公开(公告)号：US20170160207A1

公开(公告)日：2017-06-08

申请号：US14960349

申请日：2015-12-05

Applicant: Ming-Sheng Chen

Inventor： Ming-Sheng Chen

IPC: G01N21/94 ,  G01N21/958 ,  G01N21/95

CPC classification number: G01N21/94 ,  G01N21/9501 ,  G01N21/958 ,  G01N2201/0612 ,  G01N2201/105 ,  G01N2201/12

Abstract: A machine for inspecting a face of a transparent plate includes a frame, a carrier module, an optical module and at least two illumination modules. The frame includes an X-axis. The carrier module is adapted for carrying a transparent plate in need of inspection on the frame along the X-axis. The optical module is located on the frame and movable relative to the carrier module and includes at least one detector adapted for rectilinear scanning along a Y-axis perpendicularly intersecting the X-axis of the carrier module at a crossing point. The illumination modules are located on two opposite sides of the X-axis of the frame. Each of the illumination modules includes a laser emitter. The laser emitters are located at a same distance from the crossing point and adapted for emitting rays on the transparent plate at a same angle of 0.5° to 6°.

公开(公告)号：US20170059308A1

公开(公告)日：2017-03-02

申请号：US14898931

申请日：2015-08-28

Applicant: Juergen Marx

Inventor： Heinrich Alexander Eberl ,  Juergen Marx

IPC: G01B11/25 ,  G01N21/3563 ,  A61B5/103 ,  A61B5/1455 ,  A61B5/00 ,  G01S17/89 ,  A61B5/1172

CPC classification number: A61B5/1032 ,  A61B5/0077 ,  A61B5/1172 ,  A61B5/1455 ,  A61B5/441 ,  A61B5/6826 ,  A61B2562/0238 ,  A61B2576/00 ,  G01B11/24 ,  G01N21/3563 ,  G01N21/4738 ,  G01N21/8422 ,  G01N2201/06113 ,  G01N2201/105 ,  G01N2201/12 ,  G01S7/4802 ,  G01S7/4817 ,  G01S17/023 ,  G01S17/42 ,  G01S17/89 ,  H04N3/09 ,  H04N5/2256 ,  H04N5/33

Abstract: A method for detecting the surface structure and composition of a sample by means of a scanning unit, in particular for detecting traces, which are induced by contact of the skin of the human body on the surface of an object or absorbed by means of a trace carrier. The sample and the scanning unit are moved in relation to one another. The sample surface is irradiated line-by-line using a light beam or laser beam emitted from the scanning unit. The light beam or laser beam reflected from the sample surface is detected, and a digital image of the topography of the sample surface and the intensity of the reflected light beam or laser beam is generated from deviations of the reflected light beam or laser beam from the emitted light beam or laser beam to illustrate the composition of the sample surface.

Abstract translation: 用于通过扫描单元检测样品的表面结构和组成的方法，特别是用于检测迹线，其是通过人体皮肤在物体表面上或通过痕迹吸收而引起的 载体 样品和扫描单元相对于彼此移动。 使用从扫描单元发射的光束或激光束逐行照射样品表面。 检测从样品表面反射的光束或激光束，并且从反射光束或激光束的偏离产生样品表面的形貌和反射光束或激光束的强度的数字图像 发射光束或激光束来说明样品表面的组成。

公开(公告)号：US09564073B2

公开(公告)日：2017-02-07

申请号：US14483019

申请日：2014-09-10

Applicant: Amazon Technologies, Inc.

Inventor： Ted John Cooper ,  Omair Abdul Rahman

IPC: G06K9/00 ,  G06T7/00 ,  G09G3/00 ,  G06K9/68 ,  G01N21/88 ,  G01N21/95 ,  G09G5/02

CPC classification number: G09G3/006 ,  G01N21/8851 ,  G01N21/95 ,  G01N2201/105 ,  G06K9/00 ,  G06K9/68 ,  G06T7/0004 ,  G06T7/001 ,  G06T2207/10008 ,  G06T2207/10024 ,  G06T2207/10048 ,  G06T2207/30121 ,  G09G5/02 ,  G09G2330/10

Abstract: A method for analyzing displays is described. A processing device receives a first scanned image of a first display and determines a first characteristic of the first display by analyzing the first scanned image. The processing device also receives a second scanned image of a second display and determines a second characteristic of the second display by analyzing the second scanned image. The processing device compares the first characteristic and the second characteristic to determine a third characteristic of the second display.

Abstract translation: 描述用于分析显示器的方法。 处理装置接收第一显示器的第一扫描图像，并且通过分析第一扫描图像来确定第一显示器的第一特性。 处理装置还接收第二显示器的第二扫描图像，并且通过分析第二扫描图像来确定第二显示器的第二特性。 处理装置比较第一特性和第二特性以确定第二显示的第三特性。

公开(公告)号：US20170016813A1

公开(公告)日：2017-01-19

申请号：US15048705

申请日：2016-02-19

Applicant: Premium Genetics (UK) LTD

Inventor： Matthias Wagner

IPC: G01N15/14 ,  G01N21/35 ,  G02B21/00 ,  G01N21/39

CPC classification number: G01N15/1436 ,  G01N15/00 ,  G01N15/06 ,  G01N15/1434 ,  G01N15/147 ,  G01N15/1475 ,  G01N21/35 ,  G01N21/3577 ,  G01N21/3581 ,  G01N21/39 ,  G01N21/53 ,  G01N21/552 ,  G01N2015/0065 ,  G01N2015/0687 ,  G01N2015/0693 ,  G01N2015/1006 ,  G01N2015/1443 ,  G01N2015/1447 ,  G01N2015/1488 ,  G01N2015/1497 ,  G01N2021/399 ,  G01N2201/068 ,  G01N2201/105 ,  G02B21/0032 ,  G02B21/0036 ,  G02B21/006 ,  G02B21/0064 ,  G02B21/008

Abstract: An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.

Abstract translation: 样品流体中的组分的分析器包括光源和限定光束的光束路径的光学检测器，其中光源发射光束，并且光学检测器在被样品流体部分吸收之后测量光束，流体流 设置在光束路径上的细胞，其限定了流体流动池中的询问区域，其中光束与样品流体和参考流体相互作用; 并且其中所述样品流体和所述参考流体是层流的;以及扫描系统，其相对于所述流体流动池内的层流扫描所述束，其中所述扫描系统相对于所述样品流体和所述参考流体扫描所述束 。

公开(公告)号：US20170010222A1

公开(公告)日：2017-01-12

申请号：US15265805

申请日：2016-09-14

Applicant: KLA-Tencor Corporation

Inventor： Richard E. Bills ,  Neil Judell ,  Klaus R. Freischlad ,  James P. McNiven

IPC: G01N21/95 ,  G01N21/47 ,  G06T7/00 ,  G01N21/21

CPC classification number: G01N21/9501 ,  G01N21/21 ,  G01N21/47 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/956 ,  G01N2021/4707 ,  G01N2021/4711 ,  G01N2021/4792 ,  G01N2021/556 ,  G01N2021/8809 ,  G01N2021/8848 ,  G01N2021/8864 ,  G01N2021/8877 ,  G01N2021/8896 ,  G01N2201/0612 ,  G01N2201/105 ,  G06T7/0004 ,  G06T2207/30148 ,  Y10T29/49826

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

Abstract translation: 提供了表面检查系统，以及相关的部件和方法。 表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。 光学收集和检测系统在前四分之一区域中具有用于收集从工件表面反射的光的光通道组件，以及用于收集从表面散射的光的前收集器和翼收集器，以大大提高测量能力 系统。 光通道组件具有可切换的边缘排除掩模和用于改进反射光检测的反射光检测系统。

公开(公告)号：US20160349179A1

公开(公告)日：2016-12-01

申请号：US15232091

申请日：2016-08-09

Applicant: STERIS Inc. ,  INSTITUT NATIONAL D'OPTIQUE / NATIONAL OPTICS INSTITUTE

Inventor： Daniel Rochette ,  Pascal Gallant ,  Ozge Mermut ,  Francois Baribeau ,  Isabelle Noiseux ,  Isabelle Gosselin

IPC: G01N21/64 ,  A61L2/28 ,  G01N21/94

CPC classification number: G01N21/6428 ,  A61L2/28 ,  A61L2202/24 ,  G01N21/6486 ,  G01N21/94 ,  G01N2021/6417 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105

Abstract: A method for optical detection of residual soil on articles (such as medical instruments and equipment), after completion of a washing or a rinsing operation by a washer. A soil detection system provides an indication of soil on the articles by detecting luminescent radiation emanating from the soil in the presence of ambient light.

Abstract translation: 在清洗完成洗涤或漂洗操作之后，用光学检测物品（例如医疗仪器和设备）上的残留土壤的方法。 土壤检测系统通过在环境光的存在下检测从土壤发出的发光辐射来提供物品上的土壤的指示。

公开(公告)号：US20160339274A1

公开(公告)日：2016-11-24

申请号：US15131074

申请日：2016-04-18

Applicant: COLORIGHT LTD.

Inventor： Benzion LANDA ,  Efraim MIKLATZKY ,  Sagi ABRAMOVICH ,  Yacov MAZUZ ,  Anton KRASSILNIKOV ,  Eliyahu BENNY ,  Gilad DAVARA ,  Chen OFEK ,  Elena ISHKOV ,  Lior SHAHAR ,  Daniel MANDELIK ,  Uri ZADOK

IPC: A61Q5/10 ,  G01N21/27 ,  B65D1/02 ,  A61K8/02 ,  B65D83/04

CPC classification number: A61Q5/10 ,  A61K8/0216 ,  A61K2800/4322 ,  B65D1/0223 ,  B65D83/04 ,  B65D2501/0081 ,  G01J3/02 ,  G01J3/18 ,  G01J3/42 ,  G01N21/21 ,  G01N21/27 ,  G01N21/4738 ,  G01N21/84 ,  G01N2201/062 ,  G01N2201/105

Abstract: Novel systems and methods for performing treatment (e.g., coloration) of keratinous fibers are disclosed. The methods and systems utilize one or more of a dispensing device which is configured to provide customized composition for treating keratinous fibers (e.g., a coloring composition), optionally formed from tablets; an optical reader, for obtaining sufficient characteristics of the keratinous fibers to make a realistic prediction of the outcome of a treatment (e.g., coloring treatment); a computational units for predicting an outcome of a treatment, optionally being interfaced with the dispensing device and for selecting a customized treatment; and tablet formulations which are useful in preparing customized composition for treating keratinous fibers. Further disclosed are rapidly disintegrating tablets for use in the preparation of compositions for treating keratinous fibers.

公开(公告)号：US20160306152A1

公开(公告)日：2016-10-20

申请号：US15132053

申请日：2016-04-18

Applicant: CANON KABUSHIKI KAISHA

Inventor： Koji Makara ,  Yoichi Otsuka ,  Masafumi Kyogaku ,  Hiroyuki Hashimoto

IPC: G02B21/00 ,  G01N21/64 ,  G01N21/65

CPC classification number: G02B21/008 ,  G01N21/6428 ,  G01N21/6458 ,  G01N21/65 ,  G01N2021/655 ,  G01N2201/06113 ,  G01N2201/105 ,  G02B21/0032 ,  G02B21/0036 ,  G02B21/0064 ,  G02B21/0076

Abstract: A laser scanning microscope apparatus includes an irradiation unit including an objective lens, a photodetector unit, an XY-scanning unit, and a Z-scanning unit. The irradiation unit focuses a laser beam with the objective lens to a specimen. The photodetector unit detects light generated from a position irradiated with the laser beam focused. The XY-scanning unit scans the laser beam in an X-direction perpendicular to an optical axis of the objective lens and in a Y-direction perpendicular to the optical axis and the X-direction. The Z-scanning unit scans the laser beam in a Z-direction parallel to the optical axis. When acquiring XY-two-dimensional image data by detecting the light while scanning the irradiated position in the X-direction and the Y-direction, the apparatus detects the light while scanning the irradiated position also in the Z-direction.

Abstract translation: 激光扫描显微镜装置包括具有物镜，光电检测器单元，XY扫描单元和Z扫描单元的照射单元。 照射单元将具有物镜的激光束聚焦到样本。 光检测器单元检测从被聚焦的激光束照射的位置产生的光。 XY扫描单元在垂直于物镜的光轴的X方向和垂直于光轴和X方向的Y方向扫描激光束。 Z扫描单元沿平行于光轴的Z方向扫描激光束。 当通过在X方向和Y方向扫描照射位置时检测光来获取XY二维图像数据时，该装置也在沿Z方向扫描照射位置的同时检测光。

公开(公告)号：US09423349B2

公开(公告)日：2016-08-23

申请号：US14178442

申请日：2014-02-12

Applicant: OLYMPUS CORPORATION

Inventor： Tetsuya Tanabe ,  Mitsushiro Yamaguchi

IPC: G01N21/64 ,  G01N21/51 ,  G01N15/14 ,  G02B21/00

CPC classification number: G01N21/64 ,  G01N15/14 ,  G01N15/1429 ,  G01N15/1434 ,  G01N21/51 ,  G01N21/6408 ,  G01N21/645 ,  G01N21/6452 ,  G01N21/6458 ,  G01N21/6486 ,  G01N2021/6419 ,  G01N2021/6441 ,  G01N2201/103 ,  G01N2201/105 ,  G02B21/0032 ,  G02B21/0076 ,  G02B21/008

Abstract: In the scanning molecule counting method detecting light of a light-emitting particle in a sample solution using a confocal or multiphoton microscope, there is provided an optical analysis technique enabling the scanning in a sample solution with moving a light detection region in a broader area or along a longer route while making the possibility of detecting the same light-emitting particle as different particles as low as possible and remaining the size or shape of the light detection region unchanged as far as possible. In the inventive optical analysis technique, there are performed detecting light from the light detection region and generating time series light intensity data during moving the light detection region along the second route whose position is moved along the first route, and thereby, the signal indicating light from each light-emitting particle in a predetermined route is individually detected using the time series light intensity data.

Abstract translation: 在使用共聚焦或多光子显微镜检测样品溶液中的发光粒子的光的扫描分子计数方法中，提供了一种光学分析技术，其能够在较宽区域中移动光检测区域的样品溶液中进行扫描，或 沿着较长的路线，同时尽可能地检测与不同粒子相同的发光粒子的可能性，并尽可能地保持光检测区域的尺寸或形状不变。 在本发明的光学分析技术中，在沿着沿第一路线移动位置的第二路径移动光检测区域的同时，进行来自光检测区域的检测光并产生时间序列光强度数据，由此，指示光 使用时间序列光强度数据分别检测来自预定路线中的每个发光粒子。

公开(公告)号：US20150247808A1

公开(公告)日：2015-09-03

申请号：US14195656

申请日：2014-03-03

Applicant: COHERENT LASERSYSTEMS GMBH & CO. KG

Inventor： Paul VAN DER WILT

IPC: G01N21/95 ,  G02B21/00 ,  G01N21/88 ,  H01L21/66 ,  G01N21/84

CPC classification number: H01L21/67253 ,  C30B1/02 ,  C30B29/06 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/8422 ,  G01N21/8851 ,  G01N21/9501 ,  G01N2021/8461 ,  G01N2021/8477 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/105 ,  G02B21/002 ,  G02B21/0092 ,  H01L21/02532 ,  H01L21/02686 ,  H01L21/268 ,  H01L22/12

Abstract: A method is disclosed evaluating a silicon layer crystallized by irradiation with pulses form an excimer-laser. The crystallization produces periodic features on the crystalized layer dependent on the number of and energy density ED in the pulses to which the layer has been exposed. An area of the layer is illuminated with light. A microscope image of the illuminated area is made from light diffracted from the illuminated are by the periodic features. The microscope image includes corresponding periodic features. The ED is determined from a measure of the contrast of the periodic features in the microscope image.

Abstract translation: 公开了评估通过用脉冲照射形成准分子激光而结晶的硅层的方法。 结晶层上产生周期性特征，取决于层暴露于的脉冲中的数量和能量密度。 该层的一个区域用光照亮。 照明区域的显微镜图像由从被照明的周期特征衍射的光制成。 显微镜图像包括相应的周期特征。 ED是从显微镜图像中的周期特征的对比度的量度确定的。