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公开(公告)号：US20140080172A1
公开(公告)日：2014-03-20
申请号：US13615882
申请日：2012-09-14
Applicant: Ola Tunheim , Robert P. Freese , Alexis Wachtel, II , James R. MacLennan
Inventor： Ola Tunheim , Robert P. Freese , Alexis Wachtel, II , James R. MacLennan
CPC classification number: G01N21/272 , G01N21/31 , G01N21/75 , G01N2021/755 , G01N2021/757 , G01N2201/06
Abstract: Disclosed are systems and methods for monitoring chemical reaction processes in or near real-time. One method may include containing a fluid within a flow path, the fluid having a chemical reaction occurring therein, optically interacting at least one integrated computational element with the fluid, thereby generating optically interacted light, and producing an output signal based on the optically interacted light that corresponds to a characteristic of the chemical reaction.
Abstract translation: 公开了用于或近实时监测化学反应过程的系统和方法。 一种方法可以包括在流动路径内容纳流体，其中发生化学反应的流体与至少一个集成的计算元件与流体相互作用，由此产生光学相互作用的光，并且基于光学相互作用的光产生输出信号 这对应于化学反应的特征。
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42.发明申请公开(公告)号：US20110280038A1
公开(公告)日：2011-11-17
申请号：US13068179
申请日：2011-05-04
Applicant: Hwan J. Jeong
Inventor： Hwan J. Jeong
IPC: F21V33/00
CPC classification number: G01N21/6458 , G01N21/65 , G01N2201/06 , G01N2201/0826
Abstract: Illumination systems and methods that utilize the higher or outer portions of the optical solid-angle space to increase the illumination intensity are disclosed. The illumination systems and methods include introducing illumination light through at least one side surface of a transparent slide that operably supports a sample on its top surface. The light fills at least a portion of the optical solid-angle space between 1 and n, and extends out to n. Light from the filled portion of the optical solid-angle space illuminates the sample through the top surface of the transparent slide. The disclosed illumination systems and methods are suitable for use in applications, such as dark-field imaging, fluorescence imaging, Raman spectroscopy, DNA analysis and like applications requiring high-intensity illumination.
Abstract translation: 公开了利用光学立体角空间的较高或外部增加照明强度的照明系统和方法。 照明系统和方法包括通过在其顶表面上可操作地支撑样品的透明滑块的至少一个侧表面引入照明光。 光填充1和n之间的光学立体角空间的至少一部分，并延伸到n。 来自光学立体角空间的填充部分的光通过透明滑块的顶表面照射样品。 所公开的照明系统和方法适用于诸如暗场成像，荧光成像，拉曼光谱，DNA分析等需要高强度照明的应用。
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公开(公告)号：US20050280703A1
公开(公告)日：2005-12-22
申请号：US10874022
申请日：2004-06-22
Applicant: Chandrasekhar Narayanaswami , Mandayam Raghunath , Ramon Caceres , Stefan Berger
Inventor： Chandrasekhar Narayanaswami , Mandayam Raghunath , Ramon Caceres , Stefan Berger
CPC classification number: G01N21/8803 , G01N21/954 , G01N2021/0118 , G01N2021/889 , G01N2201/06 , G01N2201/08 , G02B23/2484 , G06Q10/20 , G07C3/00 , H04N7/18
Abstract: A machine comprises an enclosure; a plurality of parts within the enclosure; and a visual conduit for providing a view inside of the enclosure for detection of visible signs of failure of the machine. The concept of a visual conduit encompasses a broad variety of devices including cameras inside the enclosure that provide images of the interior of the enclosure and alternatively selective transparency or translucence of the enclosure relative to at least some of the parts of the machine housed within the enclosure.
Abstract translation: 机器包括外壳; 外壳内的多个部件; 以及用于提供外壳内部的视图的视觉导管，用于检测机器的可见的故障迹象。 视觉导管的概念包括各种各样的装置，包括外壳内的照相机，其提供外壳内部的图像，以及相对于容纳在外壳内的机器的至少一些部件的选择性透明度或半透明度 。
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公开(公告)号：US09964487B2
公开(公告)日：2018-05-08
申请号：US15106856
申请日：2014-12-10
Applicant: KONINKLIJKE PHILIPS N.V.
CPC classification number: G01N21/552 , G01N15/1436 , G01N21/27 , G01N2015/1452 , G01N2201/06 , G02B21/18
Abstract: The invention relates to a detection apparatus (1) for detecting particles on or close to a particles detection surface (5) in a first optical detection mode and in a second optical detection mode, wherein a component of a light detection system (8) and/or a component of an optical system (9) of the detection apparatus is arranged to be used in the first detection mode and in the second detection mode. Since a component of the light detection system and/or a component of the optical system is arranged to be used in the first detection mode and in the second detection mode, this component does not need to be provided twice, i.e. for being used in the first detection mode and for being used in the second detection mode. This can lead to a reduced number of components and can make the detection apparatus technically less complex.
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公开(公告)号：US20180059009A1
公开(公告)日：2018-03-01
申请号：US15506401
申请日：2015-09-01
Applicant: MITSUBISHI CHEMICAL ANALYTECH CO., LTD.
Inventor： Shuji KAGAWA , Henrik HECHT , Kana SATO , Tamaki TOMOYOSE
CPC classification number: G01N21/274 , G01N1/24 , G01N1/38 , G01N21/766 , G01N33/0013 , G01N2001/247 , G01N2201/06
Abstract: There is provided a nitrogen analyzing method for quantitative analysis of nitrogen in a specimen by a chemiluminescence method using ozone which is capable of measuring a concentration of nitrogen contained in the specimen with still higher accuracy, as well as a nitrogen analyzer used for practicing the analyzing method. Also, according to the present invention, there is provided a nitrogen analyzing method and a nitrogen analyzer which have a less adverse influence on human body and are also capable of further reducing environmental burden even when analyzing nitrogen in fuel-related specimens. The nitrogen analyzing method according to the present invention comprises the steps of burning a specimen comprising a nitrogen compound to generate a specimen gas, allowing the resulting specimen gas to react with ozone to measure a chemiluminescence intensity thereof, and quantitatively determining a concentration of nitrogen in the specimen based on a previously prepared calibration curve expressing a relationship between the chemiluminescence intensity and a weight of nitrogen, wherein the calibration curve is previously prepared from a standard specimen having a nitrogen concentration of 5 to 100 ppm, and the specimen is used in the form of a diluted specimen prepared by diluting the specimen with a solvent into a nitrogen concentration of 5 to 100 ppm.
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Patent Agency Ranking
46.发明申请公开(公告)号：US20180002398A1
公开(公告)日：2018-01-04
申请号：US15690403
申请日：2017-08-30
Applicant: The General Hospital Corporation
Inventor： Seok-Hyun Yun
IPC: C07K14/705 , G01N21/47 , A61B5/00 , G01J3/44 , G01N21/63
CPC classification number: C07K14/70503 , A61B3/102 , A61B3/117 , A61B5/0059 , A61B5/0066 , A61B5/0073 , A61B5/0075 , A61B5/0084 , A61B5/0086 , A61B5/0095 , A61B5/0097 , A61B5/4088 , A61B5/412 , A61B5/413 , C07K2319/30 , C07K2319/32 , C07K2319/70 , G01B9/02091 , G01J3/4412 , G01N21/1717 , G01N21/4795 , G01N21/636 , G01N2021/1725 , G01N2021/638 , G01N2201/06 , G01N2201/0612 , G01N2800/042 , G01N2800/387 , G01N2800/7023 , G01N2800/7028 , G02B21/0052
Abstract: Arrangements and methods are provided for obtaining information associated with an anatomical sample. For example, at least one first electro-magnetic radiation can be provided to the anatomical sample so as to generate at least one acoustic wave in the anatomical sample. At least one second electro-magnetic radiation can be produced based on the acoustic wave. At least one portion of at least one second electro-magnetic radiation can be provided so as to determine information associated with at least one portion of the anatomical sample. In addition, the information based on data associated with the second electro-magnetic radiation can be analyzed. The first electro-magnetic radiation may include at least one first magnitude and at least one first frequency. The second electro-magnetic radiation can include at least one second magnitude and at least one second frequency. The data may relate to a first difference between the first and second magnitudes and/or a second difference between the first and second frequencies. The second difference may be approximately between −100 GHz and 100 GHz, excluding zero.
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公开(公告)号：US09683943B2
公开(公告)日：2017-06-20
申请号：US14718110
申请日：2015-05-21
Applicant: Keyence Corporation
Inventor： Daisuke Ando
CPC classification number: G06T7/0004 , G01N21/8803 , G01N21/8806 , G01N21/8851 , G01N2201/06 , G01N2201/061 , G06T7/586 , G06T2207/10152 , G06T2207/20016 , G06T2207/30164
Abstract: To facilitate setting of a parameter at the time of generating an inspection image from an image acquired by using a photometric stereo principle. A photometric processing part generates an inspection image based on a plurality of luminance images acquired by a camera. A display control part and a display part switch and display the luminance image and the inspection image, or simultaneously display these images. An inspection tool setting part adjusts a control parameter of the camera and a control parameter of an illumination apparatus. Further, when the control parameter is adjusted, the display control part updates the image being displayed on the display part to an image where the control parameter after the change has been reflected.
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公开(公告)号：US20170098300A1
公开(公告)日：2017-04-06
申请号：US15382762
申请日：2016-12-19
Applicant: Keyence Corporation
Inventor： Norimasa Mayumi
CPC classification number: H04N13/207 , G01N21/88 , G01N21/8803 , G01N21/8806 , G01N2201/06 , G06K9/18 , G06T7/0004 , G06T7/586 , G06T2207/10016 , G06T2207/10152 , G06T2207/20016 , G06T2207/30164 , H04N5/2256
Abstract: A photometric processing part calculates a normal vector of a surface of a workpiece from a plurality of luminance images acquired by a camera in accordance with the photometric stereo method, and performs synthesis processing of synthesizing at least two images out of an inclination image made up of pixel values based on the normal vector calculated from the plurality of luminance images and at least one reduced image of the inclination image, to generate an inspection image showing a surface shape of the inspection target. In particular, a characteristic size setting part sets a characteristic size which is a parameter for giving weight to a component of a reduced image at the time of performing the synthesis processing. The photometric processing part can generate a different inspection image in accordance with the set characteristic size.
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公开(公告)号：US09488596B2
公开(公告)日：2016-11-08
申请号：US14978372
申请日：2015-12-22
Applicant: Hitachi High-Technologies Corporation
Inventor： Toshifumi Honda , Yuta Urano , Hisashi Hatano
IPC: G01N21/95 , G01N21/956 , G01N21/88
CPC classification number: G01N21/9501 , G01N21/8851 , G01N21/956 , G01N2201/06
Abstract: In defect scanning carried out in a process of manufacturing a semiconductor or the like, a light detection optical system comprising a plurality of photosensors is used for detecting scattered light reflected from a sample. The photosensors used for detecting the quantity of weak background scattered light include a photon counting type photosensor having few pixels whereas the photosensors used for detecting the quantity of strong background scattered light include a photon counting type photosensor having many pixels or an analog photosensor. In addition, nonlinearity caused by the use of the photon counting type photosensor as nonlinearity of detection strength of defect scattered light is corrected in order to correct a detection signal of the defect scattered light.
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公开(公告)号：US09255888B2
公开(公告)日：2016-02-09
申请号：US14359221
申请日：2012-10-22
Applicant: Hitachi High-Technologies Corporation
Inventor： Toshifumi Honda , Yuta Urano , Hisashi Hatano
IPC: G01N21/88 , G01N21/95 , G01N21/956
CPC classification number: G01N21/9501 , G01N21/8851 , G01N21/956 , G01N2201/06
Abstract: In defect scanning carried out in a process of manufacturing a semiconductor or the like, a light detection optical system comprising a plurality of photosensors is used for detecting scattered light reflected from a sample. The photosensors used for detecting the quantity of weak background scattered light include a photon counting type photosensor having few pixels whereas the photosensors used for detecting the quantity of strong background scattered light include a photon counting type photosensor having many pixels or an analog photosensor. In addition, nonlinearity caused by the use of the photon counting type photosensor as nonlinearity of detection strength of defect scattered light is corrected in order to correct a detection signal of the defect scattered light.
Abstract translation: 在制造半导体等的过程中进行的缺陷扫描中，使用包含多个光电传感器的光检测光学系统来检测从样品反射的散射光。 用于检测弱背景散射光量的光传感器包括具有少量像素的光子计数型光电传感器，而用于检测强背景散射光量的光电传感器包括具有许多像素的光子计数型光电传感器或模拟光电传感器。 此外，为了校正缺陷散射光的检测信号，对使用光子计数型光电传感器作为非线性的缺陷散射光的检测强度引起的非线性进行了修正。
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