System for detecting bacterial growth in a plurality of culture vials
    61.
    发明授权
    System for detecting bacterial growth in a plurality of culture vials 失效
    用于在多个培养瓶中检测细菌生长的系统

    公开(公告)号:US5397709A

    公开(公告)日:1995-03-14

    申请号:US113444

    申请日:1993-08-27

    Inventor: Klaus W. Berndt

    Abstract: A system for detecting the presence of bacterial growth in a plurality of sample vials incorporates a single test station moveable along each of the plurality of sample vials. In one embodiment, the sensor station is movably mounted on a rod, and that rod is movably mounted on a pair of spaced rods. The rod which carries the test station may move along the spaced rods to change the location of the test station in a first dimension and the test station is moveable along its rod to change location in a second dimension. In this way, the test station may be moved through two dimensions to move serially to the location of each of the plurality of sample vials. In another aspect of this invention, a bar code is associated with each of the sample vials, and the test station makes a reading of that bar code concurrent with a determination being made as to whether there is any bacterial growth in the sample vial. In this way, it is ensured that the results of the evaluation of whether bacterial growth is ongoing will be associated with the proper sample vial. In a third aspect of this invention, the sample vial incorporates a plurality of distinct types of bacterial sensors. Thus, the advantages of each of several types of bacterial sensors may be incorporated into a single sample vial.

    Abstract translation: 用于检测多个样品瓶中细菌生长存在的系统结合了可沿多个样品瓶中的每一个移动的单个测试台。 在一个实施例中,传感器站可移动地安装在杆上,并且该杆可移动地安装在一对隔开的杆上。 携带测试台的杆可以沿着间隔开的杆移动,以便在第一维度上改变测试台的位置,并且测试台可沿其杆移动以在第二维度上改变位置。 以这种方式,测试台可以通过两个维度移动以连续地移动到多个样品瓶中的每一个的位置。 在本发明的另一方面,条形码与每个样品瓶相关联,并且测试台同时进行该条形码的读取,并确定样品瓶中是否存在细菌生长。 以这种方式,确保细菌生长是否正在进行的评估结果将与适当的样品瓶相关联。 在本发明的第三方面,样品瓶包含多种不同类型的细菌传感器。 因此,可以将几种类型的细菌传感器中的每一种的优点结合到单个样品瓶中。

    Optical scanner with self contained standardization means
    62.
    发明授权
    Optical scanner with self contained standardization means 失效
    具有自包含标准化的光学扫描仪

    公开(公告)号:US5343296A

    公开(公告)日:1994-08-30

    申请号:US13565

    申请日:1993-02-04

    Inventor: Ake A. Hellstrom

    Abstract: An apparatus for optically scanning and measuring the physical parameters of a sheet material by means which are fully enclosed within an air purged cross-machine box-beam structure to protect the radiation source, the radiation detector and the optics from the harsh machine environment. The apparatus may involve a single beam enclosing a combined source/detector module for reflection measurement or dual beams on opposite sides of the sheet for transmission measurement with one enclosing a source module and the other enclosing a detector module. Standardization means are also provided either in the module itself or as an extension of the beam. Means are also disclosed for sealing the opening in the beams through which the radiation passes.

    Abstract translation: 一种用于通过完全封闭在空气净化的跨机箱梁结构内的装置来光学扫描和测量片材的物理参数的装置,以保护辐射源,辐射检测器和光学元件免受恶劣的机器环境的影响。 该装置可以包括单个光束,其包围用于反射测量的组合源/检测器模块或用于传输测量的相对侧上的双光束,其中一个封装源模块,另一个包围检测器模块。 标准化装置也可以在模块本身中或作为梁的延伸部分提供。 还公开了用于密封辐射通过的光束中的开口的装置。

    Dual sensor scanner for measuring weight of paper and related sheet
products
    63.
    发明授权
    Dual sensor scanner for measuring weight of paper and related sheet products 失效
    用于测量纸张和相关纸张产品重量的双传感器扫描仪

    公开(公告)号:US5099118A

    公开(公告)日:1992-03-24

    申请号:US707617

    申请日:1991-05-30

    Abstract: A dual sensor scanner includes an optical sensor and a nuclear sensor such as a beta gauge for sensing the basis weight or other parameters of paper as it is being produced by a paper making machine. The nuclear sensor signal is filtered to pass a low frequency portion and the optical sensor is filtered to pass a high frequency portion. The two filtered signals are combined to provide a substantially full frequency signal indicative of the basis weight of the paper. The sensor signals may be manually calibrated or, preferably, the nuclear sensor signal may be used to provide continuous on-line calibration of the optical sensor signal.

    Abstract translation: 双传感器扫描器包括光学传感器和核传感器,例如用于感测由造纸机生产的纸张的基重或其它参数的测量计。 对核传感器信号进行滤波以通过低频部分,并且将光学传感器滤波以通过高频部分。 两个滤波的信号被组合以提供指示纸张的基重的基本全频率信号。 传感器信号可以被手动校准,或者优选地,核传感器信号可以用于提供光学传感器信号的连续在线校准。

    COMMUNICATION HOLE INSPECTION DEVICE AND COMMUNICATION HOLE INSPECTION METHOD

    公开(公告)号:US20240151654A1

    公开(公告)日:2024-05-09

    申请号:US18281852

    申请日:2021-12-24

    CPC classification number: G01N21/954 B22C19/00 G01N2021/9544 G01N2201/101

    Abstract: A communication hole inspection device for inspecting a communication hole in a structure, a casting surface being formed on an inner surface of the hole, said communication hole inspection device having: a light-emitting body that is arranged in a portion of the communication hole and emits a beam of light; a light-receiving body that is arranged in a different portion of the communication hole and receives the light beam from the light-emitting body; a rotation mechanism for changing the rotation angle of the light-emitting body and thereby changing the light beam received by the light-receiving body; and a determination unit for determining the open state of the communication hole at least on the basis of based on the light beam received by the light-receiving body when the rotation angle of the light-emitting body is set at a first angle, and at a second angle different from the first anile.

    EDGE PORTION MEASURING APPARATUS AND METHOD FOR MEASURING EDGE PORTION

    公开(公告)号:US20230258577A1

    公开(公告)日:2023-08-17

    申请号:US18153036

    申请日:2023-01-11

    Inventor: Shigeru Oba

    Abstract: An edge portion measuring apparatus for measuring shape of an edge portion of a wafer, including, a holding portion that holds the wafer, a rotating means for rotating the wafer, a sensor including a light projecting portion for projecting a laser light from a light source onto the edge portion of the wafer held by the holding portion, and a light receiving detection unit receiving diffuse reflected light that the laser light projected is reflected at the edge portion of the wafer, wherein, rotating the wafer while holding the wafer, at least in a range from normal direction of a held surface of the wafer to normal direction of a surface opposite to the held surface, projecting the laser light and detecting the diffuse reflected light by the sensor, being able to measure the shape of an entire area of the edge portion of the wafer by a triangulation method.

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