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    Grazing incidence reflection spectrometer
    41.
    发明授权
    Grazing incidence reflection spectrometer 失效
    掠射入射反射光谱仪

    公开(公告)号：US4653908A

    公开(公告)日：1987-03-31

    申请号：US677245

    申请日：1984-12-03

    Applicant: Yusuke Yajima ,  Seiichi Murayama ,  Kanji Tsujii

    Inventor： Yusuke Yajima ,  Seiichi Murayama ,  Kanji Tsujii

    IPC: G01N21/27 ,  G01J3/42 ,  G01N21/00 ,  G01N21/21 ,  G01N21/33 ,  G01J3/32

    CPC classification number: G01N21/55 ,  G01J3/42 ,  G01N21/21

    Abstract: The present invention consists in a grazing incidence reflection spectrometer wherein light is caused to incide on a surface of a sample, and an intensity of light reflected from the sample surface is detected, thereby to measure an electronic absorption spectrum of a material adsorbed to the sample surface, characterized in that the incident light is visible light or ultraviolet light, and that the incident light has a predetermined glancing angle to the sample surface.

    Abstract translation: 本发明包括一种放射入射反射光谱仪，其中使光入射到样品的表面上，并且检测从样品表面反射的光的强度，从而测量吸附在样品上的材料的电子吸收光谱 其特征在于入射光是可见光或紫外光，并且入射光对样品表面具有预定的扫视角。

    Scannable detector system for echelle grating spectrometers
    42.
    发明授权
    Scannable detector system for echelle grating spectrometers 失效
    用于梯形光栅光谱仪的可扫描检测器系统

    公开(公告)号：US4391523A

    公开(公告)日：1983-07-05

    申请号：US246716

    申请日：1981-03-23

    Applicant: Karl J. Hildebrand ,  John Leeman

    Inventor： Karl J. Hildebrand ,  John Leeman

    IPC: G01J3/32 ,  G01J3/34 ,  G01J3/38

    CPC classification number: G01J3/32

    Abstract: A scannable detector system for echelle grating spectrometers is disclosed in which a photodetector is positioned behind an aperture plate having a plurality of apertures corresponding to focal positions of the spectral array eminating from the grating. The detector is arranged to scan from aperture to aperture to measure the presence of individual wavelengths in the array. Additionally, the detector may be removed from the field of the plate to permit the substitution of a non-scannable array of detectors and an associated masking aperture plate to simultaneously measure the presence of a plurality of wavelengths in the spectral array.

    Abstract translation: 公开了一种用于梯形光栅光谱仪的可扫描检测器系统，其中光电检测器位于具有对应于从光栅排列的光谱阵列的焦点位置的多个孔的孔板后面。 检测器布置成从孔径扫描到孔径以测量阵列中各个波长的存在。 另外，检测器可以从板的场去除，以允许代替不可扫描的检测器阵列和相关联的掩蔽孔板，以同时测量光谱阵列中多个波长的存在。

    ELECTROMAGNETIC RADIATION MEASUREMENT DEVICE
    49.
    发明申请
    ELECTROMAGNETIC RADIATION MEASUREMENT DEVICE 有权

    公开(公告)号：US20250102359A1

    公开(公告)日：2025-03-27

    申请号：US18722902

    申请日：2022-12-21

    Applicant: NPL MANAGEMENT LIMITED

    Inventor： Yameng CAO ,  Fernando CASTRO ,  Sebastian WOOD

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/12 ,  G01J3/32

    Abstract: An electromagnetic radiation measurement device is disclosed, including an electromagnetic radiation sensor and a reconfigurable filter assembly. The reconfigurable filter assembly has a series of configurations, each configuration of the series filtering to a different wavelength band for measuring by the sensor. The wavelength bands of adjacent configurations of the series overlap thereby to define differential sub-bands. The device also includes a processor configured to utilise sensor measurements for different configurations of the series to derive measurement values for the sub-bands.

    TECHNIQUES FOR CHARACTERIZING LASER SPECTRAL LINEWIDTHS OF SINGLE-FREQUENCY LASERS WITH SIGMOID FUNCTIONS OF OBSERVATION TIME
    50.
    发明申请
    TECHNIQUES FOR CHARACTERIZING LASER SPECTRAL LINEWIDTHS OF SINGLE-FREQUENCY LASERS WITH SIGMOID FUNCTIONS OF OBSERVATION TIME 有权

    公开(公告)号：US20250076118A1

    公开(公告)日：2025-03-06

    申请号：US18821588

    申请日：2024-08-30

    Applicant: Xiaotian Steve Yao

    Inventor： Xiaotian Steve Yao

    IPC: G01J3/32 ,  G01J3/28

    Abstract: The laser linewidth is an important parameter for characterizing the coherence properties of a single-frequency laser. The disclosure of this patent document provides techniques for characterizing laser spectral linewidths of single-frequency lasers in form of analytical formula in connection with the use of one or more Sigmoid functions of observation time by including various physical origins affecting the laser linewidths in addition to the natural linewidth caused by the spontaneous emission or quantum noise that can be described with an analytical expression known as the Schawlow-Townes-Henry formula. The disclosed methods for characterizing the laser linewidth caused by various factors in analytical formula can be advantageously used in various applications including designing an optical interferometer based sensing device using coherent laser light from a single-frequency laser.

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