DEVICE FOR ADJUSTING CURVATURE OF MIRROR, AND MIRROR ADJUSTMENT SYSTEM COMPRISING SAME
    81.
    发明申请
    DEVICE FOR ADJUSTING CURVATURE OF MIRROR, AND MIRROR ADJUSTMENT SYSTEM COMPRISING SAME 有权
    用于调整镜子弯曲度的装置和包括其的镜子调整系统

    公开(公告)号:US20140049850A1

    公开(公告)日:2014-02-20

    申请号:US14008570

    申请日:2012-02-22

    Applicant: Kye Hwan Gil

    Inventor: Kye Hwan Gil

    Abstract: Disclosed is a device for adjusting the curvature of a mirror comprising: a base block; a pair of rotating blocks which are connected to the base block by one or more elastic bodies, respectively, and rotate around the connection portions between the base block and the elastic bodies or elastically return to through the application or release of external forces; a pair of support blocks which are disposed at the pair of rotating blocks, respectively, to support both ends of the mirror and apply bending moments to the both ends of the mirror by the rotation of the pair of rotating blocks; and a driving part for rotating the pair of rotating blocks.

    Abstract translation: 公开了一种用于调节反射镜的曲率的装置,包括:基座; 一对旋转块,分别通过一个或多个弹性体连接到基座,并且围绕基座和弹性体之间的连接部分旋转,或者通过外力的施加或释放弹性地返回; 一对支撑块,分别设置在一对旋转块上,以支撑反射镜的两端,并通过一对旋转块的转动将弯矩施加到反射镜的两端; 以及用于旋转所述一对旋转块的驱动部。

    X-RAY APPARATUS AND X-RAY MEASURING METHOD
    82.
    发明申请
    X-RAY APPARATUS AND X-RAY MEASURING METHOD 有权
    X射线装置和X射线测量方法

    公开(公告)号:US20130108020A1

    公开(公告)日:2013-05-02

    申请号:US13809335

    申请日:2011-08-01

    Applicant: Taihei Mukaide

    Inventor: Taihei Mukaide

    Abstract: An apparatus for deriving X-ray absorbing and phase information comprises; a splitting element for splitting spatially an X-ray, a detector for detecting intensities of the X-rays transmitted through an object, the intensity of the X-rays changing according to X-ray phase and also position changes, and an calculating unit for calculating an X-ray transmittance image, and an X-ray differential phase contrast or phase sift contrast image as the phase information. The X-ray is split into two or more X-rays having different widths, and emitted onto the detector unit. And, the calculating unit calculates the X-ray absorbing and phase information based on a difference, between the two or more X-rays, in correlation between the changing of the phase of the X-ray and the changing the intensity of the X-ray in the detector unit.

    Abstract translation: 用于导出X射线吸收和相位信息的装置包括: 用于在空间上分割X射线的分离元件,用于检测透过物体的X射线的强度的检测器,X射线相位变化的X射线的强度以及位置变化,以及用于 计算X射线透射率图像,以及X射线差分相位对比度或相移筛选图像作为相位信息。 X射线被分成具有不同宽度的两个或更多个X射线,并被发射到检测器单元上。 并且,计算单元根据X射线的相位的变化与X射线的强度的变化的关系,基于两个以上的X射线之间的差异来计算X射线吸收和相位信息, 射线在检测器单元。

    X-RAY IMAGING APPARATUS
    83.
    发明申请
    X-RAY IMAGING APPARATUS 有权
    X射线成像装置

    公开(公告)号:US20130034209A1

    公开(公告)日:2013-02-07

    申请号:US13641966

    申请日:2011-05-20

    Applicant: Chidane Ouchi

    Inventor: Chidane Ouchi

    Abstract: Provided is an X-ray imaging apparatus having simple configuration and obtaining differential phase contrast images in two directions crossing each other without rotating the diffraction grating and the masking grating. The apparatus including: a diffraction grating diffracting X-rays; a masking grating masking portions rays and transmitting portions are two-dimensionally arranged to partially mask bright zones of the interference pattern; a moving device changing the relative position between the interference pattern and the masking grating; a detector detecting the intensity distribution of the X-rays transmitted through the masking grating; and a calculator calculating a differential phase contrast image or a phase contrast image of a subject, the calculator being configured to calculate the differential phase contrast image or the phase contrast image in each of two mutually crossing directions on the basis of results of detection performed a plurality of times by the detector.

    Abstract translation: 本发明提供一种具有简单结构的X射线成像设备,并且在不旋转衍射光栅和掩蔽光栅的情况下彼此交叉的两个方向获得差分相位差图像。 该装置包括衍射光栅衍射X射线; 屏蔽光栅遮蔽部分光线和透射部分被二维布置以部分地掩蔽干涉图案的亮区; 移动装置改变干涉图案和掩蔽光栅之间的相对位置; 检测器,其检测透过所述掩蔽光栅的X射线的强度分布; 以及计算器,其计算对象的差分相位差图像或相位对比图像,所述计算器被配置为基于检测结果a计算两个相互交叉方向中的每一个中的差分相位对比图像或相位对比图像 多次由检测器。

    RADIATION DETECTION DEVICE, RADIOGRAPHIC APPARATUS AND RADIOGRAPHIC SYSTEM
    84.
    发明申请
    RADIATION DETECTION DEVICE, RADIOGRAPHIC APPARATUS AND RADIOGRAPHIC SYSTEM 审中-公开
    辐射检测装置,放射性设备和放射性系统

    公开(公告)号:US20130010926A1

    公开(公告)日:2013-01-10

    申请号:US13634861

    申请日:2011-03-29

    Applicant: Takuji Tada

    Inventor: Takuji Tada

    Abstract: A radiographic system includes an X-ray source, a first transmission type grating, a second transmission type grating, a scanning mechanism, and a flat panel detector, and an arithmetic processing section. The first transmission type grating is constituted by connecting a plurality of first grating pieces in a first direction, and the second transmission type grating is constituted by connecting a plurality of second grating pieces in the first direction. In projection onto the flat panel detector with the focus of the X-ray source as a viewpoint, at least one pixel is interposed between each pixel of the flat panel detector onto which a connection point of two adjacent first grating pieces is projected and each pixel onto which a connection portion of two adjacent second grating pieces is projected.

    Abstract translation: 射线照相系统包括X射线源,第一透射型光栅,第二透射型光栅,扫描机构和平板检测器,以及算术处理部。 第一透射型光栅通过沿第一方向连接多个第一光栅片而构成,第二透射型光栅通过沿第一方向连接多个第二光栅片而构成。 在将X射线源的焦点作为视点投影到平板检测器上时,在平板检测器的每个像素之间插入至少一个像素,其中两个相邻的第一光栅片的连接点投射到其上,并且每个像素 两个相邻的第二光栅片的连接部分投射到其上。

    X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program
    85.
    发明授权
    X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program 失效
    X射线成像装置,X射线成像方法和X射线成像程序

    公开(公告)号:US08340243B2

    公开(公告)日:2012-12-25

    申请号:US13190770

    申请日:2011-07-26

    Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.

    Abstract translation: X射线成像装置包括相位光栅,吸收光栅,检测器和运算单元。 算术单元执行对由检测器获取的莫尔的强度分布执行傅里叶变换并获取空间频谱的傅里叶变换步骤。 此外,运算单元执行相位检索步骤,从傅里叶变换步骤中获取的空间频谱中分离出与载波频率对应的频谱,对分离的频谱进行傅里叶逆变换,获取差分相位图像。

    Radiation phase image radiographing apparatus
    86.
    发明授权
    Radiation phase image radiographing apparatus 失效
    辐射相图像摄影仪

    公开(公告)号:US08139711B2

    公开(公告)日:2012-03-20

    申请号:US12585283

    申请日:2009-09-10

    Inventor: Kenji Takahashi

    Abstract: A radiation phase image radiographing apparatus, including a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, the radiation sources being distributed such that radiation emitted from each of the radiation sources and transmitted through the subject forms a part of a projected image of the subject, a first diffraction grating configured to be exposed to the radiation emitted from the multiple radiation sources of the radiation emission unit and to produce a Talbot effect by the exposure, a second diffraction grating for diffracting the radiation diffracted by the first diffraction grating, and a radiation image detector for detecting the radiation diffracted by the second diffraction grating.

    Abstract translation: 一种辐射相位图像摄影装置,包括具有用于向对象发射辐射的多个辐射源的辐射发射单元,辐射源被分布成使得从每个辐射源发射并透射通过对象的辐射形成投影图像的一部分 被配置为暴露于从辐射发射单元的多个辐射源发射的辐射并且通过曝光产生Talbot效应的第一衍射光栅,用于衍射由第一衍射光栅衍射的辐射的第二衍射光栅 以及用于检测由第二衍射光栅衍射的辐射的放射线图像检测器。

    METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM
    88.
    发明申请
    METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM 有权
    X射线纳米粒子精密测量强度分布的方法与装置

    公开(公告)号:US20110305317A1

    公开(公告)日:2011-12-15

    申请号:US13203095

    申请日:2009-03-19

    CPC classification number: G01N23/201 G21K2201/06 G21K2207/00

    Abstract: Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.

    Abstract translation: 提供了一种精确测量x射线nanobeam的强度分布的方法和装置,其可以用一个刀刃测量具有不同波长的x射线,并且可以执行对应于x射线束的焦深的最佳测量 以及使用暗场测量方法的其他测量装置的条件,其能够使用刀刃精确测量X射线束的轮廓并使用衍射和透射的x射线。 刀刃(4)由重金属形成,其使穿过其的X射线的相位前进,并且以这样的方式制造,使得厚度可以在纵向方向上连续地或以逐步的方式改变。 刀刃(4)被设定为使得X射线束可以在这样的厚度位置处横穿刀刃(4),以在其中透射的x射线和衍射的X射线衍射的范围内实现相移 在刀刃的端部可以彼此加强,并且通过x射线检测器测量衍射X射线和透射的X射线的叠加X射线。

    X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PROGRAM
    89.
    发明申请
    X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PROGRAM 失效
    X射线成像装置,X射线成像方法和X射线成像程序

    公开(公告)号:US20110280368A1

    公开(公告)日:2011-11-17

    申请号:US13190770

    申请日:2011-07-26

    Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.

    Abstract translation: X射线成像装置包括相位光栅,吸收光栅,检测器和运算单元。 算术单元执行对由检测器获取的莫尔的强度分布执行傅里叶变换并获取空间频谱的傅里叶变换步骤。 此外,运算单元执行相位检索步骤,从傅里叶变换步骤中获取的空间频谱中分离出与载波频率对应的频谱,对分离的频谱进行傅里叶逆变换,获取差分相位图像。

    High-resolution X-ray optic and method for constructing an X-ray optic
    90.
    发明授权
    High-resolution X-ray optic and method for constructing an X-ray optic 有权
    高分辨率X射线光学元件和构造X射线光学元件的方法

    公开(公告)号:US08019043B2

    公开(公告)日:2011-09-13

    申请号:US12505012

    申请日:2009-07-17

    Abstract: Described are optical apparatuses and methods for forming optical apparatuses. The optical apparatus includes a plurality of individually fabricated segments and a holder. Each of the plurality of individually fabricated segments include an inner annular surface and an outer contact surface opposite to the inner annular surface. Each of the inner annular reflecting surfaces define a longitudinal segment axis. The holder contacts each of the outer contact surfaces of the plurality of individually fabricated segments. Each of the longitudinal segment axes of the plurality of individually fabricated segments are linearly aligned.

    Abstract translation: 描述了用于形成光学装置的光学装置和方法。 该光学装置包括多个单独制造的片段和一个保持器。 多个单独制造的片段中的每一个包括内环形表面和与内环形表面相对的外接触表面。 每个内环形反射表面限定纵向段轴线。 保持器接触多个单独制造的段的每个外接触表面。 多个单独制造的段的每个纵向段轴线是线性对准的。

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