公开(公告)号：US20240280509A1

公开(公告)日：2024-08-22

申请号：US18562456

申请日：2022-05-17

Applicant: SAINT-GOBAIN GLASS FRANCE

Inventor： Théo RYBARCZYK

IPC: G01N21/958 ,  G06T7/00 ,  G06T7/60

CPC classification number: G01N21/958 ,  G06T7/0004 ,  G06T7/60 ,  G01N2021/9586 ,  G01N2201/126

Abstract: A method for detecting optical defects within a windshield. The method takes, as input, a digital image map of the intensity of optical power of a windshield, and provides, as output, a digital image map of optical defects. The method includes (a) an image processing of the digital image map of optical powers for detecting and delimiting regions that differs in intensity of optical power; (b) computing, for each detected regions, a representative geometric distance and a representative value of the optical power; (c) computing an image map of the detected regions for which the product between the representative geometric distance and the representative value of the optical power is equal or superior to 2.9·10−4.

公开(公告)号：US20240102937A1

公开(公告)日：2024-03-28

申请号：US18372026

申请日：2023-09-22

Applicant: Gemological Institute of America, Inc. (GIA)

Inventor： Tsung-Han TSAI ,  Hiroshi TAKAHASHI ,  Mehdi TOOSI ,  Yong LIU

IPC: G01N21/88 ,  G01N21/958 ,  G06T7/00 ,  H04N23/95

CPC classification number: G01N21/8806 ,  G01N21/8851 ,  G01N21/958 ,  G06T7/0002 ,  H04N23/95 ,  G01N2021/8812 ,  G01N2021/8822 ,  G01N2021/8867 ,  G01N2201/0633 ,  G01N2201/0634 ,  G01N2201/105 ,  G01N2201/126 ,  G01N2201/127

Abstract: Systems and methods here may be used for a setup of image capturing of a gemstone, such as a diamonds that are of high clarity grades. The present embodiments can provide methods to capture a diamond surface and internal clarity features from a diamond table and through and of other facets. Systems and methods may be used to convert gemstone dimension information into azimuth, slope, and distance information and adjust the motorized stage accordingly for surface imaging. Further, a calibration method can consider the offsets between design and actual system alignment. A calibration process can be used to compensate the offsets. Further, an additional conversion can be derived to compensate the offset caused by the geometry of the gemstone. The methods can automatically capture surface reflection images on facets of the gemstone and internal features taken through facets of the gemstone.

公开(公告)号：US11835447B1

公开(公告)日：2023-12-05

申请号：US18366835

申请日：2023-08-08

Applicant: AUROS TECHNOLOGY, INC.

Inventor： Tae Dong Kang

IPC: G01B11/28 ,  G01N21/21

CPC classification number: G01N21/211 ,  G01N2021/213 ,  G01N2201/126

Abstract: A method for measuring a characteristic of a thin film is disclosed. The method includes a) obtaining a measured spectrum from a target region on the substrate by using a spectroscopic ellipsometer, b) obtaining a physical model capable of obtaining an estimated parameter value related to the characteristic of the thin film through regression analysis of the measured spectrum, c) obtaining a machine learning model capable of obtaining a reference parameter value related to the characteristic of the thin film by using the measured spectrum, and d) obtaining an integrated model which uses an integrated error function capable of considering both of a first error function and a second error function, and obtaining an optimum parameter value through regression analysis of the integrated model.

公开(公告)号：US11779931B2

公开(公告)日：2023-10-10

申请号：US17470717

申请日：2021-09-09

Applicant: bioMerieux, Inc.

Inventor： Perry D. Stamm ,  Joel Patrick Harrison ,  Gregory R Maes ,  Jeffrey Edward Price ,  Jack R. Hoffmann, Jr. ,  John Kenneth Korte ,  Daniel Joseph Pingel ,  Walter J. Clynes ,  Sean Gregory Furman ,  Leonard H. Schleicher ,  Christopher George Kocher ,  Brian David Peterson ,  Jacky S. Yam

IPC: B01L3/00 ,  G01N21/01 ,  G01N21/59 ,  G01N21/47 ,  G01N1/10 ,  G01N21/27 ,  G01N33/487 ,  G01N21/03 ,  G01N15/06 ,  G01N21/51 ,  G01N21/88 ,  G01N21/93

CPC classification number: B01L3/50853 ,  G01N1/10 ,  G01N15/06 ,  G01N21/01 ,  G01N21/0303 ,  G01N21/274 ,  G01N21/4738 ,  G01N21/4785 ,  G01N21/51 ,  G01N21/5907 ,  G01N21/8806 ,  G01N21/93 ,  G01N33/487 ,  G01N33/48735 ,  B01L2200/14 ,  B01L2300/0654 ,  B01L2300/0803 ,  B01L2300/12 ,  G01N21/474 ,  G01N2015/0693 ,  G01N2021/0168 ,  G01N2021/0389 ,  G01N2021/4769 ,  G01N2021/598 ,  G01N2201/126 ,  G01N2201/12707

Abstract: Instruments, systems, and methods for measuring optical density of microbiological samples are provided. In particular, optical density instruments providing improved safety, efficiency, comfort, and convenience are provided. Such optical density instruments include a handheld portion and a base station. The optical density instruments may be used in systems and methods for measuring optical density of biological samples.

公开(公告)号：US20230280271A1

公开(公告)日：2023-09-07

申请号：US17995641

申请日：2021-04-06

Applicant: The General Hospital Corporation

Inventor： Hui Min Leung ,  Guillermo J. Tearney ,  Andreas Wartak

IPC: G01N21/47

CPC classification number: G01N21/4795 ,  G01N2021/4735 ,  G01N2021/4797 ,  G01N2201/126

Abstract: An apparatus for obtaining image data and functional data from a biological sample, the apparatus including: an interferometer configured to acquire interferometric information at a plurality of time points along an imaging plane for which at least one axis of the plane is at least partially along a depth or axial dimension that is based on radiations provided from a reference interfered with by the biological sample; and a processor configured to receive the interferometric information from the interferometer and configured to: process the interferometric information to generate an image of the biological sample along the imaging plane; determine frequency information based on the plurality of time points of the interferometric information, the frequency information reflecting temporal modulations induced by dynamic functions of the biological sample; generate a spatial map of the frequency information, and the spatial map of the frequency information indicating the dynamic functions of the biological sample.

公开(公告)号：US20180259454A1

公开(公告)日：2018-09-13

申请号：US15487435

申请日：2017-04-14

Applicant: Massachusetts Institute of Technology

Inventor： Ayush Bhandari ,  Christopher Barsi ,  Achuta Kadambi ,  Ramesh Raskar

IPC: G01N21/64

CPC classification number: G01N21/6408 ,  G01N21/6456 ,  G01N2201/0691 ,  G01N2201/126 ,  G01N2201/129 ,  G07D7/1205 ,  G07D7/2016 ,  G07D7/205

Abstract: A light source may illuminate a scene with amplitude-modulated light. The scene may include fluorescent material. The amplitude modulation may be periodic, and the frequency of the amplitude modulation may be swept. During the sweep, a time-of-flight sensor may take measurements of light returning from the scene. A computer may calculate, for each pixel in the sensor, a vector of complex numbers. Each complex number in the vector may encode phase and amplitude of light incident at the pixel and may correspond to measurements taken at a given frequency in the sweep. A computer may, based on phase of the complex numbers for a pixel, calculate fluorescence lifetime and scene depth of a scene point that corresponds to the pixel.

公开(公告)号：US20170167986A1

公开(公告)日：2017-06-15

申请号：US14690450

申请日：2015-04-19

Applicant: GDT, Inc.

Inventor： Tu Nguyen ,  Tien Trinh

IPC: G01N21/95 ,  G01N21/55 ,  G01N21/47

CPC classification number: G01N21/95 ,  G01N21/47 ,  G01N21/55 ,  G01N21/8806 ,  G01N2021/555 ,  G01N2021/8841 ,  G01N2201/022 ,  G01N2201/061 ,  G01N2201/126 ,  G03B15/06 ,  G03B2215/0596 ,  G06T7/0004 ,  G06T2207/30164

Abstract: A cosmetic testing fixture is disclosed for evaluating the cosmetic condition of a used electronic device, comprising an enclosure for containing the used electronic device and a fixture that uses the relative amounts of reflected and scattered light off a surface of the used electronic device to determine if there are any cosmetic imperfections such as scratches or cracks on the surface.

公开(公告)号：US09513225B2

公开(公告)日：2016-12-06

申请号：US14378710

申请日：2013-02-11

Applicant: BAR ILAN UNIVERSITY

Inventor： Zeev Zalevsky ,  Yair Hammer

IPC: G01J3/44 ,  G01N21/65

CPC classification number: G01N21/65 ,  G01N2201/06113 ,  G01N2201/126

Abstract: The present disclosure provides systems and methods for improving the resolution of a spectrometer configured to provide a frequency spectrum of a radiation incoming from a sample. The system comprises an optical medium configured so that the radiation incoming from the sample be transferred through the optical medium, the optical medium having a predetermined tunable spectral transmission curve; an operating unit connectable to the optical medium and configured to operate the optical medium so as to shift the spectral transmission curve of the optical medium over a predetermined spectral range; and a processing unit connectable to the spectrometer and configured to process a set of shifted frequency spectra provided by the spectrometer and obtainable by transferring the radiation incoming from the sample through the optical medium while shifting the spectral transmission curve of the optical medium so as to obtain a super resolved frequency spectrum of improved spectral resolution.

Abstract translation: 本公开提供了用于改进配置为提供从样品进入的辐射的频谱的光谱仪的分辨率的系统和方法。 该系统包括光学介质，其被配置为使得从样品入射的辐射通过光学介质传输，光学介质具有预定的可调谐光谱透射曲线; 操作单元，其可连接到所述光学介质并且被配置为操作所述光学介质，以便使光学介质的光谱传输曲线在预定的光谱范围内移动; 以及处理单元，其可连接到所述光谱仪并且被配置为处理由所述光谱仪提供的一组移动的频谱，并且可以通过在移动所述光学介质的光谱透射曲线的同时转移通过所述光学介质从所述样品入射的辐射而获得， 一种改进的光谱分辨率的超解析频谱。

公开(公告)号：US09217695B2

公开(公告)日：2015-12-22

申请号：US12785314

申请日：2010-05-21

Applicant: James Winkelman ,  Milenko Tanasijevic ,  David Zahniser

Inventor： James Winkelman ,  Milenko Tanasijevic ,  David Zahniser

IPC: C12M1/34 ,  G06K9/00 ,  G01N1/28 ,  G01N35/00 ,  G01N1/31 ,  G01N15/14

CPC classification number: G01N15/1475 ,  G01N1/2813 ,  G01N1/312 ,  G01N21/255 ,  G01N33/49 ,  G01N35/00029 ,  G01N35/00871 ,  G01N35/1016 ,  G01N2015/0073 ,  G01N2015/008 ,  G01N2015/0084 ,  G01N2015/1006 ,  G01N2015/1472 ,  G01N2015/1486 ,  G01N2015/1497 ,  G01N2035/00138 ,  G01N2035/00465 ,  G01N2035/0091 ,  G01N2201/062 ,  G01N2201/126 ,  G01N2333/805 ,  G06K9/4652 ,  G06K9/6267 ,  G06T7/0012 ,  H04N5/2256 ,  H04N5/23293 ,  H04N5/265

Abstract: Systems and methods analyzing body fluids such as blood and bone marrow are disclosed. The systems and methods may utilize an improved technique for applying a monolayer of cells to a slide to generate a substantially uniform distribution of cells on the slide. Additionally aspects of the invention also relate to systems and methods for utilizing multi color microscopy for improving the quality of images captured by a light receiving device.

Abstract translation: 公开了分析体液如血液和骨髓的系统和方法。 系统和方法可以利用改进的技术将单层细胞施加到载玻片上以在载玻片上产生基本均匀的细胞分布。 本发明的另外方面还涉及用于利用多色显微镜来提高由光接收装置捕获的图像的质量的系统和方法。

公开(公告)号：US20150355099A1

公开(公告)日：2015-12-10

申请号：US14297699

申请日：2014-06-06

Applicant: Hamilton Sundstrand Corporation

Inventor： Russell Fordyce ,  Ryan Chase

IPC: G01N21/88

CPC classification number: G01N21/88 ,  G01M5/0033 ,  G01N21/8806 ,  G01N21/8851 ,  G01N29/041 ,  G01N29/2418 ,  G01N2021/8427 ,  G01N2021/8924 ,  G01N2021/9516 ,  G01N2201/117 ,  G01N2201/126

Abstract: A scratch verification method and apparatus for detecting and analyzing defects in a surface, the apparatus include a detection device with a plurality of emission sources and a plurality of sensors. A processor is connected to the detection device and is configured to apply one or more sets of criteria to one or more corresponding target areas of a surface. The processor is further configured to differentiate between data from the one or more target areas.

Abstract translation: 一种用于检测和分析表面缺陷的划痕验证方法和装置，该装置包括具有多个发射源和多个传感器的检测装置。 处理器连接到检测装置，并且被配置为将一组或多组标准应用于表面的一个或多个对应的目标区域。 处理器还被配置为区分来自一个或多个目标区域的数据。