Managing sequential write performance consistency for memory devices

    公开(公告)号:US11455107B2

    公开(公告)日:2022-09-27

    申请号:US16666351

    申请日:2019-10-28

    Abstract: A method is implemented for a memory sub-system that detects a sequential write pattern in a write sequence for a memory device in a set of commands received from a host, detects current bandwidth utilization deviating from a write bandwidth utilization performance target, in response to detecting the sequential write pattern, and adjusts write bandwidth utilization to conform to the write bandwidth utilization target, in response to detecting the current bandwidth utilization deviating from the write bandwidth utilization performance target.

    RELIABILITY SCAN ASSISTED VOLTAGE BIN SELECTION

    公开(公告)号:US20220276784A1

    公开(公告)日:2022-09-01

    申请号:US17744563

    申请日:2022-05-13

    Abstract: A system can include a memory device and a processing device to perform operations that include performing, at a first frequency, a calibration scan, where the calibration scan includes calibrating block family-to-bin associations for one or more younger voltage bins based on first measurement data determined by the calibration scan, and calibrating block family-to-bin associations for one or more older voltage bins based on second measurement data provided by a media management scan, where the media management scan is performed at a second frequency, such that the second frequency is lower than the first frequency, each of the younger voltage bins satisfies a first age threshold criterion, and each of the older voltage bins satisfies a second age threshold criterion.

    Memory sub-system logical block address remapping

    公开(公告)号:US11416388B2

    公开(公告)日:2022-08-16

    申请号:US17027895

    申请日:2020-09-22

    Abstract: A system includes a memory device and a processing device coupled to the memory device. The processing device can determine a data rate from a first sensor and a data rate from a second sensor. The processing device can write a first set of data received from the first sensor at a first logical block address (LBA) in the memory device. The processing device can write a second set of data received from the second sensor and subsequent to the first set of data at a second LBA in the memory device. The processing device can remap the first LBA and the second LBA to be logically sequential LBAs. The second LBA can be associated with an offset from the first LBA and the offset can correspond to a data rate of the first sensor.

    MEMORY SUB-SYSTEM WRITE SEQUENCE TRACK

    公开(公告)号:US20220188223A1

    公开(公告)日:2022-06-16

    申请号:US17536928

    申请日:2021-11-29

    Abstract: A system includes a memory device and a processing device communicatively coupled to the memory device. The processing device is to write data to a number of groups of memory cells of the memory device in a physically non-contiguous manner. The processing device is further to track a sequence in which the number of groups of memory cells were written with the data. In response to a trigger event, the processing device is further to identify at least a portion of the number of groups of memory cells having data received over a predefined period preceding the trigger event based at least in part on the tracked sequence.

    READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN

    公开(公告)号:US20220179577A1

    公开(公告)日:2022-06-09

    申请号:US17681075

    申请日:2022-02-25

    Abstract: A processing device in a memory system receives a first read request from a host system, wherein the first read request is directed to first data stored at a first address in a block of the memory component. The processing device determines that the first address is located within a first region of the block and increments a read counter for the block by a default amount. The processing device further receives a second read request from the host system, wherein the second read request is directed to second data stored at a second address in a block of the memory component, determines that the second address is located within a second region of the block and increments the read counter for the block by a scaled amount.

    Scan frequency modulation based on memory density or block usage

    公开(公告)号:US11354037B2

    公开(公告)日:2022-06-07

    申请号:US16947713

    申请日:2020-08-13

    Abstract: A system includes a memory component and a processing device to determine an amount of data stored at a region of a memory component and determine, based on the amount of data stored in the region of the memory component. The processing device determines a frequency to perform an operation on one or more memory cells of the region of the memory component. The processing device performs the operation on the one or more memory cells at the frequency to maintain the one or more memory cells of the region of the memory component in a first state associated with a first error rate for data stored at the one or more memory cells. The first error rate is less than a second error rate associated with a second state of the one or more memory cells.

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