Abstract:
In a mass spectrometer comprising an ion gun for radiating an ion beam onto a surface of an object to make the surface emit secondary ions, a detector for the secondary ions, and a directing member for directing the secondary ions to the detector, a specific energy bandwidth is defined in an energy distribution of the secondary ions in consideration of a peak of the energy distribution. An analyzable energy range is expanded to at least twice the specific energy bandwidth by the use of an expanding member coupled to the directing member. The expanding member may be used to expand a transmissible bandwidth of an energy filter included in the directing member by raising a resolution and a center transmission energy. The expanding member may be used to raise a maximum analyzable energy of a quadrupole mass filter included in the mass filter. Specifically, the expanding member may be implemented by changing a length of each electrode member of the mass filter and/or a frequency of an a.c. voltage supplied to each electrode member.
Abstract:
A mass spectrograph combining one or more magnetic deflections with the action of electrostatic fields, characterized by the fact that the system is circularly symmetrical; by the fact that the ions are injected radially from a source constituted by a heated circular filament and a pair of small ring-shaped magnets which confine the ionizing electrons to the interior or exterior periphery of the analyzer system per se; by the fact that the first pair of deflection magnets of the analyzer system is ring shaped; and by the fact that the selective action of the other fields, in particular the electrostatic fields, is due to the prior dispersion obtained by the first magnetic induction.
Abstract:
The invention relates to a mass spectrometer for rapid scanning. A magnetic sector focuses a collimated beam containing the various ion species in a focal plane. The focused beams reach this focal plane at an angle of 45.degree.. The beams emerging from this focal plane are refocused in an electrostatic deflector having parallel plates. One of these plates is provided with a slit through which the beams are received. Scanning is brought about by varying the voltage applied to the electrostatic deflector.
Abstract:
A mass spectrometer comprising superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam produced by an ion source is located on an equipotential surface in the electric field. The ion beam is accelerated by a means for producing a constant accelerating voltage. The electric field is swept by a sweep means. The change of the focal length of the superimposed field when the electric field is swept by said sweep means is compensated by a compensating means, thereby providing a mass spectrometer capable of measuring ions having a wide range of mass to charge ratios and capable of scanning at high speed and having a high accuracy mass marker.
Abstract:
In a system for isotope separation, method and apparatus empolying crossed-field MHD particle accelerating techniques for collecting ions of a desired isotope after selective ionization of that isotope. In the plasma of electrons and selectively ionized atoms which results from selective isotope ionization, the ions are collected by inducing a circulation of the plasma electrons to provide a JXB relationship for MHD acceleration of the ions. The electron circulation enhances penetration of the plasma by the accelerating electric field and avoids the generation of large Hall voltages within the system as well as reducing the required magnitude of electrode currents.
Abstract:
Electrostatic filtration of secondary ions of mass m in a given mass ratio with a primary ion of mass M which has formed the secondary ions by fission is carried out by a method which consists in forming a singly-charged primary ion of the substance having a molecular mass M and extracting the ion at a voltage V1 with respect to ground, in causing the primary ion to cross a potential barrier V2, in producing the dissociation of said ion into at least two fragments of secondary ions, in extracting the fragment ion of mass m at a voltage V2, in carrying out a filtration in an electrostatic analyzer through which only the ions of energy eV'''' are permitted to pass, in detecting the ions which have thus been filtered and the mass m of which is such that
Abstract:
An ion microanalyzer wherein the intensity of a condenser lens for focusing an ion beam is periodically varied, to vary the spot diameter of the ion beam which is to impinge on a specimen, whereby the precision of analysis in the direction of the depth of the specimen can be enhanced.
Abstract:
In the ion accelerator disclosed herein, the desired ion species is selected by means of a filter or selector of the crossed-field type which is self-focusing on at least one axis and which permits ion energy to be easily varied while maintaining focus and desired species selection. In the selector, the electric field provided has a strength which, on the centerline of the beam, is proportional to the square-root of the ion energy and has a gradient, in the direction of the field, which is proportional to the ion energy.
Abstract:
The apparatus disclosed herein provides high energy positive ions, suitable for semiconductor doping, by projecting positive ions through an electron stripping gas at relatively low energy thereby to obtain positive ions which are multiply ionized or charged. Those ions which are raised to a preselected ionization level or state are segregated, and then accelerated by a relatively high accelerating voltage to achieve an energy suitable for ion implantation in a semiconductor matrix. Since the ions subjected to the relatively high accelerating voltage are multiply ionized, the energy imparted thereto, measured in electron volts, is substantially equal to an integer multiple of the accelerating voltage.
Abstract:
An electrostatic analyzer of the energy spectrum of charged particles is provided comprising spaced apart analyzer plates adapted for operation in a velocity-focusing mode of operation and auxiliary electrode means adjoining an inner face of an analyzer plate. Circuit means apply a potential to each analyzer plate and a potential of opposite polarity to an associated auxiliary electrode means for establishing an electrostatic field between the plates which in a zone of influence of the auxiliary electrode means is modified to direct peripheral particle trajectories towards a focus substantially common with that of paraxial trajectories.