Abstract:
Methods of rapid distinction between growing cells and debris, which determine a time-lapse movie of specimen images, track features of each entity, and categorize each entity as growing cells or debris.
Abstract:
An automatic fingerprint system includes an optical sensor having a first light source that provides a collimated beam for interrogating a first sample surface, and a camera including a lens and a photodetector array having a camera field of view (FOVCAMERA) large enough to image the first sample surface. The camera is critical angle positioned relative to the first light source to receive specular reflection (glare) from the first sample surface to generate image data from the glare. The first light source and camera have substantially equal and opposite numerical apertures (NAs). A computer or processor that includes reference fingerprint templates receives a digitized form of the image data, and includes data processing software for (i) comparing the image data to reference fingerprint templates to determine whether the image data includes at least one fingerprint and (ii) for generating a fingerprint image if the fingerprint is determined to be present.
Abstract:
Motion control system and method for biosensor scanning that include inputting to a multi-axis motion controller move commands associated with the scan path as defined by multiple axes. The multiple axes including an x-baseline coordinate x0, a y-baseline coordinate y0, an x-direction oscillation amplitude x1, a y-direction oscillation amplitude y1, an oscillation frequency f and a phase φ. The multi-axis motion controller outputs digital commanded positions for each of the multiple axes. A post-processor receives the commanded positions and generates parameterized commanded positions x and y that each include a baseline motion component and an oscillating motion component. The parameterized commanded positions cause the scanning optical system to deflect the light beam to scan the beam spot over the scan path to scan the biosensor.
Abstract:
An apparatus for optical sensing of samples includes an optical source, an optical assembly, a sample holder, an objective lens, and a detector. The objective lens collimates light emitted by the sample. Preferably, the optical assembly rotates about an axis, allowing the sensing apparatus to sense results from plural locations on a sample without moving the sample. Moving the sample in a linear direction while rotating the optical assembly allows sensing of an entire sample. Preferably, light from the optical source enters the optical assembly along the axis of rotation. Sensing methods consistent with the invention are also described.
Abstract:
Aspects of the subject matter described herein relate to attributing light emissions to spots a light was scanned over. In aspects, the scanned light includes light capable of increasing light emissions from at least one type of matter. A detector detects emitted light that comes from spots the light was previously scanned over. Circuitry attributes emitted light with spots within the area. Data representing light that reflects from each spot may be combined with data representing light that emits (if any) from each spot to create an image. The emitted light may be assigned a false color in the image to distinguish it from reflected light in the image. Emitted light may occur as a result of fluorescent activity. Other aspects are described in the specification.
Abstract:
An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system.
Abstract:
A pattern defect inspection apparatus is capable of detecting defects, without being affected by non-uniform thickness of a thin film formed on a sample, even when using monochromatic light, such as a laser. The apparatus comprises a laser to illuminate a sample, coherence suppression optics to reduce laser beam coherence, a condenser to condense the laser beam onto a pupil plane of an objective lens, and a detector to detect the light reflected from a circuit pattern formed on a sample. The condenser is designed so that the intensity of light illuminating the sample under test can be partially adjusted according to the type of laser beam illumination condensed on the pupil of the objective lens. Variations in reflected light intensity caused by non-uniform film thickness on the surface of the sample are therefore reduced, and shading is minimized in the detected image to allow detecting of fine defects.
Abstract:
Methods for evaluating a pixel signal produced during scanning of a chemical array are provided. In general, the subject methods involve identifying a set of conformant digital signals for a pixel, and integrating those signals. Also provided are systems and programming for performing the subject methods, and an array scanner containing these systems and programming.
Abstract:
A local area of a sample is focally heated to produce a transient physical deformation. The surface of the structure is optically monitored while the heated area cools to a baseline temperature by illuminating the heated region with one or more probe beams from time to time and detecting returning light. In some embodiments heat dissipation within the structure is correlated with change in optical reflectivity over time. In other embodiments, surface deformation of the structure is correlated with changes in light scattering from the surface. Following application of a pump pulse and no more than 3 probe pulses, a time varying returning light signal is compared with a corresponding returning light signal from a reference. An anomaly in the sample is indicated by a deviation between the two signals. First-degree exponential decay curves may be constructed from the signals, and their decay constants compared.
Abstract:
A method and apparatus for imaging objects based upon the polarization or depolarization of light. According to one embodiment, there is provided a method for imaging the surface of a turbid medium, the method comprising the steps of: (a) illuminating the surface of the turbid medium with light, whereby light is backscattered from the illuminated surface of the turbid medium; (b) detecting a pair of complementary polarization components of the backscattered light; and (c) forming an image of the illuminated surface using the pair of complementary polarization components. Preferably, the illuminating light is polarized (e.g., linearly polarized, circularly polarized, elliptically polarized). Where, for example, the illuminating light is linearly polarized, the pair of complementary polarization components are preferably the parallel and perpendicular components to the polarized illuminating light, and the image may be formed by subtracting the perpendicular component from the parallel component, by taking a ratio of the parallel and perpendicular components or by using some combination of a ratio and difference of the parallel and perpendicular components.