transfers data indicative of the second temperature to the central processing board simultaneously with the transferring of the first temperature. Additionally, the atmospheric characterization system has a processor that receives the first temperature and the second temperature and calculates a value indicative of atmospheric turbulence based upon the first temperature and the second temperature, wherein the value indicative of the atmospheric turbulence is used for designing, modifying, calibrating, or correcting an optical system.
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50.发明授权公开(公告)号：US09952034B2
公开(公告)日：2018-04-24
申请号：US15609862
申请日：2017-05-31
Applicant: National Tsing Hua University
Inventor： Wei-Chung Wang , Po-Chi Sung
CPC classification number: G01B11/06 , G01B9/02019 , G01B2290/45 , G01J9/04
Abstract: An optical interferometric system for measurement of a full-field thickness of a plate-like object in real time includes two light sources, two screens, two image capturing devices, and an image processing module. The light sources radiate incident lights toward a reference point on the plate-like object in respective directions to produce respective interference fringe patterns (IFPs). The image capturing devices capture light intensity distribution images respectively of the IFPS imaged respectively on the screens. The image processing module calculates a fringe order at the reference point according to the light intensity distribution images, and obtains a full-field thickness distribution of the plate-like object according to the fringe order.
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